Abstract: The present disclosure provides a test system and method. The test system is configured to analyze a system platform and includes a data collector and a test monitor. The data collector is configured to receive a signal transmitted between a controller and a memory of the system platform and is configured to process the signal to generate a processed signal. The test monitor is configured to encode the processed signal into a log information, so as to determine an operation status of the system platform according to the log information.

Abstract: A fault analysis device and a fault analysis method of the fault analysis device are provided. A sensing circuit senses a first distorted signal on a first signal transmission path of an abnormal signal device when the abnormal signal device performs a preset operation. A signal generating circuit provides a fault test signal to a second signal transmission path of a standard device corresponding to the first signal transmission path when the standard device performs the preset operation, so as to generate a second distorted signal on the second signal transmission path, where the first distorted signal and the second distorted signal have the same signal distortion characteristics.