Abstract: A biosensor based upon a vertically emitting, distributed feedback (DFB) laser is disclosed. In one configuration, the DFB laser comprises a replica-molded, one- or two-dimensional dielectric grating coated with a laser dye-doped-polymer as the gain medium. A sensor is also described in which the grating layer and the active layer are combined into a single layer. DFB lasers using an inorganic or organic thin film with alternating regions of high and low index of refraction as the active layer are also disclosed. The sensor actively generates its own narrowband high intensity light output without stringent requirements for coupling alignment, thereby resulting in a simple, robust illumination and detection configuration.

Abstract: A microplasma device includes a substrate and either or both of a microchannel or microcavity defined in a polymer layer supported by the substrate. Electrodes arranged with respect to the polymer material can excite a plasma in a discharge medium contained in the microchannel or the microcavity or both. A method of forming a microplasma device places a curable polymer material between a mold having a negative volume impression of microcavities and/or microchannels and a substrate. The polymer is cured and then the mold is separated from the solid polymer.

Abstract: A method for manufacturing a light-emitting diode is described, comprising the following steps. A substrate is provided. An illuminant epitaxial structure is formed on the substrate, wherein the illuminant epitaxial structure comprises a first conductivity type semiconductor layer, an active layer and a second conductivity type semiconductor layer stacked on the substrate in sequence, a surface of the second conductivity type semiconductor layer includes at least one epitaxial defect formed therein, and the first conductivity type semiconductor layer and the second conductivity type semiconductor layer are opposite conductivity types. Then, an insulation layer is formed to fill into the epitaxial defect in the second conductivity type semiconductor layer. A transparent electrode layer is formed on the surface of the second conductivity type semiconductor layer.

Abstract: The present invention provides a method of inputting ideographic characters into a handheld device, comprising steps of: predicting ideographic characters that correspond to symbols inputted by a user, for said user to select; predicting, based on a previous ideographic character that has been selected by said user, ideographic characters that most likely follow said previous ideographic character but cannot form a phrase with said previous ideographic character, for said user to select; and inputting ideographic characters that have been selected by said user into said handheld device. The present invention also provides an apparatus for inputting ideographic characters and a handheld device. According to the invention, more ideographic characters and punctuation marks are automatically predicted, which speeds up the process of inputting ideographic characters into handheld devices.

Abstract: The present invention discloses A method for inputting a Chinese phrase on a portable device, said device comprising a keyboard, a display means and a memory means, said method comprising the steps of: inputting Chinese Pinyin letter/Zhuyin character and other characters by the keyboard; entering a Chinese phrase matched mode when detecting that a first separator for separating Chinese Pinyin letter/Zhuyin character corresponding to different Chinese characters is input; under the Chinese phrase matched mode, searching in the memory means the Chinese phrase corresponding to the input Chinese Pinyin letter/Zhuyin character and the number and the position of the separator based on the input Chinese Pinyin letter/Zhuyin character and the number and the position of the separator; and, sending the searched Chinese phrase to the display means.

Abstract: A highly robust fault tolerant scan chain is designed for scanning (and/or controlling a configuration of) a parallel processing system. The scan chain implements parallel redundant scan chains that follow physically diverse paths through the parallel processing system. For each IC under test, a set of redundant TAPs perform a boundary scan, and the test results are combined by voting. The TAPs of each set are physically diverse, in that they are physically located in separate power domains of the parallel processing system. As a result, the scan chain is robust to faults affecting power and/or control signal supply to any one power domain. Respective input and output dummy cells at opposite extreme ends of the scan chain provide a graceful separation and recombination of the redundant parallel scan chains, and so renders the architecture of the scan chain transparent to external boundary scan circuit elements.

Abstract: A reticle and method simultaneously generate small- and large-scale circuit structures of a parallel processing system. The reticle includes at least two circuit traces having respective contact pads within an overlap zone of the reticle. Connectivity between a circuit trace of one reticle image with a circuit trace of an adjacent reticle image is controlled by varying the degree of overlap between the two images.

Abstract: A reticle and method simultaneously generate small- and large-scale circuit structures of a parallel processing system. The reticle includes at least two circuit traces having respective contact pads within an overlap zone of the reticle. Connectivity between a circuit trace of one reticle image with a circuit trace of an adjacent reticle image is controlled by varying the degree of overlap between the two images.

Abstract: A highly robust fault tolerant scan chain is designed for scanning (and/or controlling a configuration of) a parallel processing system. The scan chain implements parallel redundant scan chains that follow physically diverse paths through the parallel processing system. For each IC under test, a set of redundant TAPs perform a boundary scan, and the test results are combined by voting. The TAPs of each set are physically diverse, in that they are physically located in separate power domains of the parallel processing system. As a result, the scan chain is robust to faults affecting power and/or control signal supply to any one power domain. Respective input and output dummy cells at opposite extreme ends of the scan chain provide a graceful separation and recombination of the redundant parallel scan chains, and so renders the architecture of the scan chain transparent to external boundary scan circuit elements.