Abstract: A two-dimensional spectrometer includes a first mirror, a prism, a diffraction grating, a lens, a second mirror, and a two-dimensional sensor. The first mirror is configured to receive the optical signal from the optical entrance and reflect the optical signal towards the prism. After passing through the prism, the optical signal is provided to the diffraction grating. The diffraction grating diffracts the optical signal so as to generate a diffracted optical signal which is directed back through to prism, wherein the lens configured focuses the diffracted optical signal onto the second mirror. The second mirror reflects the diffracted optical signal back through the lens which focuses the diffracted optical signal onto the two-dimensional sensor. The diffraction grating may be an echelle grating.

Abstract: A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis, an optical assembly configured to direct the beam towards a sample for plasma spectrum analysis of the sample and collect a reflected light reflected by the sample. The optical assembly includes a long-wave pass optical filter arrangement which is configured to pass a first portion of the reflected light reflected by the sample and reflect a second portion of the reflected light reflected by the sample to a spectrometer.

Abstract: A two-dimensional spectrometer includes a first mirror, a prism, a diffraction grating, a lens, a second mirror, and a two-dimensional sensor. The first mirror is configured to receive the optical signal from the optical entrance and reflect the optical signal towards the prism. After passing through the prism, the optical signal is provided to the diffraction grating. The diffraction grating diffracts the optical signal so as to generate a diffracted optical signal which is directed back through to prism, wherein the lens configured focuses the diffracted optical signal onto the second mirror. The second mirror reflects the diffracted optical signal back through the lens which focuses the diffracted optical signal onto the two-dimensional sensor. The diffraction grating may be an echelle grating.

Abstract: A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis, an optical assembly configured to direct the beam towards a sample for plasma spectrum analysis of the sample and collect a reflected light reflected by the sample. The optical assembly includes a long-wave pass optical filter arrangement which is configured to pass a first portion of the reflected light reflected by the sample and reflect a second portion of the reflected light reflected by the sample to a spectrometer.

Abstract: A device for analyzing the material composition of a sample via plasma spectrum analysis includes a laser assembly configured to emit a beam for plasma spectrum analysis and an optical assembly configured to direct the beam towards a target for plasma spectrum analysis of the target. The optical assembly is configured to collect a plasma emitted light emitted from a plasma and provide the plasma emitted light to a dispersion module. The dispersion module includes a first and second diffraction gratings. The first diffraction grating and second diffraction grating are positioned within the dispersion module such that light received from the optical assembly contacts the first diffraction grating at least two times before being directed out of the dispersion module.