Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.

Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference data base of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material is also disclosed.

Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference data base of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material is also disclosed.

Abstract: An apparatus for obtaining an image of a tooth having at least one light source providing incident light having a first spectral range for obtaining a reflectance image from the tooth and a second spectral range for exciting a fluorescence image from the tooth. A polarizing beamsplitter in the path of the incident light from both sources directs light having a first polarization state toward the tooth and directs light from the tooth having a second polarization state along a return path toward a sensor, wherein the second polarization state is orthogonal to the first polarization state. A first lens in the return path directs image-bearing light from the tooth toward the sensor, and obtains image data from the portion of the light having the second polarization state. A long-pass filter in the return path attenuates light in the second spectral range.

Abstract: An interferometer apparatus which include two or more coupled fiber optic Michelson interferometers using fiber optic stretches which stretch two or more optical fibers wound around the perimeter of the optical fiber stretchers by the same amount is disclosed. Preferably a pair of reference and sample fiber optic stretches are utilized which run in a push-pull mode of operation. When one of the interferometers is a coherent light interferometer it can be used as a reference distance scale for all of the remaining low coherence light interferometer. A method for measuring a physical property of a device under test is also disclosed using the apparatus of the present invention.

Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.

Abstract: An interferometer apparatus which include two or more coupled fiber optic Michelson interferometers using fiber optic stretches which stretch two or more optical fibers wound around the perimeter of the optical fiber stretchers by the same amount is disclosed. Preferably a pair of reference and sample fiber optic stretches are utilized which run in a push-pull mode of operation. When one of the interferometers is a coherent light interferometer it can be used as a reference distance scale for all of the remaining low coherence light interferometer. A method for measuring a physical property of a device under test is also disclosed using the apparatus of the present invention.

Abstract: An apparatus for determining the angular error in the placement of fiducial marks on a toric intraocular lens with respect to the true location of a meridional axis of the intraocular lens, the fiducial marks defining an estimate of the angular orientation of the meridional axis of the intraocular is disclosed. The apparatus includes a rotatable intraocular lens holder coupled to drive assembly and an actuator which are mounted into an optical measurement cell receptacle of a wavefront measuring instrument or an angular error measuring instrument. A method for determining the angular error in the placement of fiducial marks on a toric intraocular lens with respect to the true location of a meridional axis of the intraocular lens is also disclosed.

Abstract: An interferometer apparatus which include two or more coupled fiber optic Michelson interferometers using fiber optic stretches which stretch two or more optical fibers wound around the perimeter of the optical fiber stretchers by the same amount is disclosed. Preferably a pair of reference and sample fiber optic stretches are utilized which run in a push-pull mode of operation. When one of the interferometers is a coherent light interferometer it can be used as a reference distance scale for all of the remaining low coherence light interferometer. A method for measuring a physical property of a device under test is also disclosed using the apparatus of the present invention.

Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.

Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.

Abstract: An interferometer apparatus which include two or more coupled fiber optic Michelson interferometers using fiber optic stretches which stretch two or more optical fibers wound around the perimeter of the optical fiber stretchers by the same amount is disclosed. Preferably a pair of reference and sample fiber optic stretches are utilized which run in a push-pull mode of operation. When one of the interferometers is a coherent light interferometer it can be used as a reference distance scale for all of the remaining low coherence light interferometer. A method for measuring a physical property of a device under test is also disclosed using the apparatus of the present invention.

Abstract: An apparatus for determining the angular error in the placement of fiducial marks on a toric intraocular lens with respect to the true location of a meridional axis of the intraocular lens, the fiducial marks defining an estimate of the angular orientation of the meridional axis of the intraocular is disclosed. The apparatus includes a rotatable intraocular lens holder coupled to drive assembly and an actuator which are mounted into an optical measurement cell receptacle of a wavefront measuring instrument or an angular error measuring instrument. A method for determining the angular error in the placement of fiducial marks on a toric intraocular lens with respect to the true location of a meridional axis of the intraocular lens is also disclosed.

Abstract: An apparatus for obtaining an image of a tooth having at least one light source providing incident light having a first spectral range for obtaining a reflectance image from the tooth and a second spectral range for exciting a fluorescence image from the tooth. A polarizing beamsplitter in the path of the incident light from both sources directs light having a first polarization state toward the tooth and directs light from the tooth having a second polarization state along a return path toward a sensor, wherein the second polarization state is orthogonal to the first polarization state. A first lens in the return path directs image-bearing light from the tooth toward the sensor, and obtains image data from the portion of the light having the second polarization state. A long-pass filter in the return path attenuates light in the second spectral range.

Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.

Abstract: An apparatus for obtaining an image of a tooth having at least one light source providing incident light having a first spectral range for obtaining a reflectance image from the tooth and a second spectral range for exciting a fluorescence image from the tooth. A polarizing beamsplitter in the path of the incident light from both sources directs light having a first polarization state toward the tooth and directs light from the tooth having a second polarization state along a return path toward a sensor, wherein the second polarization state is orthogonal to the first polarization state. A first lens in the return path directs image-bearing light from the tooth toward the sensor, and obtains image data from the portion of the light having the second polarization state. A long-pass filter in the return path attenuates light in the second spectral range.

Abstract: A method of separating metallic semiconducting carbon nanotubes includes providing a source of a mixture of semiconducting and metallic carbon nanotubes in a carrier liquid with one of the semiconducting and metallic carbon nanotubes being functionalized to carry a charge. The mixture is pressurized to cause a liquid jet of the mixture to be emitted through a nozzle. A drop formation mechanism modulates the liquid jet to form from the jet first and second drops traveling along a path. An electric field modulating device, positioned relative to the jet, produces first and second electric fields. A deflection device applies the first electric field as the first drop is formed to concentrate the functionalized carbon nanotubes in the first drop and applies the second electric field as the second drop is formed. The deflection device causes the first or second drop to begin traveling along another path.