Patents by Inventor Mianyi Chen

Mianyi Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automatic system calibration method of X-ray CT
    Patent number: 10643354
    Abstract: Systems and methods for geometric calibration and image reconstruction in computed tomography (CT) scanning using iterative reconstruction algorithms are provided. An iterative reconstruction algorithm can be used to reconstruct an improved image, and then the improved image can be used to adjust inaccurate parameters by using a Locally Linear Embedding (LLE) method. Adjusted parameters can then be used to reconstruct new images, which can then be used to further adjust the parameters. The steps of this iterative process can be repeated until a quality threshold is met.
    Type: Grant
    Filed: March 21, 2016
    Date of Patent: May 5, 2020
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Ge Wang, Mianyi Chen, Yan Xi, Wenxiang Cong
  • AUTOMATIC SYSTEM CALIBRATION METHOD OF X-RAY CT
    Publication number: 20180068467
    Abstract: Systems and methods for geometric calibration and image reconstruction in computed tomography (CT) scanning using iterative reconstruction algorithms are provided. An iterative reconstruction algorithm can be used to reconstruct an improved image, and then the improved image can be used to adjust inaccurate parameters by using a Locally Linear Embedding (LLE) method. Adjusted parameters can then be used to reconstruct new images, which can then be used to further adjust the parameters. The steps of this iterative process can be repeated until a quality threshold is met.
    Type: Application
    Filed: March 21, 2016
    Publication date: March 8, 2018
    Inventors: Ge Wang, Mianyi Chen, Yan Xi, Wenxiang Cong