Patents by Inventor Michael Bolles

Michael Bolles has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10401221
    Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.
    Type: Grant
    Filed: August 17, 2017
    Date of Patent: September 3, 2019
    Assignee: AGILENT TECHNOLOGIES, INC.
    Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
  • Publication number: 20170343414
    Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.
    Type: Application
    Filed: August 17, 2017
    Publication date: November 30, 2017
    Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
  • Patent number: 9752933
    Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.
    Type: Grant
    Filed: February 4, 2015
    Date of Patent: September 5, 2017
    Assignee: Agilent Technologies, Inc.
    Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
  • Patent number: 9279722
    Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.
    Type: Grant
    Filed: April 30, 2012
    Date of Patent: March 8, 2016
    Assignee: Agilent Technologies, Inc.
    Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
  • Patent number: 9151672
    Abstract: An optical absorption spectrometry system includes first and second light sources, a dichroic beam combiner and a wavelength selective module. The first light source emits first light having first wavelengths within a first wavelength range, and the second light source emits second light having second wavelengths within a second wavelength range different from the first wavelength range. The dichroic beam combiner includes a predetermined first reflectance/transmission transition region, the dichroic beam combiner being configured to transmit a first portion of the first light and to reflect a second portion of the second light to provide combined light. The wavelength selective module is configured to disperse the combined light received at an entrance aperture, to select a sample wavelength range of the dispersed light as sample light, and to output the sample light having the selected sample wavelength range from an exit aperture for illuminating a sample.
    Type: Grant
    Filed: November 21, 2013
    Date of Patent: October 6, 2015
    Assignee: Agilent Technologies, Inc.
    Inventors: Michael Bolles, Michael Ron Hammer
  • Publication number: 20150138533
    Abstract: An optical absorption spectrometry system includes first and second light sources, a dichroic beam combiner and a wavelength selective module. The first light source emits first light having first wavelengths within a first wavelength range, and the second light source emits second light having second wavelengths within a second wavelength range different from the first wavelength range. The dichroic beam combiner includes a predetermined first reflectance/transmission transition region, the dichroic beam combiner being configured to transmit a first portion of the first light and to reflect a second portion of the second light to provide combined light. The wavelength selective module is configured to disperse the combined light received at an entrance aperture, to select a sample wavelength range of the dispersed light as sample light, and to output the sample light having the selected sample wavelength range from an exit aperture for illuminating a sample.
    Type: Application
    Filed: November 21, 2013
    Publication date: May 21, 2015
    Applicant: Agilent Technologies, Inc.
    Inventors: Michael Bolles, Michael Ron Hammer
  • Publication number: 20150138548
    Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.
    Type: Application
    Filed: February 4, 2015
    Publication date: May 21, 2015
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
  • Publication number: 20130286390
    Abstract: An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.
    Type: Application
    Filed: April 30, 2012
    Publication date: October 31, 2013
    Applicant: AGILENT TECHNOLOGIES, INC.
    Inventors: Michael Bolles, Yin Sheng Sun, Lindsay Buck, Glyn Russell
  • Patent number: 5987077
    Abstract: A method and an arrangement for synchronizing a receiver for digital signals are described. The synchronizing information is derived from the center of distribution of the squared channel impulse response, which center of distribution is calculated directly from the sampling values of the channel frequency response. Thus a separate calculation of the channel impulse response via an inverse Fourier transform from the channel frequency response is unnecessary. The channel frequency response can be determined in a simple way by correlation of a received signal with a reference signal stored in memory in the receiver.
    Type: Grant
    Filed: January 13, 1998
    Date of Patent: November 16, 1999
    Assignee: Robert Bosch GmbH
    Inventor: Michael Bolle
  • Patent number: 5940406
    Abstract: A method is proposed that is used for frequency correction in multicarrier processes. A received signal is shifted by means of a predetermined frequency into the base band and then subjected to a modified Fourier transform. From the Fourier transformed signal, a measurement variable is ascertained that is proportional to the frequency deviation between the predetermined frequency and the frequency of the carrier signal. This measurement variable is taken into account in the Fourier transform and thus the frequency deviation is compensated for.
    Type: Grant
    Filed: June 20, 1996
    Date of Patent: August 17, 1999
    Assignee: Robert Bosch GmbH
    Inventor: Michael Bolle
  • Patent number: 5746855
    Abstract: A method and apparatus for the archival storage of tissue sections which have been cut from a sample block by a microtome blade includes a tape bearing serially-spaced areas of adhesive material, generally the same size as the surface of the tissue sample block. The tape may be delivered from a feed reel by a feed roller mechanism. Between each cut, the tape is advanced to align the adhesive area on the tape with the tissue sample. An application roller presses the adhesive against the sample, the section is cut, and a takeup roller lifts the tape and section away from the blade. The tape may then be wound onto a takeup reel for archival storage. The entire process may be automated, including the operation of a transport mechanism to move the apparatus away from the tissue sample during microscopic imaging.
    Type: Grant
    Filed: October 24, 1996
    Date of Patent: May 5, 1998
    Assignee: Advanced Pathology Systems, Inc.
    Inventor: Michael Bolles