Abstract: A planar transformer is configured on a multi-layer circuit board of a resonant converter. The planar transformer includes multiple layers of primary-side traces, multiple layers of secondary-side traces, and an iron core. The primary-side traces serve as a primary-side coil of the transformer to generate a first direction magnetic flux when the resonant converter operates. The secondary-side traces serve as a secondary-side coil of the transformer to generate a second direction magnetic flux when the resonant converter operates. The primary-side traces and the secondary-side traces surround a first core pillar and the second core pillar, and the primary-side traces and the secondary-side traces are configured in a specific stacked structure on the multi-layer circuit board, so that a magnetomotive force of the planar transformer can maintain balance during the operation of the resonant converter.

Abstract: A semiconductor process system includes a process chamber. The process chamber includes a wafer support configured to support a wafer. The system includes a bell jar configured to be positioned over the wafer during a semiconductor process. The interior surface of the bell jar is coated with a rough coating. The rough coating can include zirconium.

Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: A device applied to a display includes a receiving circuit, a detecting circuit, an image processing circuit and a response time enhancing circuit. The receiving circuit receives an input image signal. The detecting circuit detects a frame rate of image data of a frame in the input image signal. The image processing circuit performs image processing on the image data of the frame to generate a target pixel value of multiple pixels in the frame. The response time enhancing circuit determines multiple adjusted pixel values of the multiple pixels according to the frame rate, and outputs the adjusted pixel values to a display panel. For a pixel, the adjusted pixel values generated for the pixel under different frame rates are different.

Abstract: A device applied to a display includes a receiving circuit, a detecting circuit, an image processing circuit and a response time enhancing circuit. The receiving circuit receives an input image signal. The detecting circuit detects a frame rate of image data of a frame in the input image signal. The image processing circuit performs image processing on the image data of the frame to generate a target pixel value of multiple pixels in the frame. The response time enhancing circuit determines multiple adjusted pixel values of the multiple pixels according to the frame rate, and outputs the adjusted pixel values to a display panel. For a pixel, the adjusted pixel values generated for the pixel under different frame rates are different.

Abstract: A device for testing a multiplicity of lens modules includes a base, a circuit board, a connection member, and a support assembly. The base includes a support surface. The support surface includes a loading area and a slide area. The circuit board is positioned on the base in the loading area. The circuit board includes a number of signal input interfaces. The connection element includes a shell and a number of elastic and flexible metal elements. Each metal element connects to the number of signal input interfaces. The support assembly supports the lens modules, and can slide in the slide area to bring the metal elements into electrical contact with the lens modules.

Abstract: Provided are a polymer composition on a substrate and a surface modification method which is non-selective to substrate materials. Chemical vapor deposition polymerization is used to deposit a maleimide-functionalized poly-p-xylylene coating on a substrate. The substrate is readily available to perform a thiol-maleimide coupling reaction under mild conditions so as to modify the surface thereof. Furthermore, through a tailored thiol-terminal molecule, a designer surface can be created via thiol-maleimide coupling on a substrate, and the resulting surface can exhibit various desired biological functions for biotechnological applications. Therefore, this modification technique can be applied to biological fields extensively.

Abstract: Provided are a polymer composition on a substrate and a surface modification method which is non-selective to substrate materials. Chemical vapor deposition polymerization is used to deposit a maleimide-functionalized poly-p-xylylene coating on a substrate. The substrate is readily available to perform a thiol-maleimide coupling reaction under mild conditions so as to modify the surface thereof. Furthermore, through a tailored thiol-terminal molecule, a designer surface can be created via thiol-maleimide coupling on a substrate, and the resulting surface can exhibit various desired biological functions for biotechnological applications. Therefore, this modification technique can be applied to biological fields extensively.

Abstract: A device for testing a multiplicity of lens modules includes a base, a circuit board, a connection member, and a support assembly. The base includes a support surface. The support surface includes a loading area and a slide area. The circuit board is positioned on the base in the loading area. The circuit board includes a number of signal input interfaces. The connection element includes a shell and a number of elastic and flexible metal elements. Each metal element connects to the number of signal input interfaces. The support assembly supports the lens modules, and can slide in the slide area to bring the metal elements into electrical contact with the lens modules.

Abstract: A lens module includes a holder defining a cavity and a barrel retained within the cavity, and includes a first optical axis X aligned with an imaginary axis of the cavity, a frame defining a through hole and comprising several blocking portions, and a square lens possessing a second optical axis Y. The frame is coupled to the holder, and an imaginary axis of the through hole is aligned with the axis of the cavity. The square lens is connected to the frame and includes four side surfaces abutting the several blocking portions, which precisely aligns the second optical axis Y with the imaginary axis of the through hole.

Abstract: A lens module includes a holder defining a cavity and a barrel retained within the cavity, and includes a first optical axis X aligned with an imaginary axis of the cavity, a frame defining a through hole and comprising several blocking portions, and a square lens possessing a second optical axis Y. The frame is coupled to the holder, and an imaginary axis of the through hole is aligned with the axis of the cavity. The square lens is connected to the frame and includes four side surfaces abutting the several blocking portions, which precisely aligns the second optical axis Y with the imaginary axis of the through hole.

Abstract: A lens module electrical testing system is set up and configured for testing lens modules. The lens module electrical testing system includes a circuit board, a LCR meter connecting with the circuit board, and a program controller connecting with the circuit board. The circuit board includes an electrical connecting portion and a microcontroller. The electrical connecting portion connects with the lens module. The program controller sends programs to the microcontroller. The microcontroller sends a control command to the LCR meter. The LCR meter tests the electrical properties of the lens module, and then determines the quality of the lens module corresponding to the control command by pass or fail. The present disclosure further provides a testing method for testing lens modules using the lens module electrical testing system.