Patents by Inventor Michael C. Howells

Michael C. Howells has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data
    Patent number: 6961871
    Abstract: A software and hardware system and an associated methodology provides ATE-independent go/no-go testing as well as advanced failure diagnosis of integrated circuits for silicon debug, process characterization, production (volume) testing, and system diagnosis comprises an embedded test architecture designed within an integrated circuit; means for seamlessly transferring information between the integrated circuit and its external environment; and an external environment that effectuates the seamless transfer for the user to perform relevant test and diagnosis.
    Type: Grant
    Filed: September 18, 2001
    Date of Patent: November 1, 2005
    Assignee: LogicVision, Inc.
    Inventors: Givargis A. Danialy, Stephen V. Pateras, Michael C. Howells, Martin J. Bell, Charles Mc Donald, Stephen K. Sunter
  • Method and system for licensing intellectual property circuits
    Publication number: 20030149669
    Abstract: A method of controlling access to Intellectual Property (IP) -blocks embedded in a circuit comprises decoding a circuit usage rights file associated with the circuit and delineating usage rights associated with the IP blocks, determining from the circuit usage rights file whether access to an IP block to be accessed is permitted; and accessing the IP block only if access is permitted.
    Type: Application
    Filed: February 4, 2003
    Publication date: August 7, 2003
    Inventors: Michael C. Howells, Jean-Francois Cote
  • Method,system and program product for testing and/or diagnosing circuits using embedded test controller access data
    Publication number: 20020073374
    Abstract: A software and hardware system and an associated methodology provides ATE-independent go/no-go testing as well as advanced failure diagnosis of integrated circuits for silicon debug, process characterization, production (volume) testing, and system diagnosis comprises an embedded test architecture designed within an integrated circuit; means for seamlessly transferring information between the integrated circuit and its external environment; and an external environment that effectuates the seamless transfer for the user to perform relevant test and diagnosis.
    Type: Application
    Filed: September 18, 2001
    Publication date: June 13, 2002
    Inventors: Givargis A. Danialy, Stephen V. Pateras, Michael C. Howells, Martin J. Bell, Charles McDonald, Stephen K. Sunter