Patents by Inventor MICHAEL CHRASTECKY

MICHAEL CHRASTECKY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe card for testing semiconductor wafers
    Patent number: 10281491
    Abstract: A probe card is disclosed. The probe card includes a first disc, a second disc, an alignment plate and multiple micro probes. One of the micro probes includes a linear segment and a curved segment connected to each other at an angle stop. The first disc includes a recessed area having multiple holes formed therein, wherein one of the holes is configured to receive the linear segment of the micro probe. The second disc includes a recessed area having multiple holes formed therein, wherein one of the holes is configured to receive the curved segment of the micro probe. Placed within the recessed area of the second disc, the alignment plate includes multiple holes formed therein, wherein one of the holes is configured to receive the curved segment of the micro probe.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: May 7, 2019
    Assignee: TRANSLARITY, INC.
    Inventors: Francis T. McQuade, Raul Ramon Molina, IV, Michael Chrastecky
  • PROBE CARD FOR TESTING SEMICONDUCTOR WAFERS
    Publication number: 20180149675
    Abstract: A probe card is disclosed. The probe card includes a first disc, a second disc, an alignment plate and multiple micro probes. One of the micro probes includes a linear segment and a curved segment connected to each other at an angle stop. The first disc includes a recessed area having multiple holes formed therein, wherein one of the holes is configured to receive the linear segment of the micro probe. The second disc includes s a recessed area having multiple holes formed therein, wherein one of the holes is configured to receive the curved segment of the micro probe. Placed within the recessed area of the second disc, the alignment plate includes multiple holes formed therein, wherein one of the holes is configured to receive the curved segment of the micro probe.
    Type: Application
    Filed: November 30, 2016
    Publication date: May 31, 2018
    Applicant: BUCKLINGBEAM
    Inventors: FRANCIS T. MCQUADE, RAUL RAMON MOLINA, IV, MICHAEL CHRASTECKY