Patents by Inventor Mher Mkhoyan

Mher Mkhoyan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Periodic signal measurement using statistical sampling
    Patent number: 9541591
    Abstract: A fully-digital probabilistic measurement methodology in which a periodic signal generated on an IC device is sampled multiple times during a test period, with the asserted/de-asserted state of the periodic signal determined during each sampling event. A statistically significant number of sampling events are executed according to a reference signal frequency that is uncorrelated to the IC's system clock, whereby each successive sampling event involves detecting an essentially random associated phase of the periodic signal such that the probability of detecting an asserted state during any given sampling event is proportional to the duty cycle of the periodic signal. A first count value records the number of sampling events in which the periodic signal is asserted, and a second count value records the total number of sampling events performed, whereby a ratio of these two count values provides a statistical measurement of the periodic signal's duty cycle.
    Type: Grant
    Filed: August 10, 2015
    Date of Patent: January 10, 2017
    Assignee: Synopsys, Inc.
    Inventors: Karen Darbinyan, Yervant Zorian, Arun Kumar, Mher Mkhoyan
  • Periodic Signal Measurement Using Statistical Sampling
    Publication number: 20160041212
    Abstract: A fully-digital probabilistic measurement methodology in which a periodic signal generated on an IC device is sampled multiple times during a test period, with the asserted/de-asserted state of the periodic signal determined during each sampling event. A statistically significant number of sampling events are executed according to a reference signal frequency that is uncorrelated to the IC's system clock, whereby each successive sampling event involves detecting an essentially random associated phase of the periodic signal such that the probability of detecting an asserted state during any given sampling event is proportional to the duty cycle of the periodic signal. A first count value records the number of sampling events in which the periodic signal is asserted, and a second count value records the total number of sampling events performed, whereby a ratio of these two count values provides a statistical measurement of the periodic signal's duty cycle.
    Type: Application
    Filed: August 10, 2015
    Publication date: February 11, 2016
    Inventors: Karen Darbinyan, Yervant Zorian, Arun Kumar, Mher Mkhoyan
  • Architecture, system and method for compressing repair data in an integrated circuit (IC) design
    Patent number: 8295108
    Abstract: Architecture, system and method for providing compression of repair data in an IC design having a plurality of memory instances. In one embodiment, the repair data storage method includes determining repair data for each of the memory instances and compressing the repair data into a compressed format that is stored in a shared nonvolatile storage common to the memory instances.
    Type: Grant
    Filed: January 21, 2011
    Date of Patent: October 23, 2012
    Assignee: Synopsys, Inc.
    Inventors: Karen Darbinyan, Gevorg Torjyan, Yervant Zorian, Mher Mkhoyan
  • Architecture, System And Method For Compressing Repair Data In An Integrated Circuit (IC) Design
    Publication number: 20110119531
    Abstract: Architecture, system and method for providing compression of repair data in an IC design having a plurality of memory instances. In one embodiment, the repair data storage method includes determining repair data for each of the memory instances and compressing the repair data into a compressed format that is stored in a shared nonvolatile storage common to the memory instances.
    Type: Application
    Filed: January 21, 2011
    Publication date: May 19, 2011
    Applicant: SYNOPSYS, INC.
    Inventors: Karen Darbinyan, Gevorg Torjyan, Yervant Zorian, Mher Mkhoyan
  • Architecture, system and method for compressing repair data in an integrated circuit (IC) design
    Patent number: 7898882
    Abstract: Architecture, system and method for providing compression of repair data in an IC design having a plurality of memory instances. In one embodiment, the repair data storage method includes determining repair data for each of the memory instances and compressing the repair data into a compressed format that is stored in a shared nonvolatile storage common to the memory instances.
    Type: Grant
    Filed: June 22, 2007
    Date of Patent: March 1, 2011
    Assignee: Synopsys, Inc.
    Inventors: Karen Darbinyan, Gevorg Torjyan, Yervant Zorian, Mher Mkhoyan
  • Architecture, System and Method for Compressing Repair Data in an Integrated Circuit (IC) Design
    Publication number: 20080008015
    Abstract: Architecture, system and method for providing compression of repair data in an IC design having a plurality of memory instances. In one embodiment, the repair data storage method includes determining repair data for each of the memory instances and compressing the repair data into a compressed format that is stored in a shared nonvolatile storage common to the memory instances.
    Type: Application
    Filed: June 22, 2007
    Publication date: January 10, 2008
    Inventors: Karen Darbinyan, Gevorg Torjyan, Yervant Zorian, Mher Mkhoyan