Abstract: Described herein are DACs with low distortion for high dynamic range (HDR), extremely high dynamic range (EHDR), and other suitable applications. Some embodiments relate to a device including a DAC configured for coupling to an amplifier via a force path and a sense path. For example, the DAC may provide output current to the amplifier via the force path, and the DAC may sense the input voltage of the amplifier via the sense path. Accordingly, distortion such as harmonic distortion and/or gain offset from parasitic impedances in the force and/or sense paths may be reduced or eliminated. Some embodiments relate to a DAC including a voltage reference generator configured to compensate for variations in impedances of the DAC, such as due to semiconductor process variation. Accordingly, distortion in the DAC output due to variations in the DAC impedances may be reduced or eliminated.

Abstract: Circuits and methods for converting digital input signals into the analog domain are described. Such circuits may perform the conversion in a segmented fashion. For example, a circuit may include a most significant bit (MSB) path and a least significant bit (LSB) path. The MSB path may include a first delta-sigma modulator having first and second outputs and a first digital-to-analog converter coupled to the first output of the first delta-sigma modulator. The LSB path comprises a second delta-sigma modulator comprising a loop filter and a quantizer. The quantizer may have an input coupled to the loop filter and to the digital filter. The LSB path may further include a second digital-to-analog converter coupled to an output of the quantizer. The circuit may further include a digital filter and/or a gain stage interposed between the MSB path and the LSB path.

Abstract: Described herein are DACs with low distortion for high dynamic range (HDR), extremely high dynamic range (EHDR), and other suitable applications. Some embodiments relate to a device including a DAC configured for coupling to an amplifier via a force path and a sense path. For example, the DAC may provide output current to the amplifier via the force path, and the DAC may sense the input voltage of the amplifier via the sense path. Accordingly, distortion such as harmonic distortion and/or gain offset from parasitic impedances in the force and/or sense paths may be reduced or eliminated. Some embodiments relate to a DAC including a voltage reference generator configured to compensate for variations in impedances of the DAC, such as due to semiconductor process variation. Accordingly, distortion in the DAC output due to variations in the DAC impedances may be reduced or eliminated.

Abstract: Circuits and methods for converting digital input signals into the analog domain are described. Such circuits may perform the conversion in a segmented fashion. For example, a circuit may include a most significant bit (MSB) path and a least significant bit (LSB) path. The MSB path may include a first delta-sigma modulator having first and second outputs and a first digital-to-analog converter coupled to the first output of the first delta-sigma modulator. The LSB path comprises a second delta-sigma modulator comprising a loop filter and a quantizer. The quantizer may have an input coupled to the loop filter and to the digital filter. The LSB path may further include a second digital-to-analog converter coupled to an output of the quantizer. The circuit may further include a digital filter and/or a gain stage interposed between the MSB path and the LSB path.

Abstract: A comparator is described. The comparator may be used in several applications, including in digital-to-analog converters (ADC). The comparator may comprise a high-speed amplifier, a low-noise amplifier, a controller and a bi-stable circuit. The high-speed amplifier may be activated during a first period, for example when the comparator tends to exhibit a slow response. During this period, the comparator may sacrifice the noise performance. The low-noise amplifier may be activated during a second period, for example when the difference between the signals appearing as inputs to the comparator is small. The low-noise amplifier may have a gain that is large enough to limit decision errors. The bi-stable circuit, which may be implemented using a latch, may be configured to output a signal equal to one of the supply voltages, in response to receiving the input signal from one of the stages.

Abstract: According to at least one aspect, a delta sigma modulator circuit is provided. The delta sigma modulator circuit includes a first signal processor circuit configured to receive an input signal and a feedback signal and generate a processed signal using the input signal and the feedback signal, a quantizer configured to generate a digital code using the processed signal, a second signal processor circuit configured to receive the digital code, segment the digital code to form a segmented digital code that is smaller in size than the digital code, and generate a rotated digital code using the segmented digital code at least in part by rotating the segmented digital code to compensate for an excess loop delay in the circuit, and an digital-to-analog converter (DAC) configured to receive the rotated digital code and generate the feedback signal using the rotated digital code.

