Patents by Inventor Miaw Looi

Miaw Looi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for performing statistical post processing in semiconductor manufacturing using ID cells
    Patent number: 6939727
    Abstract: A method of manufacturing a semiconductor integrated circuit includes providing a fabricated integrated circuit on a wafer. A test fixture is connected to unencapsulated pads on the integrated circuit to monitor an operating parameter for the circuit and to determine a unique identifier for the die. The parameter is analyzed in post processing.
    Type: Grant
    Filed: November 3, 2003
    Date of Patent: September 6, 2005
    Assignee: LSI Logic Corporation
    Inventors: Ernest Allen, III, David Castaneda, Miaw Looi