Patents by Inventor Mengnan XIAO

Mengnan XIAO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11473992
    Abstract: The present invention discloses a residual pressure measurement system for a MEMS pressure sensor with an F-P cavity and method thereof, the measurement system includes a low-coherence light source, a 3 dB coupler, a MEMS pressure sensor, an air pressure chamber, a thermostat, a pressure control system, a cavity length demodulator, an acquisition card and a computer. The measurement method comprises: performing cavity length measurement by using the reflecting light by the pressure control system at two temperatures, respectively, so as to calibrate the MEMS pressure sensor and establish a relationship between the absolute phase of a monochromatic frequency and the external pressure; performing linear fitting to the two measurement data to obtain all the external pressure when the cavity length of two measurement data are equal to each other, and substituting the theoretical equation for calculation to obtain the residual pressure under the flat condition of the diaphragm.
    Type: Grant
    Filed: April 23, 2018
    Date of Patent: October 18, 2022
    Assignee: TIANJIN UNIVERSITY
    Inventors: Shuang Wang, Junfeng Jiang, Tiegen Liu, Xue Wang, Kun Liu, Mengnan Xiao, Dongdong Ju
  • Publication number: 20200249113
    Abstract: The present invention discloses a residual pressure measurement system for a MEMS pressure sensor with an F-P cavity and method thereof, the measurement system includes a low-coherence light source, a 3 dB coupler, a MEMS pressure sensor, an air pressure chamber, a thermostat, a pressure control system, a cavity length demodulator, an acquisition card and a computer. The measurement method comprises: performing cavity length measurement by using the reflecting light by the pressure control system at two temperatures, respectively, so as to calibrate the MEMS pressure sensor and establish a relationship between the absolute phase of a monochromatic frequency and the external pressure; performing linear fitting to the two measurement data to obtain all the external pressure when the cavity length of two measurement data are equal to each other, and substituting the theoretical equation for calculation to obtain the residual pressure under the flat condition of the diaphragm.
    Type: Application
    Filed: April 23, 2018
    Publication date: August 6, 2020
    Inventors: Shuang WANG, Junfeng JIANG, Tiegen LIU, Xue WANG, Kun LIU, Mengnan XIAO, Dongdong JU
  • Publication number: 20180283969
    Abstract: The present invention discloses a high-resolution polarized low-coherence interference pressure measurement device and method, which comprise a broadband light source (1), an optical fiber coupler (2), an optical fiber Fabry-Perot sensor (3), a collimating lens (4), a polarizer (5), a birefringence wedge (6) having a spatial dip angle, an analyzer (7), a matrix camera (8), and a signal processing unit (9), which are successively provided from an input end to an output end; wherein light emitted from the broadband light source (1) passes through the optical fiber coupler (2) and arrives at the optical fiber Fabry-Perot sensor (3), and returned light emitted from the optical fiber Fabry-Perot sensor (3) is led into a demodulation interferometer; a change in pressure is transformed into a change in length of a Fabry-Perot cavity by the optical fiber Fabry-Perot sensor (3), and different pressures correspond to different lengths of the Fabry-Perot cavity; the collimating lens (4), the polarizer (5), the birefring
    Type: Application
    Filed: October 27, 2016
    Publication date: October 4, 2018
    Applicant: Tianjin University
    Inventors: Shuang WANG, Tiegen LIU, Junfeng JIANG, Mengnan XIAO, Kun LIU, Pan HE