Patents by Inventor Mi-Joung Lee

Mi-Joung Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Organic electroluminescent compound and organic electroluminescent device comprising the same
    Patent number: 11963439
    Abstract: The present disclosure relates to an organic electroluminescent compound and an organic electroluminescent device comprising the same. By comprising the compound according to the present disclosure, it is possible to produce an organic electroluminescent device having improved driving voltage, power efficiency, and/or lifetime properties compared to the conventional organic electroluminescent devices.
    Type: Grant
    Filed: August 24, 2022
    Date of Patent: April 16, 2024
    Assignee: Rohm and Haas Electronic Materials Korea Ltd.
    Inventors: Eun-Joung Choi, Young-Kwang Kim, Su-Hyun Lee, So-Young Jung, YeJin Jeon, Hong-Se Oh, Dong-Hyung Lee, Jin-Man Kim, Hyun-Woo Kang, Mi-Ja Lee, Hee-Ryong Kang, Hyo-Nim Shin, Jeong-Hwan Jeon, Sang-Hee Cho
  • Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect
    Patent number: 7733099
    Abstract: A monitoring pattern for detecting a defect in a semiconductor device allows a voltage contrast inspection which may be verified by an electrical test where no special test pattern is required for the electrical test. The monitoring pattern includes a test pattern with line shapes arranged in parallel and spaced apart at predetermined linewidths and intervals, and an interconnection layer connected to the test pattern, where the test pattern is adapted to be charged with a specific potential to be displayed as a voltage contrast image when scanned with an electron beam.
    Type: Grant
    Filed: May 17, 2007
    Date of Patent: June 8, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Choel-Hwyi Bae, Yong-Woon Han, Mi-Joung Lee, Sang-Deok Kwon
  • Test pattern and method of monitoring defects using the same
    Patent number: 7705621
    Abstract: A test pattern includes a normal pattern, an abnormal pattern having predetermined defects, and a conductive line electrically connected to the normal pattern and electrically isolated from the abnormal pattern. Thus, a non-contact test process and a contact test process may be compatible with the single test pattern.
    Type: Grant
    Filed: September 10, 2007
    Date of Patent: April 27, 2010
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Hyock-Jun Lee, Choel-Hwyi Bae, Yeong-Lyeol Park, Nam-Young Lee, Mi-Joung Lee
  • TEST PATTERN AND METHOD OF MONITORING DEFECTS USING THE SAME
    Publication number: 20080084223
    Abstract: A test pattern includes a normal pattern, an abnormal pattern having predetermined defects, and a conductive line electrically connected to the normal pattern and electrically isolated from the abnormal pattern. Thus, a non-contact test process and a contact test process may be compatible with the single test pattern.
    Type: Application
    Filed: September 10, 2007
    Publication date: April 10, 2008
    Inventors: Hyock-Jun Lee, Choel-Hwyi Bae, Yeong-Lyeol Park, Nam-Young Lee, Mi-Joung Lee
  • Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect
    Publication number: 20070296447
    Abstract: A monitoring pattern for detecting a defect in a semiconductor device allows a voltage contrast inspection which may be verified by an electrical test where no special test pattern is required for the electrical test. The monitoring pattern includes a test pattern with line shapes arranged in parallel and spaced apart at predetermined linewidths and intervals, and an interconnection layer connected to the test pattern, where the test pattern is adapted to be charged with a specific potential to be displayed as a voltage contrast image when scanned with an electron beam.
    Type: Application
    Filed: May 17, 2007
    Publication date: December 27, 2007
    Inventors: Choel-Hwyi Bae, Yong-Woon Han, Mi-Joung Lee, Sang-Deok Kwon