Patents by Inventor Michael Behnke

Michael Behnke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260162927
    Abstract: A multiple particle beam microscope and an associated method set a desired focal plane with an optical resolution and set a telecentric irradiation with the plurality of the primary beams. A method determines an optimal setting plane, into which an object surface is brought. Further, a system provides an improved resolution and telecentric irradiation for a large number of primary beams. Targeted selection and targeted individual influencing of individual primary beams and/or a mechanism means for influencing the plurality of primary beams in collective fashion can be implemented.
    Type: Application
    Filed: April 15, 2025
    Publication date: June 11, 2026
    Inventors: Nicole Rauwolf, Nico Kaemmer, Michael Behnke, Ingo Mueller, Dirk Zeidler, Arne Thoma, Christof Riedesel, Gunther Scheunert
  • Patent number: 12609282
    Abstract: A multi-beam charged particle system and a method of setting a working distance WD of the multi beam charged particle system are provided. With the method, the working distance is adjusted while the imaging performance of a wafer inspection task is maintained by computing parameter values of components from predetermined calibration parameter values. The method can allow a relatively fast wafer inspection task even with a wafer stage with a fixed z-position parallel to an optical axis of the multi-beam charged particle system.
    Type: Grant
    Filed: November 6, 2023
    Date of Patent: April 21, 2026
    Assignee: Carl Zeiss MultiSEM GmbH
    Inventors: Michael Behnke, Ulrich Bihr, Christof Riedesel, Arne Thoma, Dirk Zeidler
  • Publication number: 20260024721
    Abstract: A multi-beam charged particle inspection system and a method of operating a multi-beam charged particle inspection system for wafer inspection can provide high throughput with high resolution and high reliability. The method and the multi-beam charged particle beam inspection system can be configured to extract from a plurality of sensor data a set of control signals to control the multi-beam charged particle beam inspection system and thereby maintain the imaging specifications including a movement of a wafer stage during the wafer inspection task.
    Type: Application
    Filed: September 16, 2025
    Publication date: January 22, 2026
    Inventors: Dirk Zeidler, Ulrich Bihr, Andreas Adolf, Nicolas Kaufmann, Ingo Mueller, Michael Behnke
  • Patent number: 12280722
    Abstract: The disclosure provides an interior trim part for a motor vehicle having a sliding or panoramic roof comprising a headliner and a stiffening frame attached to the headliner and enclosing and stabilizing an opening in the headliner enclosing the sliding or panoramic window, the stiffening frame being made of a fiber-reinforced composite material comprising a fiber mat and a textile lattice material, the textile lattice material being applied over a surface of the fiber mat and impregnated together therewith.
    Type: Grant
    Filed: March 26, 2021
    Date of Patent: April 22, 2025
    Assignee: International Automotive Components Group North America, Inc.
    Inventors: Patrick Buhr, Michael Behnke
  • Patent number: 12283457
    Abstract: A multiple particle beam microscope and an associated method set a desired focal plane with an optical resolution and set a telecentric irradiation with the plurality of the primary beams. A method determines an optimal setting plane, into which an object surface is brought. Further, a system provides an improved resolution and telecentric irradiation for a large number of primary beams. Targeted selection and targeted individual influencing of individual primary beams and/or a mechanism means for influencing the plurality of primary beams in collective fashion can be implemented.
    Type: Grant
    Filed: January 24, 2022
    Date of Patent: April 22, 2025
    Assignee: Carl Zeiss MultiSEM GmbH
    Inventors: Nicole Rauwolf, Nico Kaemmer, Michael Behnke, Ingo Mueller, Dirk Zeidler, Arne Thoma, Christof Riedesel, Gunther Scheunert
  • Publication number: 20250104961
    Abstract: A method for operating a multi-beam particle microscope in an inspection mode of operation and an associated multi-beam particle microscope are disclosed, wherein a detection unit comprises an image generation detection region with fixedly assigned detection channels and an adjustment detection region with additional detection channels. The fixedly assigned detection channels and the additional detection channels are in the same detection plane. Based on signals obtained via the additional detection channels, it is possible to correct an incidence position of the secondary beams on the detection unit in real time, to be precise independently of the specific structure of the detection unit.
