Patents by Inventor Michael Alexander Shwe

Michael Alexander Shwe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8255246
    Abstract: Methods and apparatuses for computing a variance between two business metrics is described. In one embodiment, the method computes a variance for each of a first set of activities based on the corresponding reference state of that activity, wherein the variance for an activity is the change in contribution for that activity between the first and second business metrics and with each of the first set of activities having a reference value. Furthermore, the method computes a variance for each of a second set of activities based on the corresponding start and end values of that activity with each of the second set of activities having a start and end value.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: August 28, 2012
    Assignee: DemandTec, Inc.
    Inventors: Dirk Manfred Beyer, Phillip Dennis Delurgio, James Frederic Drew, Nathaniel Keith Folkert, Steven John Peter Hillion, Michael Alexander Shwe, Chad William Whipkey
  • Patent number: 8244575
    Abstract: Methods and apparatuses for computing a variance for the difference between two business metrics. In one embodiment, the method accesses a response model and a plurality of activities with start and end values for each of the plurality of activities. Furthermore, the method computes a variance for the difference between the first and second business metrics for each of the plurality of activities using the response model by setting that activity to one of the corresponding starting and ending values and setting others of the plurality of activities to the value state opposite of that activity, wherein the variance for an activity is the change in contribution for that activity between the start and end sales volumes.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: August 14, 2012
    Assignee: DemandTec, Inc.
    Inventors: Nathaniel Keith Folkert, Dirk Manfred Beyer, Phillip Dennis Delurgio, James Frederic Drew, Steven John Peter Hillion, Michael Alexander Shwe, Chad William Whipkey
  • Patent number: 8209216
    Abstract: Methods and apparatuses for decomposing a business metric based on a plurality of activities and a response model are described. In one embodiment, the method accesses the response model and the plurality of activities, the plurality of activities each having a reference and executed value. The method computes a contribution to the business metric based on setting one of the plurality of activities to one of the corresponding reference and executed value and setting the other activities to the value state opposite of that activity. Furthermore, the method computes each of the contributions independent of the response model type.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: June 26, 2012
    Assignee: DemandTec, Inc.
    Inventors: Chad William Whipkey, Dirk Manfred Beyer, Phillip Dennis Delurgio, James Frederic Drew, Nathaniel Keith Folkert, Steven John Peter Hillion, Michael Alexander Shwe
  • Publication number: 20100114637
    Abstract: Methods and apparatuses for computing a variance for the difference between two business metrics. In one embodiment, the method accesses a response model and a plurality of activities with start and end values for each of the plurality of activities. Furthermore, the method computes a variance for the difference between the first and second business metrics for each of the plurality of activities using the response model by setting that activity to one of the corresponding starting and ending values and setting others of the plurality of activities to the value state opposite of that activity, wherein the variance for an activity is the change in contribution for that activity between the start and end sales volumes.
    Type: Application
    Filed: October 31, 2008
    Publication date: May 6, 2010
    Applicant: M-Factor, Inc.
    Inventors: Nathaniel Keith Folkert, Dirk Manfred Beyer, Phillip Dennis Delurgio, James Frederic Drew, Steven John Peter Hillion, Michael Alexander Shwe, Chad William Whipkey
  • Publication number: 20100114658
    Abstract: Methods and apparatuses for computing an atomic decomposition level and a set of different decomposition levels based on the atomic decomposition level for a business metric are described. In one embodiment, the method accesses a response model and a first plurality of activities that are used to compute an atomic decomposition level. The atomic decomposition level is a base level of the set of different decomposition levels using different pluralities of activities. Furthermore, the set of different decompositions is consistent with the atomic decomposition level.
    Type: Application
    Filed: October 31, 2008
    Publication date: May 6, 2010
    Applicant: M-Factor, Inc.
    Inventors: James Frederic Drew, Dirk Manfred Beyer, Phillip Dennis Delurgio, Nathaniel Keith Folkert, Steven John Peter Hillion, Michael Alexander Shwe, Chad William Whipkey
  • Publication number: 20100114657
    Abstract: Methods and apparatuses for decomposing a business metric based on a plurality of activities and a response model are described. In one embodiment, the method accesses the response model and the plurality of activities, the plurality of activities each having a reference and executed value. The method computes a contribution to the business metric based on setting one of the plurality of activities to one of the corresponding reference and executed value and setting the other activities to the value state opposite of that activity. Furthermore, the method computes each of the contributions independent of the response model type.
    Type: Application
    Filed: October 31, 2008
    Publication date: May 6, 2010
    Applicant: M-Factor, Inc.
    Inventors: Chad William Whipkey, Dirk Manfred Beyer, Phillip Dennis Delurgio, James Frederic Drew, Nathaniel Keith Folkert, Steven John Peter Hillion, Michael Alexander Shwe
  • Publication number: 20100114625
    Abstract: Methods and apparatuses for computing a variance between two business metrics is described. In one embodiment, the method computes a variance for each of a first set of activities based on the corresponding reference state of that activity, wherein the variance for an activity is the change in contribution for that activity between the first and second business metrics and with each of the first set of activities having a reference value. Furthermore, the method computes a variance for each of a second set of activities based on the corresponding start and end values of that activity with each of the second set of activities having a start and end value.
    Type: Application
    Filed: October 31, 2008
    Publication date: May 6, 2010
    Applicant: M-Factor, Inc.
    Inventors: Dirk Manfred Beyer, Phillip Dennis Delurgio, James Frederic Drew, Nathaniel Keith Folkert, Steven John Peter Hillion, Michael Alexander Shwe, Chad William Whipkey