Abstract: An electronic circuit for dynamic evaluation of logic functions includes a discharging circuit, a first keeper circuit, a delay circuit and a second keeper circuit. The discharging circuit is configured to discharge an evaluation node. The first keeper circuit is configured to charge the evaluation node and configured to be disabled responsively to a first keeper control indication. The delay circuit is configured to generate a second keeper control indication that is delayed relative to the first keeper control indication. The second keeper circuit is configured to retain a charge on the evaluation node responsively to the second keeper control indication.

Abstract: An adaptive current mirror circuit for current shaping with temperature is disclosed. The adaptive current mirror includes a current generator circuit configured to receive and input current and generate an output current using the input current and an overdrive voltage. The adaptive current mirror further includes a compensation circuit configured to adjust a value of the overdrive voltage based on temperature.

Abstract: An amplifier system includes a differential amplifier and a calibration circuit. In response to a calibration operation, the calibration circuit generates a calibration value based on a test output signal generated by the differential amplifier circuit using a test input signal. The calibration value may be used to adjust loading of internal nodes of the differential amplifier circuit to compensate for imbalance in the differential amplifier circuit resulting from variation in manufacturing. By compensating for the imbalance, the offset of the differential amplifier may be reduced, allowing resolution of smaller differential voltages, thereby improving the performance of circuits employing the differential amplifier circuit.

Abstract: An adaptive current mirror circuit for current shaping with temperature is disclosed. The adaptive current mirror includes a current generator circuit configured to receive and input current and generate an output current using the input current and an overdrive voltage. The adaptive current mirror further includes a compensation circuit configured to adjust a value of the overdrive voltage based on temperature.

Abstract: A compute-memory circuit included in a computer system may include multiple compute data storage cells coupled to a compute bit line via respective capacitors. The compute data storage cells may store respective bits of a weight value. During a multiply operation, an operand may be used to generate a voltage level on a compute word line that is used to store respective amounts of charge on the capacitors, which are coupled to the compute bit line. The voltage on the compute bit line may be converted into multiple bits whose value is indicative of a product of the operand and the weight value.

Abstract: An amplifier system includes a differential amplifier and a calibration circuit. In response to a calibration operation, the calibration circuit generates a calibration value based on a test output signal generated by the differential amplifier circuit using a test input signal. The calibration value may be used to adjust loading of internal nodes of the differential amplifier circuit to compensate for imbalance in the differential amplifier circuit resulting from variation in manufacturing. By compensating for the imbalance, the offset of the differential amplifier may be reduced, allowing resolution of smaller differential voltages, thereby improving the performance of circuits employing the differential amplifier circuit.

Abstract: A computer system may include circuit blocks that may operate in different operating modes. When operating in a retention mode, a voltage level of a local power supply node for a particular circuit block may be less than a voltage level of the local power supply node when the particular circuit block is operating in an active mode. An output buffer circuit may be configured to generate, when the particular circuit block is operating in retention mode, an output signal using a circuit signal generated by the particular circuit block, and a voltage level corresponding to the active mode of operation.

Abstract: In an embodiment, an apparatus includes a first latch including a true storage node and a complement storage node, a discharge circuit, and a second latch. The first latch may pre-charge the true storage node and the complement storage node to a first voltage level using a clock signal. The discharge circuit may, in response to a determination that a scan mode signal is asserted, selectively discharge either the true storage node or the complement storage node based on a value of a scan data signal, and otherwise may selectively discharge either the true storage node or the complement storage node based on a value of a data signal. The second latch may store a value of a data bit based on a voltage level of the true storage node and a voltage level of the complement storage node.

Abstract: In an embodiment, an apparatus includes a first latch including a true storage node and a complement storage node, a discharge circuit, and a second latch. The first latch may pre-charge the true storage node and the complement storage node to a first voltage level using a clock signal. The discharge circuit may, in response to a determination that a scan mode signal is asserted, selectively discharge either the true storage node or the complement storage node based on a value of a scan data signal, and otherwise may selectively discharge either the true storage node or the complement storage node based on a value of a data signal. The second latch may store a value of a data bit based on a voltage level of the true storage node and a voltage level of the complement storage node.

Abstract: Systems, apparatuses, and methods for tracking a retention voltage are disclosed. In one embodiment, a circuit is utilized for generating a standby voltage for a static random-access memory (SRAM) array. The circuit tracks the leakage current of the bitcells of the SRAM array as the leakage current varies over temperature. The circuit mirrors this leakage current and tracks the higher threshold voltage of a p-channel transistor or an n-channel transistor, with the p-channel and n-channel transistors matching the transistors in the bitcells of the SRAM array. The circuit includes a voltage regulator to supply power to the SRAM array at a supply voltage proportional to the higher threshold voltage tracked. Setting a supply voltage of the SRAM array based on threshold voltages and leakage current may reduce power consumption as compared to using a supply voltage based on a worst case operating conditions assumption for the SRAM array.

Abstract: An apparatus for modifying a voltage level of a memory array power supply is disclosed. A first column may include a first plurality of data storage cells coupled to a first local power supply signal and a second column may include a second plurality of data storage cells coupled to a second local power supply signal. A first switch may be configured to selectively coupled the first local power supply signal to either a first power signal or a second power supply signal dependent upon a value of a first selection signal, and a second switch may be configured to selectively couple the second local power supply signal to either the first power supply signal or the second power supply signal dependent upon a value of a second selection signal.

Abstract: Methods and apparatuses for performing a disturb test on a memory are disclosed. Circuitry may be configured to store test data into one or more data storage cells. A regulation circuit may adjust a level of a power supply coupled to the one or more data storage cells from a first level to a second level. Once the voltage level of the power supply has reached the second level, the circuitry may perform a read operation on the one or more data storage cells. Upon completion of the read operation, the regulation circuit may return the voltage level of the power supply to the first level, and the circuitry may perform another read operation, the results of which, the circuitry may compare to the test data.

Abstract: Methods and apparatuses for performing a disturb test on a memory are disclosed. Circuitry may be configured to store test data into one or more data storage cells. A regulation circuit may adjust a level of a power supply coupled to the one or more data storage cells from a first level to a second level. Once the voltage level of the power supply has reached the second level, the circuitry may perform a read operation on the one or more data storage cells. Upon completion of the read operation, the regulation circuit may return the voltage level of the power supply to the first level, and the circuitry may perform another read operation, the results of which, the circuitry may compare to the test data.

Abstract: A memory device includes a memory array and a sense amplifier. The memory array includes a floating body cell configured to store a bit value. The sense amplifier includes a bit output configured to provide an output voltage representative of the bit value and a reference source configured to provide a reference voltage. The sense amplifier further includes a current mirror configured to provide a current to the first floating body cell based on the reference voltage, and a differential amplifier circuit configured to determine the output voltage based on the reference voltage and a voltage across the floating body cell resulting from application of the current to the floating body cell.

Abstract: A memory device includes a memory array and a sense amplifier. The memory array includes a floating body cell configured to store a bit value. The sense amplifier includes a bit output configured to provide an output voltage representative of the bit value and a reference source configured to provide a reference voltage. The sense amplifier further includes a current mirror configured to provide a current to the first floating body cell based on the reference voltage, and a differential amplifier circuit configured to determine the output voltage based on the reference voltage and a voltage across the floating body cell resulting from application of the current to the floating body cell.