Abstract: A system and method of testing IP cores contained in a system-on-chip integrated circuit is disclosed. An operation command is received on an input/output port of the circuit. The operation command includes an operation code component, data component(s), and expected time component. The received operation command is processed to supply test data to each of the IP cores being tested. Result data is received in response to the supplied test data from each of the IP cores being tested. The result data is processed and from the processed result data is generated a status data packet. The status data packet includes the operation code component and a status flag component and is provided on the input/output port.

Abstract: A laser printer for Braille that obviates the need for embossing mechanisms and specialized paper. A laser printer for Braille according to the present teachings increases an amount of a toner that adheres to an area of a paper that corresponds to the Braille element. The increased amount of toner yields a printed Braille element that may be read by touch.

Abstract: A laser printer for Braille that obviates the need for embossing mechanisms and specialized paper. A laser printer for Braille according to the present teachings increases an amount of a toner that adheres to an area of a paper that corresponds to the Braille element. The increased amount of toner yields a printed Braille element that may be read by touch.

Abstract: A laser printer for Braille that obviates the need for embossing mechanisms and specialized paper. A laser printer for Braille according to the present teachings increases an amount of a toner that adheres to an area of a paper that corresponds to the Braille element. The increased amount of toner yields a printed Braille element that may be read by touch.

Abstract: A system and method for write-enable bypass testing in an electronic circuit. According to one embodiment, the integrated circuit that includes a memory block having at least one input and at least one output. At least one input is associated with a block of input logic and at least one output is associated with a block of output logic. The integrated circuit also includes a test circuit coupled to the memory block and operable to verify the block of input logic and the block of output logic while at the same time not impacting the timing of the integrated circuit. As such a signal propagating through just the input logic, the memory block and the output logic does so in an amount of time substantially similar the time it takes to propagate through the input logic, the memory block, the output logic, and the test circuit.