Abstract: Circuits and methods for inter-symbol interference compensation are described. These circuits and methods may be used in connection with delta-sigma analog-to-digital converter. During a sensing phase, a value indicative of the inter-symbol interference may be sensed. The value may be obtained by (1) causing the ADC to generate a first number of transitions during a first time interval; (2) causing the ADC to generate a second number of transitions during a second time interval; (3) sensing the number of logic-0s and logic-1s occurring in the first and second time intervals; and (4) computing the value based at least in part on the number of logic-0s and logic-1s occurring in the first and second time intervals. During a compensation phase, inter-symbol interference may be compensated based on the value obtained in the sensing phase.

Abstract: Circuits and methods for inter-symbol interference compensation are described. These circuits and methods may be used in connection with delta-sigma analog-to-digital converter. During a sensing phase, a value indicative of the inter-symbol interference may be sensed. The value may be obtained by (1) causing the ADC to generate a first number of transitions during a first time interval; (2) causing the ADC to generate a second number of transitions during a second time interval; (3) sensing the number of logic-0s and logic-1s occurring in the first and second time intervals; and (4) computing the value based at least in part on the number of logic-0s and logic-1s occurring in the first and second time intervals. During a compensation phase, inter-symbol interference may be compensated based on the value obtained in the sensing phase.

Abstract: Circuits for compensating delta-sigma modulators for excess loop delay are described. These circuits may be coupled to quantizers, and may configured to select the threshold values supplied to the quantizers for comparison with an analog signal. The threshold values may each be selected from a corresponding plurality of reference values, and may be set such that the numerical order of threshold values varies over time. For example, the threshold value provided to a first comparator of the quantizer may be greater than the threshold value provided to a second comparator of the quantizer in a first time interval, but the opposite scenario may occur in a second time interval. The circuits may include multiplexers for selecting the threshold values, thermometric encoders, reference selectors and reference multiplexers.

Abstract: A comparator is described. The comparator may be used in several applications, including in digital-to-analog converters (ADC). The comparator may comprise a high-speed amplifier, a low-noise amplifier, a controller and a bi-stable circuit. The high-speed amplifier may be activated during a first period, for example when the comparator tends to exhibit a slow response. During this period, the comparator may sacrifice the noise performance. The low-noise amplifier may be activated during a second period, for example when the difference between the signals appearing as inputs to the comparator is small. The low-noise amplifier may have a gain that is large enough to limit decision errors. The bi-stable circuit, which may be implemented using a latch, may be configured to output a signal equal to one of the supply voltages, in response to receiving the input signal from one of the stages.

Abstract: According to at least one aspect, a delta sigma modulator circuit is provided. The delta sigma modulator circuit includes a first signal processor circuit configured to receive an input signal and a feedback signal and generate a processed signal using the input signal and the feedback signal, a quantizer configured to generate a digital code using the processed signal, a second signal processor circuit configured to receive the digital code, segment the digital code to form a segmented digital code that is smaller in size than the digital code, and generate a rotated digital code using the segmented digital code at least in part by rotating the segmented digital code to compensate for an excess loop delay in the circuit, and an digital-to-analog converter (DAC) configured to receive the rotated digital code and generate the feedback signal using the rotated digital code.

Abstract: A continuous-time sigma-delta modulator includes a VCO-based quantizer, a rotator, a truncation circuit and a digital-to-analog converter (DAC). The VCO-based quantizer is arranged to generate a thermometer code based on an input signal and a feedback signal. The rotator is coupled to the VCO-based quantizer, and is arranged to generate a phase-shifted thermometer code based on the thermometer code and a phase shift, and generate a rearranged thermometer code based on the phase-shifted thermometer code to comply with a specific pattern. The truncation circuit is coupled to the rotator, and is arranged to extract a most significant bit (MSB) part from the rearranged thermometer code. The DAC is coupled to the truncation circuit, and is arranged to generate the feedback signal according to at least the MSB part. Two alternative continuous-time sigma-delta modulators are also disclosed.

Abstract: The present disclosure is drawn to an adhesive peel-forming formulation for dermal delivery of a drug, comprising a drug, a solvent vehicle, and a polymer peel-forming agent. The solvent vehicle can comprise a volatile solvent system comprising one or more volatile solvent, and a non-volatile solvent system comprising two or more non-volatile solvents. The non-volatile solvent system can have a solubility with respect to the drug that is within a window of operable solubility such that the drug is deliverable at therapeutically effective rates over a sustained period of time.

