Abstract: Systems can include a test and measurement tool configured to generate measurement data, and imaging tool configured to generate image data, and a processor in communication with the imaging tool and the test and measurement tool. The processor can be configured to receive image data from the imaging tool and, if the image data satisfies one or more predetermined conditions, trigger the test and measurement tool to perform one or more corresponding operations. Similarly, the processor can receive measurement data from the test and measurement tool and, if the measurement data satisfies one or more predetermined conditions trigger the imaging tool to perform one or more corresponding operations.

Abstract: Systems can include a tool configured to generate a first set of data representative of an object and a control station configured to receive the first set of data from the tool. A mobile device in communication with the control station can receive data from the control station including information regarding the object based on the data received from the tool. A user of the mobile device, such as a technician, can travel to the location of the tool, and, when the mobile device is within a predetermined proximity of the tool, the tool can communicate directly with the mobile device. The technician can use the mobile device to communicate with and control the tool in order to safely perform equipment analysis.

Abstract: A resistor support assembly includes first, second, third, and fourth support members. Each of the first and second support members includes one or more resistor contact regions and apertures extending therethrough. Each third support member is at least partially disposed within one of the apertures of one of the first support members and one of the apertures of one of the second support members. Recesses may be formed in the resistor contact regions of the first and the second support members, and one or more load resistors may be at least partially disposed within the recesses. The resistor support assembly may be used to mount one or more load resistors to a printed circuit board, without obstructing airflow through hollow portions of the load resistors. To reduce parasitic capacitance and inductance, the first support members and the second support members are formed from non-conductive materials.

Abstract: A resistor support assembly includes first, second, third, and fourth support members. Each of the first and second support members includes one or more resistor contact regions and apertures extending therethrough. Each third support member is at least partially disposed within one of the apertures of one of the first support members and one of the apertures of one of the second support members. Recesses may be formed in the resistor contact regions of the first and the second support members, and one or more load resistors may be at least partially disposed within the recesses. The resistor support assembly may be used to mount one or more load resistors to a printed circuit board, without obstructing airflow through hollow portions of the load resistors. To reduce parasitic capacitance and inductance, the first support members and the second support members are formed from non-conductive materials.

Abstract: Systems can include a tool configured to generate a first set of data representative of an object and a control station configured to receive the first set of data from the tool. A mobile device in communication with the control station can receive data from the control station including information regarding the object based on the data received from the tool. A user of the mobile device, such as a technician, can travel to the location of the tool, and, when the mobile device is within a predetermined proximity of the tool, the tool can communicate directly with the mobile device. The technician can use the mobile device to communicate with and control the tool in order to safely perform equipment analysis.

Abstract: Test and measurement systems can include a test and measurement tool configured to generate measurement data representative of at least one parameter of an object under test and an imaging tool configured to generate image data representative of a target scene. The imaging tool can be removably attachable to the test and measurement tool. The test and measurement system can include a communication link that can provide communication between the test and measurement tool and the imaging tool. The communication link can facilitate one or both of communication of image data to the test and measurement tool and measurement data to the imaging tool. Systems can include a display in communication with at least one of the test and measurement tool or the imaging tool for presenting at least one of image data or measurement data to a user.

Abstract: Imaging tools can be fixedly or removably attached to various surfaces of test and measurement tools. An imaging tool comprising a sensor array capable of receiving electromagnetic radiation from a target scene can be configured to engage a surface of the test and measurement tool such that the imaging tool is supported by the test and measurement tool. When the imaging tool is engaged with the test and measurement tool, the sensor array can be movable relative to the imaging tool so that a target scene viewed by the sensor array of the imaging tool is adjustable without requiring movement of the test and measurement tool.

Abstract: Systems can include a test and measurement tool configured to generate measurement data, and imaging tool configured to generate image data, and a processor in communication with the imaging tool and the test and measurement tool. The processor can be configured to receive image data from the imaging tool and, if the image data satisfies one or more predetermined conditions, trigger the test and measurement tool to perform one or more corresponding operations. Similarly, the processor can receive measurement data from the test and measurement tool and, if the measurement data satisfies one or more predetermined conditions trigger the imaging tool to perform one or more corresponding operations.

Abstract: Embodiments of the present invention are directed to a system and method for generating a simulated pulse to be used in combination with a patient monitor. In many embodiments, a pulse is simulated by displacing a volume in a pressurized system. For instance, in one embodiment, the volume in the pressurized system is displaced by rotating a first end of a tube relative to a second end that is held stationary. A portion of the tube collapses due to the twisting causing the volume in the system to decrease. The first end of the tube may be rotated back to its original position causing the volume in the system to return to its original state. This change in volume simulates a pulse.

Abstract: Embodiments of the present invention are directed to a system and method for generating a simulated pulse to be used in combination with a patient monitor. In many embodiments, a pulse is simulated by displacing a volume in a pressurized system. For instance, in one embodiment, the volume in the pressurized system is displaced by rotating a first end of a tube relative to a second end that is held stationary. A portion of the tube collapses due to the twisting causing the volume in the system to decrease. The first end of the tube may be rotated back to its original position causing the volume in the system to return to its original state. This change in volume simulates a pulse.