    Type: Application
    Filed: December 10, 2024
    Publication date: March 27, 2025
    Inventors: Michael Behnke, Stefan Schubert
  • Publication number: 20240128048
    Abstract: A method for operating a multi-beam particle microscope which operates using a plurality of individual charged particle beams, wherein the method includes the following steps: measuring the beam current; determining a deviation of the measured beam current from a nominal beam current; decomposing the determined deviation into a drift component and into a high-frequency component; and controlling the high-frequency component of the beam current via a first closed-loop beam current control mechanism and/or compensating an effect of the high-frequency component on a recording quality of the multi-beam particle microscope using different mechanism than a closed-loop beam current control mechanism. An electrostatic control lens arranged in the beam generating system between extractor and anode can be used as first closed-loop beam current control mechanism. Adapting an extractor voltage of the beam generating system can be avoided.
    Type: Application
    Filed: December 21, 2023
    Publication date: April 18, 2024
    Inventors: Ingo Mueller, Nicolas Kaufmann, Michael Behnke, Hans Fritz
  • Publication number: 20240079207
    Abstract: A multi-beam charged particle system and a method of setting a working distance WD of the multi beam charged particle system are provided. With the method, the working distance is adjusted while the imaging performance of a wafer inspection task is maintained by computing parameter values of components from predetermined calibration parameter values. The method can allow a relatively fast wafer inspection task even with a wafer stage with a fixed z-position parallel to an optical axis of the multi-beam charged particle system.
    Type: Application
    Filed: November 6, 2023
    Publication date: March 7, 2024
    Inventors: Michael Behnke, Ulrich Bihr, Christof Riedesel, Arne Thoma, Dirk Zeidler
  • Patent number: 11645740
    Abstract: A method for detector equalization during the imaging of objects with a multi-beam particle microscope includes performing an equalization on the basis of individual images in or on the basis of overlap regions. For detector equalization, contrast values and/or brightness values are used and iterative methods can be employed.
    Type: Grant
    Filed: March 4, 2021
    Date of Patent: May 9, 2023
    Assignee: Carl Zeiss MultiSEM GmbH
    Inventors: Dirk Zeidler, Michael Behnke, Stefan Schubert, Christof Riedesel
  • Publication number: 20230043036
    Abstract: A multi-beam charged particle inspection system and a method of operating a multi-beam charged particle inspection system for wafer inspection can provide high throughput with high resolution and high reliability. The method and the multi-beam charged particle beam inspection system can be configured to extract from a plurality of sensor data a set of control signals to control the multi-beam charged particle beam inspection system and thereby maintain the imaging specifications including a movement of a wafer stage during the wafer inspection task.
    Type: Application
    Filed: October 18, 2022
    Publication date: February 9, 2023
    Inventors: Dirk Zeidler, Ulrich Bihr, Andreas Adolf, Nicolas Kaufmann, Ingo Mueller, Michael Behnke
  • Publication number: 20230039993
    Abstract: The disclosure provides an interior trim part for a motor vehicle having a sliding or panoramic roof comprising a headliner and a stiffening frame attached to the headliner and enclosing and stabilizing an opening in the headliner enclosing the sliding or panoramic window, the stiffening frame being made of a fiber-reinforced composite material comprising a fiber mat and a textile lattice material, the textile lattice material being applied over a surface of the fiber mat and impregnated together therewith.
    Type: Application
    Filed: March 26, 2021
    Publication date: February 9, 2023
    Inventors: Patrick BUHR, Michael BEHNKE
  • Publication number: 20220246388
    Abstract: A multiple particle beam microscope and an associated method set a desired focal plane with an optical resolution and set a telecentric irradiation with the plurality of the primary beams. A method determines an optimal setting plane, into which an object surface is brought. Further, a system provides an improved resolution and telecentric irradiation for a large number of primary beams. Targeted selection and targeted individual influencing of individual primary beams and/or a mechanism means for influencing the plurality of primary beams in collective fashion can be implemented.
    Type: Application
    Filed: January 24, 2022
    Publication date: August 4, 2022
    Inventors: Nicole Rauwolf, Nico Kaemmer, Michael Behnke, Ingo Mueller, Dirk Zeidler, Arne Thoma, Christof Riedesel, Gunther Scheunert
  • Publication number: 20210192700
    Abstract: A method for detector equalization during the imaging of objects with a multi-beam particle microscope includes performing an equalization on the basis of individual images in or on the basis of overlap regions. For detector equalization, contrast values and/or brightness values are used and iterative methods can be employed.
    Type: Application
    Filed: March 4, 2021
    Publication date: June 24, 2021
    Inventors: Dirk Zeidler, Michael Behnke, Stefan Schubert, Christof Riedesel
  • Patent number: 10401803
    Abstract: A manufacturing action is performed on a first part or first component involved in a manufacturing process. The manufacturing action is directed by computer software that is stored in a memory and executed by a processor. The first part or first component is examined to determine results of the manufacturing action. Based upon the results, a structure of the computer software is selectively changed to optimize the results. Subsequently the manufacturing action is performed on a second part or second component. The manufacturing action is directed by the computer software having the changed structure.
