Abstract: A method includes generating light pulses by an illumination source toward an object; collecting the light pulses reflected from the object by an image sensor; generating a first signal-time plot of a sensor signal by the image sensor; generating a second signal-time plot of an index signal, wherein the second signal-time plot of the index signal comprises pulsed signals corresponding to the light pulses, respectively; collecting data from selected time periods of the first signal-time plot of the sensor signal, wherein the selected time periods of the first signal-time plot of the sensor signal are the same as time periods of the light pulses in the second signal-time plot of the index signal; and generating a third signal-time plot of an output signal based on the collected data.

Abstract: Disclosed is a tape packing apparatus and method. The tape packing apparatus including: a supporting frame; a drive unit configured to install on the supporting frame; a tape head pressing arm configured to install on the supporting frame and connected to the drive unit, and the drive unit configured to drive the tape head pressing arm to move to a packing position such that the tap head is pressed onto an object to be packed; a cutting module configured to install on the supporting frame and connected with the driving unit, and the driving unit is constructed to drive the cutting module to the packing position to cut the tape. The tape packing apparatus provided by the embodiment of the present invention has good packing effect, can effectively shortens the packing time, has high packing efficiency, and saves manpower and costs.

Abstract: A direct-time-of-flight (dTOF) detecting device is provided. The dTOF detecting device includes a single-photon avalanche diode (SPAD) sensor and a processor. The SPAD sensor is configured to receive a reflective light reflected from an object and output an original data based on the reflective light. The processor is coupled to the SPAD sensor and configured to process the original data to generate depth data and intensity data. The depth data includes depth information of the object and the intensity data includes a two-dimensional image of the object.

Abstract: A method of a sensing device, comprising steps of emitting, by a light source of the sensing device, a light pulse in each of n cycles; measuring, by a single photon avalanche diodes array of the sensing device, a time-of-flight value with a resolution of m in each of the n cycles to generate n raw data frames based on a reflected light of the light pulse; performing, by a pre-processing circuit of the sensing device, a pre-processing operation to n raw data frames to generate k pre-processed data frames, wherein m, n and k are natural numbers, and k is smaller than n; and generating, by post-processor of the sensing device, a histogram according to the k pre-processed data frames and analyzing the histogram to output a depth result.

Abstract: An electrode assembly (100) for a solar cell. The electrode assembly comprises an insulating optically transparent film (101) comprising a plurality of perforations (103) formed therein, and a plurality of longitudinally extending, laterally spaced conductive wire portions (102) arranged side by side on a surface of the film. One or more of the perforations are formed so as to have at least a portion thereof interposed laterally between two wire portions of the plurality of wire portions. The perforations formed in the film may reduce losses that would otherwise occur due to absorption of light by the film. Also disclosed is a solar cell (107) that includes the electrode assembly described above, a method of forming the electrode assembly, a method of forming the solar cell, and a method of forming a solar module.

Abstract: A frame member for a bifacial solar module. The frame member comprises a retaining portion (or e.g. a holder) configured to retain (or e.g. hold) a longitudinally extending edge of a solar module, such that the solar module, when retained (or e.g. held) by the retaining portion, extends laterally inwardly from the retaining portion along a reference plane. The frame member also includes a reflector surface disposed rearwardly and laterally inwardly of the retaining portion. The reflector surface slopes in a direction away from the reference plane such that light passing through the reference plane and onto the reflector surface is reflected by the reflector surface in a forward and laterally inward direction.

Abstract: A method for testing semiconductor devices is disclosed, which includes: obtaining a result measured on a semiconductor device in one of a set of tests; comparing the result with a maximum value determined among respective results that were previously measured in one or more of the set of tests and a minimum value determined among respective results that were previously measured in one or more of the set of tests; determining, based on the comparison between the first result and the maximum and minimum values, whether to update the maximum and minimum values to calculate a delta value; comparing the delta value with a noise threshold value; determining based on the comparison between the delta value and the noise threshold value, whether to update a value of a timer; determining that the value of the timer satisfies a timer threshold; and determining that the semiconductor device incurs noise.

Abstract: A method for testing semiconductor devices is disclosed, which includes: obtaining a result measured on a semiconductor device in one of a set of tests; comparing the result with a maximum value determined among respective results that were previously measured in one or more of the set of tests and a minimum value determined among respective results that were previously measured in one or more of the set of tests; determining, based on the comparison between the first result and the maximum and minimum values, whether to update the maximum and minimum values to calculate a delta value; comparing the delta value with a noise threshold value; determining based on the comparison between the delta value and the noise threshold value, whether to update a value of a timer; determining that the value of the timer satisfies a timer threshold; and determining that the semiconductor device incurs noise.

Abstract: An apparatus and method for providing a filtering false photon count events for each pixel in a DTOF sensor array are disclosed herein. In some embodiments, the apparatus includes: a light source configured to emit a modulated signal towards the object; a direct time of flight (DTOF) sensor array configured to receive a reflected signal from the object, wherein the DTOF sensor array comprises a plurality of single-photon avalanche diodes (SPADs); and processing circuitry configured to receive photon event detection signals from a center pixel and a plurality of pixels orthogonally and diagonally adjacent to the center pixel and output a valid photon detection signal, in response to determining whether a sum of the received photon event detection signals is greater than a predetermined threshold.