Abstract: A continuous-time sigma-delta modulator includes a VCO-based quantizer, a rotator, a truncation circuit and a digital-to-analog converter (DAC). The VCO-based quantizer is arranged to generate a thermometer code based on an input signal and a feedback signal. The rotator is coupled to the VCO-based quantizer, and is arranged to generate a phase-shifted thermometer code based on the thermometer code and a phase shift, and generate a rearranged thermometer code based on the phase-shifted thermometer code to comply with a specific pattern. The truncation circuit is coupled to the rotator, and is arranged to extract a most significant bit (MSB) part from the rearranged thermometer code. The DAC is coupled to the truncation circuit, and is arranged to generate the feedback signal according to at least the MSB part. Two alternative continuous-time sigma-delta modulators are also disclosed.

Abstract: Systems and methods for measuring and compensating a DC-transfer characteristic of analog-to-digital converters are described. A test-signal generator comprising a sigma-delta modulator may provide calibration signals to an ADC. An output from the ADC may be filtered with a notch filter to suppress quantization noise at discrete frequencies introduced by the sigma-delta modulator. The resulting filtered signal may be compared against an input digital signal to the test-signal generator to determine a transfer characteristic of the ADC.

Abstract: A continuous-time sigma-delta modulator includes a VCO-based quantizer, a rotator, a truncation circuit and a digital-to-analog converter (DAC). The VCO-based quantizer is arranged to generate a thermometer code based on an input signal and a feedback signal. The rotator is coupled to the VCO-based quantizer, and is arranged to generate a phase-shifted thermometer code based on the thermometer code and a phase shift, and generate a rearranged thermometer code based on the phase-shifted thermometer code to comply with a specific pattern. The truncation circuit is coupled to the rotator, and is arranged to extract a most significant bit (MSB) part from the rearranged thermometer code. The DAC is coupled to the truncation circuit, and is arranged to generate the feedback signal according to at least the MSB part. Two alternative continuous-time sigma-delta modulators are also disclosed.

Abstract: A method and apparatus for a digitally-corrected analog-to-digital converter (ADC) are disclosed. The apparatus comprises a nonlinearity generator that generates one or more nonlinear characteristics of a time varying input signal and that causes unwanted signal components at frequencies other than a frequency of the time varying input signal, a frequency response modifier coupled to the nonlinearity generator that modifies the unwanted signal components by altering an amplitude of the unwanted signal components, a frequency response compensator coupled to the frequency response modifier, wherein the frequency response compensator compensates for the modification introduced by the frequency response modifier to provide a filtered digital signal, and an inverse nonlinearity generator coupled to the frequency response compensator for receiving the filtered digital signal, wherein the inverse nonlinearity generator compensates for the one or more nonlinear characteristics.

Abstract: A method and apparatus for a digitally-corrected analog-to-digital converter (ADC) are disclosed. The apparatus comprises a nonlinearity generator that generates one or more nonlinear characteristics of a time varying input signal and that causes unwanted signal components at frequencies other than a frequency of the time varying input signal, a frequency modifier coupled to the nonlinearity generator that modifies the unwanted signal components by altering an amplitude of the unwanted signal components, a frequency compensator coupled to the frequency modifier, wherein the frequency compensator compensates for the modification introduced by the frequency modifier to provide a filtered digital signal, and an inverse nonlinearity generator coupled to the frequency compensator for receiving the filtered digital signal, wherein the inverse nonlinearity generator compensates for the one or more nonlinear characteristics.

Abstract: Systems and methods for measuring and compensating a DC-transfer characteristic of analog-to-digital converters are described. A test-signal generator comprising a sigma-delta modulator may provide calibration signals to an ADC. An output from the ADC may be filtered with a notch filter to suppress quantization noise at discrete frequencies introduced by the sigma-delta modulator. The resulting filtered signal may be compared against an input digital signal to the test-signal generator to determine a transfer characteristic of the ADC.

Abstract: Systems and methods for reducing spurious noise tones in sigma-delta analog-to-digital converters (ADCs) are described. A dither signal may be added to two differential input signals of a pseudo-differential sigma-delta ADC. The dither signal may be generated by a pseudo-random bit sequence generator and applied to two input buffers, which add the dither signal to received differential analog input signals. The dithered signals may be digitized by two independent sigma-delta ADCs and then subtracted to remove the dither signal from an overall digital output signal.