Patents by Inventor Michael C. Kutney

Michael C. Kutney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110217585
    Abstract: Embodiments of the present invention relate generally to lithium-ion batteries, and more specifically, to batteries having integrated separators and methods of fabricating such batteries. In one embodiment, a lithium-ion battery having an electrode structure is provided. The lithium-ion battery comprises an anode stack, a cathode stack, and an integrated separator formed between the anode stack and the cathode stack. The anode stack comprises an anodic current collector and an anode structure formed over a first surface of the anodic current collector. The cathode stack comprises a cathodic current collector and a cathode structure formed over a first surface of the cathodic current collector. The integrated separator comprises a first ceramic layer, a second ceramic layer, and a polymer material layer deposited between the first ceramic layer and the second ceramic layer.
    Type: Application
    Filed: September 30, 2010
    Publication date: September 8, 2011
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Connie P. Wang, Robert Z. Bachrach, Sergey D. Lopatin, Donald J.K. Olgado, Michael C. Kutney, Zheng Wang
  • Patent number: 7987814
    Abstract: A plasma processing chamber has a lower liner with an integrated flow equalizer. In an etching process, the processing gases may be unevenly drawn from the processing chamber which may cause an uneven etching of the substrate. The integrated flow equalizer is configured to equalize the flow of the processing gases evacuated from the chamber via the lower liner.
    Type: Grant
    Filed: April 7, 2008
    Date of Patent: August 2, 2011
    Assignee: Applied Materials, Inc.
    Inventors: James D. Carducci, Andrew Nguyen, Ajit Balakrishna, Michael C. Kutney
  • Publication number: 20100065213
    Abstract: A plasma processing chamber having a lowered flow equalizer and a lower chamber liner. In an etching process, the processing gases may be unevenly drawn from the processing chamber which may cause an uneven etching of the substrate. By equalizing the flow of the processing gases evacuated from the chamber, a more uniform etching may occur. By electrically coupling the flow equalizer to the chamber liners, the RF return path from the flow equalizer may run along the chamber liners and hence, reduce the amount of plasma drawn below the substrate during processing.
    Type: Application
    Filed: November 23, 2009
    Publication date: March 18, 2010
    Inventors: James D. Carducci, Kin Pong Lo, Kallol Bera, Michael C. Kutney, Matthew L. Miller
  • Publication number: 20090250169
    Abstract: A plasma processing chamber has a lower liner with an integrated flow equalizer. In an etching process, the processing gases may be unevenly drawn from the processing chamber which may cause an uneven etching of the substrate. The integrated flow equalizer is configured to equalize the flow of the processing gases evacuated from the chamber via the lower liner.
    Type: Application
    Filed: April 7, 2008
    Publication date: October 8, 2009
    Inventors: James D. Carducci, Andrew Nguyen, Ajit Balakrishna, Michael C. Kutney