Patents by Inventor Michael B. Krell

Michael B. Krell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and Apparatus of Analyzing Sample Surface Data
    Publication number: 20120265487
    Abstract: An improved apparatus and method for the analysis of surface data collected using a sub-micron scale metrology instrument which provides a persistent user experience by allocating set portions of the display to major functional regions thereby allowing a quick to learn and easy to user interface for the setup, analysis, and display of microscopic 3D surface data measurements and resulting analytic data with a variety of 3D surface scanners.
    Type: Application
    Filed: May 19, 2011
    Publication date: October 18, 2012
    Inventors: Emilio Yanine, Paul R. Unruh, Jon D. Herron, JR., Michael B. Krell, Son H. Bui, Joseph P. Moore, Dmitriy K. Kiselev, Ross O. Smith
  • Alignment and correction template for optical profilometric measurement
    Patent number: 6847460
    Abstract: An electronic template delineating distinct selected patterns corresponding to predetermined regions of interest in a sample part is used to limit analysis to those regions. The surface of the sample is first measured using conventional techniques. The data so acquired are used to identify boundaries between distinct regions, which are then compared to a predetermined pattern boundary in the template to find a best-fit match. The position of the pattern is then shifted to overlay the match, thereby automatically aligning the template's selected patterns with the regions of interest in the sample surface. As a result, profilometric analysis can be limited to the regions of interest. Correction factors are also assigned to each selected pattern in the template to account for physical differences in the corresponding regions of interest of the sample part that affect the profilometric measurement.
    Type: Grant
    Filed: October 1, 2002
    Date of Patent: January 25, 2005
    Assignee: Veeco Instruments, Inc.
    Inventors: Colin T. Farrell, Anthony L. Martinez, Joanna Schmit, Michael B. Krell
  • Alignment and correction template for optical profilometric measurement
    Publication number: 20030035115
    Abstract: An electronic template delineating distinct selected patterns corresponding to predetermined regions of interest in a sample part is used to limit analysis to those regions. The surface of the sample is first measured using conventional techniques. The data so acquired are used to identify boundaries between distinct regions, which are then compared to a predetermined pattern boundary in the template to find a best-fit match. The position of the pattern is then shifted to overlay the match, thereby automatically aligning the template's selected patterns with the regions of interest in the sample surface. As a result, profilometric analysis can be limited to the regions of interest. Correction factors are also assigned to each selected pattern in the template to account for physical differences in the corresponding regions of interest of the sample part that affect the profilometric measurement.
    Type: Application
    Filed: October 1, 2002
    Publication date: February 20, 2003
    Inventors: Colin T. Farrell, Anthony L. Martinez, Joanna Schmit, Michael B. Krell