Abstract: The ionization chamber consists of a plurality of ports to accept multiple identical devices or varying devices. Ports may be arranged at various positions on the ionization chamber and at various angles with respect to the sampling orifice leading into the vacuum chamber of the mass spectrometer. A plurality of sprayers may operate in a time modulated manner and thereby the simultaneous multiplexed analysis of a multitude of samples is facilitated.

Abstract: The present invention provides an apparatus and method for automated and rapid loading of a large number of samples for mass spectrometric analysis using various ionization methods (e.g. matrix assisted desorption by laser bombardment (MALDI) and atmosperic pressure ionization (API) methods such as electrospray). The aparatus utilizes microtiter plates to hold the sample, optical elements (e.g. fiber optic) to facilitate automated transport of the ions, and a multiple part capillary comprising at least two capillary sections joined with airtight seal by a union for use in mass spectrometry (particularly with ionization sources) to transport ions between pressure regions of a mass spectrometer for analysis is described herein. Preferably, the capillary is useful to transport ions from an elevated pressure ionization source to a first vacuum region of a mass analysis system.

Abstract: The present invention provides an apparatus and method for automated and rapid loading of a large number of samples for mass spectrometric analysis using various ionization methods (e.g. matrix assisted desorption by laser bombardment (MALDI) and atmosperic pressure ionization (API) methods such as electrospray). The aparatus utilizes microtiter plates to hold the sample, optical elements (e.g. fiber optic) to facilitate automated transport of the ions, and a multiple part capillary comprising at least two capillary sections joined with airtight seal by a union for use in mass spectrometry (particularly with ionization sources) to transport ions between pressure regions of a mass spectrometer for analysis is described herein. Preferably, the capillary is useful to transport ions from an elevated pressure ionization source to a first vacuum region of a mass analysis system.

Abstract: The present invention relates generally to time-of-flight mass spectrometers and discloses an improved method and apparatus for analyzing ions using a time-of-flight mass spectrometer. More specifically, a means and method are described for the use of tandem time-of-flight mass spectrometry in conjunction with surface induced dissociation and pulsed ion extraction for fragmentation and analysis of selected sample ions. The concept essential to SID with PIE is that the kinetic energy of product and scattered ions can be correlated with their position at some time T after the collision event, and by using this relationship, one can reduce the distribution of either the kinetic energy of the ions or the arrival times of the ions at some position in the spectrometer. Ions are produced from sample material in an ion source and pulsed into the SID-PIE instrument. The packet of ions thus produced may or may not be mass analyzed before striking the SID surface.

Abstract: The present invention relates generally to ion beam handling in mass spectrometers, arid more specifically to a method and apparatus for focusing ions in time-of-flight mass spectrometers (TOFMS). This invention focuses ions using one or more electrodes bound on at least one side by an electrically conducting grid. Electric fields generated by the electrodes focus the ions. With electric fields of the proper strength and geometry, ions may be focused onto a point some desired distance from the source. According to the preferred embodiment of the present invention, a shielded lens, in the form of an electrically conducting cylinder and two conducting grids, is used to produce and adjust the position of an ion focal point.

Abstract: The present invention relates to a means and method for decreasing the energy distribution of ions produced from solid or liquid samples by pulsed desorption method. More particularly, the present invention discloses a method wherein the kinetic energies of ions are related to their locations at a given time after the excitation event which caused their desorption. Based on this relationship between ion position and energy, an accelerating electric field is applied at a predetermined time after the excitation event. The magnitude of the applied electric field and the time of its application are such that the kinetic energy distribution of the ions is substantially reduced or eliminated.

Abstract: The present invention relates generally to time-of-flight mass spectrometers and discloses an improved method and apparatus for analyzing ions using a time-of-flight mass spectrometer. More specifically, the present invention comprises two or more electrostatic reflectors positioned coaxially with respect to one another such that ions generated by an ion source can be reflected back and forth between them. The first reflecting device is an ion accelerator which functions as both an accelerating device to provide the initial acceleration to the ions, and a reflecting device to reflect the ions in the subsequent mass analysis. The second reflecting device is a reflectron which functions only to reflect the ions in the mass analysis. During the mass analysis, the ions are reflected back and forth between the accelerator and reflectron multiple times.

Abstract: A method and apparatus for analyzing ions by determining times of flight include using a deflector to direct ions away from their otherwise intended or parallel course. Deflectors are used as gates, so that particular ions may be selected for deflection, while others are allowed to continue along their parallel or otherwise straight path, from the ion source, through a flight tube, and eventually, to a detector. According to the present invention, an extended Bradbury-Nielson gate, in the form of a series of plates, with equal but alternating opposite polarity potentials, is used as an ion deflector or gate.

Abstract: The present invention relates generally to ion beam handling in mass spectrometers, and more specifically to a method and apparatus for focusing ions in time-of-flight mass spectrometers (TOFMS). This invention focuses ions using one or more electrodes bound on at least one side by an electrically conducting grid. Electric fields generated by the electrodes focus the ions. With electric fields of the proper strength and geometry, ions may be focused onto a point some desired distance from the source. According to the preferred embodiment of the present invention, a shielded lens, in the form of an electrically conducting cylinder and two conducting grids, is used to produce and adjust the position of an ion focal point.