    Type: Grant
    Filed: September 26, 2016
    Date of Patent: September 3, 2019
    Assignee: General Electric Company
    Inventors: Paul Weatherbee, Michael Behnke, Nilesh Dixit
  • Patent number: 10059259
    Abstract: The invention relates to an interior trim component for a motor vehicle, which comprises: a carrier component, which determines the contour of the interior trim component, a cover layer, which is applied to a front side of the carrier component, and a light-emitting layer, which is applied to a back side of the carrier component, wherein the carrier component and the cover layer are transparent.
    Type: Grant
    Filed: January 30, 2014
    Date of Patent: August 28, 2018
    Assignee: International Automotive Components Group GmbH
    Inventors: Carter Scott Cannon, Michael Behnke
  • Publication number: 20180164764
    Abstract: Asset performance management (APM) information associated with an industrial machine that is producing a product is obtained. At least one of machine operation information and output characteristic information is received from the industrial machine. The APM information, the machine operation information, and the output characteristic information are stored in a database at the cloud (or some other remote computing device or network). The APM information, the machine operation information, and the output characteristic information are analyzed at the cloud to identify in real-time changes to the operation of the machine needed to improve the performance of the industrial machine. In some aspects, the changes are presented to a user and the changes are acted upon.
    Type: Application
    Filed: December 12, 2016
    Publication date: June 14, 2018
    Inventors: Paul Weatherbee, Michael Behnke, Nilesh Dixit
  • Publication number: 20180088540
    Abstract: A manufacturing action is performed on a first part or first component involved in a manufacturing process. The manufacturing action is directed by computer software that is stored in a memory and executed by a processor. The first part or first component is examined to determine results of the manufacturing action. Based upon the results, a structure of the computer software is selectively changed to optimize the results. Subsequently the manufacturing action is performed on a second part or second component. The manufacturing action is directed by the computer software having the changed structure.
    Type: Application
    Filed: September 26, 2016
    Publication date: March 29, 2018
    Inventors: Paul Weatherbee, Michael Behnke, Nilesh Dixit
  • Patent number: 9114761
    Abstract: The invention relates to an interior lining for a motor vehicle, with a sliding or panoramic roof, which comprises a roof liner and a stiffening frame which is attached to the roof liner, and an opening in the roof liner, which delimits, frames and stabilizes the sliding or panoramic window. The roof liner is constructed in several layers, which comprise at least one core layer and one cover layer. The stiffening frame is produced from a fiber-reinforced composite material, which contains organic synthetic polymer fibers, carbon fibers or natural fibers, or mixtures of these fibers, and a binder made from a duroplastic or thermoplastic material. The surface weight and the bending stiffness of the stiffening frame are greater than those of the roof liner structure, preferably by at least 50%.
    Type: Grant
    Filed: May 23, 2013
    Date of Patent: August 25, 2015
    Assignee: International Automotive Components Group GmbH
    Inventors: Fritz Schweindl, Michael Behnke
  • Publication number: 20140211498
    Abstract: The invention relates to an interior trim component for a motor vehicle, which comprises: a carrier component, which determines the contour of the interior trim component, a cover layer, which is applied to a front side of the carrier component, and a light-emitting layer, which is applied to a back side of the carrier component, wherein the carrier component and the cover layer are transparent.
    Type: Application
    Filed: January 30, 2014
    Publication date: July 31, 2014
    Inventors: Carter Scott CANNON, Michael BEHNKE
  • Publication number: 20130334843
    Abstract: The invention relates to an interior lining for a motor vehicle, with a sliding or panoramic roof, which comprises a roof liner and a stiffening frame which is attached to the roof liner, and an opening in the roof liner, which delimits, frames and stabilizes the sliding or panoramic window. The roof liner is constructed in several layers, which comprise at least one core layer and one cover layer. The stiffening frame is produced from a fiber-reinforced composite material, which contains organic synthetic polymer fibers, carbon fibers or natural fibers, or mixtures of these fibers, and a binder made from a duroplastic or thermoplastic material. The surface weight and the bending stiffness of the stiffening frame are greater than those of the roof liner structure, preferably by at least 50%.
    Type: Application
    Filed: May 23, 2013
    Publication date: December 19, 2013
    Inventors: Fritz Schweindl, Michael BEHNKE