Abstract: A method of a sensing device, comprising steps of emitting, by a light source of the sensing device, a light pulse in each of n cycles; measuring, by a single photon avalanche diodes array of the sensing device, a time-of-flight value with a resolution of m in each of the n cycles to generate n raw data frames based on a reflected light of the light pulse; performing, by a pre-processing circuit of the sensing device, a pre-processing operation to n raw data frames to generate k pre-processed data frames, wherein m, n and k are natural numbers, and k is smaller than n; and generating, by post-processor of the sensing device, a histogram according to the k pre-processed data frames and analyzing the histogram to output a depth result.

Abstract: A sensing device that is configured to determine a depth result based on time-of-flight value is introduced. The sensing device includes a delay locked loop circuit, a plurality of time-to-digital converters, a multiplexer and a digital integrator. The delay locked loop circuit is configured to output a plurality of delay clock signals through output terminals of the delay locked loop circuit. The plurality of time-to-digital converters include a plurality of latches. The multiplexer is configured to select a sub-group of m latches among the latches of the plurality of time-to-digital converters to be connected to the output terminals of the delay locked loop circuit according to a control signal.

Abstract: Disclosed is a time-of-flight sensing apparatus and method.

Abstract: Disclosed is a tape packing apparatus and method. The tape packing apparatus including: a supporting frame; a drive unit configured to install on the supporting frame; a tape head pressing arm configured to install on the supporting frame and connected to the drive unit, and the drive unit configured to drive the tape head pressing arm to move to a packing position such that the tap head is pressed onto an object to be packed; a cutting module configured to install on the supporting frame and connected with the driving unit, and the driving unit is constructed to drive the cutting module to the packing position to cut the tape. The tape packing apparatus provided by the embodiment of the present invention has good packing effect, can effectively shortens the packing time, has high packing efficiency, and saves manpower and costs.

Abstract: An apparatus and method for providing a filtering false photon count events for each pixel in a DTOF sensor array are disclosed herein. In some embodiments, the apparatus includes: a light source configured to emit a modulated signal towards the object; a direct time of flight (DTOF) sensor array configured to receive a reflected signal from the object, wherein the DTOF sensor array comprises a plurality of single-photon avalanche diodes (SPADs); and processing circuitry configured to receive photon event detection signals from a center pixel and a plurality of pixels orthogonally and diagonally adjacent to the center pixel and output a valid photon detection signal, in response to determining whether a sum of the received photon event detection signals is greater than a predetermined threshold.

Abstract: A pixel circuit includes: a photodiode capable of generating electrical current according to an incoming light signal; a control circuit coupled to the photodiode for selectively coupling a cathode of the photodiode to a first reference voltage to generate the electrical current according to a first control signal; and an output circuit coupled to the control circuit for selectively coupling a second reference voltage to a connecting terminal between the control circuit and the output circuit and to generate an output signal according to a reset signal and a select signal.

Abstract: A method for testing semiconductor devices is disclosed, which includes: obtaining a result measured on a semiconductor device in one of a set of tests; comparing the result with a maximum value determined among respective results that were previously measured in one or more of the set of tests and a minimum value determined among respective results that were previously measured in one or more of the set of tests; determining, based on the comparison between the first result and the maximum and minimum values, whether to update the maximum and minimum values to calculate a delta value; comparing the delta value with a noise threshold value; determining based on the comparison between the delta value and the noise threshold value, whether to update a value of a timer; determining that the value of the timer satisfies a timer threshold; and determining that the semiconductor device incurs noise.

Abstract: A pixel circuit includes: a photodiode capable of generating electrical current according to an incoming light signal; a control circuit coupled to the photodiode for selectively coupling a cathode of the photodiode to a first reference voltage to generate the electrical current according to a first control signal; and an output circuit coupled to the control circuit for selectively coupling a second reference voltage to a connecting terminal between the control circuit and the output circuit and to generate an output signal according to a reset signal and a select signal.

Abstract: An electronic apparatus with a touch panel including a host controller, an interface unit, and a touch panel control unit is provided. The host controller is used to control an electronic apparatus implemented with the host controller. The touch panel control unit is coupled to the host controller through the interface unit. The host controller transmits an updating information to the touch panel control unit with a format of the interface unit, in which the updating data is used to update the touch panel control unit. The touch panel control unit decodes the updating data to accordingly update.

Abstract: A sensing device that is configured to determine a depth result based on time-of-flight value is introduced. The sensing device includes a delay locked loop circuit, a plurality of time-to-digital converters, a multiplexer and a digital integrator. The delay locked loop circuit is configured to output a plurality of delay clock signals through output terminals of the delay locked loop circuit. The plurality of time-to-digital converters include a plurality of latches. The multiplexer is configured to select a sub-group of m latches among the latches of the plurality of time-to-digital converters to be connected to the output terminals of the delay locked loop circuit according to a control signal.

Abstract: Disclosed is a time-of-flight sensing apparatus and method.