Abstract: An N.sup.th order delayed extraction apparatus and method for use in a time-of-flight mass spectrometer is disclosed. A non-linear electric field, produced by specially formed electrodes, is used to accelerate ions, improve flight time focusing and thereby increase mass resolution.

Abstract: A method and apparatus for analyzing ions by determining times of flight including using a deflectron based daughter ion selector for selecting daughter ions. Parent ions generated in an ion source may fragment to form daughter ions. Daughter ions may further fragment to form grand daughter ions. By selecting a specific type of daughter ion from ions formed in the ion source, one may obtain a grand daughter ion spectrum. According to the present invention, a deflectron based daughter ion selector, in the form of two deflectron and a set of selection plates, is used as a daughter ion selector.

Abstract: A method and apparatus for analyzing ions by determining times of flight including using a collision cell to activate ions toward fragmentation and a deflector to direct ions away from their otherwise intended or parallel course. Deflectors are used as gates, so that particular ions may be selected for deflection, while others are allowed to continue along their parallel or otherwise straight path, from the ion source, through a flight tube, and eventually, to a detector. According to the present invention, a postselector, in the form of two deflection plates is used as an ion deflector and is encountered by ions after the collision cell as they progress through the spectrometer.

Abstract: A method and apparatus to accelerate ions using two or more electric fields which are spatially separated. Electric fields are used to accelerate ions. With electric fields of the proper strength and geometry, ions may be space focused so that ions of a given mass-to-charge arrive at a virtual object plane simultaneously. According to the present invention, a split field interface, in the form of a set of biased electrodes, is used to produce and adjust the position of a virtual object plane.

Abstract: A method and apparatus to direct ions away from their otherwise intended or parallel course. Deflectors are used to establish electric fields in regions through which ions are to pass. With such electric fields, ions may be deflected to a desired trajectory. According to the present invention, a multideflector, in the form of a series of bipolar plates spaced evenly across the ion beam path, is used as an ion deflector.

Abstract: A mass spectrometer is disclosed having a detector that detects the induction of a charge as an ion pulse passes by the detector and provides a representative output signal thereof. The inductive detector output signal is present regardless of the presence or intensity of preceding ion pulses and also the inductive detector is relatively insensitive to the velocity of the charged particles being detected. Further, the inductive detector does not destroy the vast majority of the ion pulses that it detects so that the non-destroyed ion pulses may be further analyzed by spectrometers attached in tandem.

Abstract: A portable x-ray tube 68 for producing x-rays, the tube 68 having an energy source 74 which directs energetic particles or photons at an electron multiplier 80 coupled to the energy source 74. A voltage source 84 applies a multiplier voltage across the electron multiplier 80. When triggered by the energy source 74, the electron multiplier 80 creates a multitude of electrons 28 directed towards a target anode 90 that receives the electrons and produces x-rays 30. The target anode 90 is coupled at a voltage difference of at least 3 kV relative to the electron multiplier 80 so as to define an electron acceleration region 32 between the electron multiplier 80 and the target anode 90. The target anode 90 contains an element having an atomic number greater than 11. A low pressure enclosure 70 contains the electron multiplier 80 and the target anode 90. The low pressure enclosure 70 includes a window 92 for allowing the x-rays 30 to pass through substantially unchanged.

Abstract: A portable time of flight mass spectrometer using plasma desorption sample ionization. The sample is deposited onto a sample surface by condensing a sample gas stream onto the surface. While the instrument is evacuated, the sample surface is cooled and a sample gas stream is injected into the instrument near the sample surface causing a portion of the gas stream to condense on the sample surface and the remainder to be removed by the evacuation pump. A mass spectrometer having a linear geometry is disclosed. A reflective geometry is also disclosed wherein the flight path length is maximized by placing the fission source between the sample surface and a single detector. A collector surface for receiving start signal-generating fission fragments is sized to insure equal collection of start signal fragments and sample ionizing fragments. An area on the sample surface which is occluded by the fission source is compensated for by appropriate sizing of the fission source and the collector surface.

Abstract: A portable time of flight mass spectrometer using plasma desorption sample ionization. The sample is deposited onto a sample surface by condensing a sample gas stream onto the surface. While the instrument is evacuated, the sample surface is cooled and a sample gas stream is injected into the instrument near the sample surface causing a portion of the gas stream to condense on the sample surface and the remainder to be removed by the evacuation pump. A mass spectrometer having a linear geometry is disclosed. A reflective geometry is also disclosed wherein the flight path length is maximized by placing the fission source between the sample surface and a single detector. A collector surface for receiving start signal-generating fission fragments is sized to insure equal collection of start signal fragments and sample ionizing fragments. An area on the sample surface which is occluded by the fission source is compensated for by appropriate sizing of the fission source and the collector surface.