Abstract: Embodiments of the disclosure provide various nanogap sensor designs (e.g., horizontal nanogap sensors, vertical nanogap sensors, arrays of multiple nanogap sensors, various arrangements for making electrical connections to the electrodes of nanogap sensors, etc.), as well as various methods which may be used to fabricate at least some of the proposed sensors. The nanogap sensors proposed herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap.

Abstract: Embodiments of the disclosure provide various nanogap sensor designs (e.g., horizontal nanogap sensors, vertical nanogap sensors, arrays of multiple nanogap sensors, various arrangements for making electrical connections to the electrodes of nanogap sensors, etc.), as well as various methods which may be used to fabricate at least some of the proposed sensors. The nanogap sensors proposed herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap.

Abstract: Embodiments of the present disclosure relate to various methods and example systems for carrying out analog-to-digital conversion of data acquired by arrays of nanogap sensors. The nanogap sensors described herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap. In general, the methods and systems proposed herein rely on digitizing the signal as the signal is being integrated, and then integrating the digitized results. With such methods, the higher sample rate used in the digitizer reduces the charge per quantization and, therefore, the size of sampling capacitors used. Consequently, sampling capacitors may be made factors of magnitude smaller, requiring less valuable space on a chip compared to sampling capacitors used in conventional nanogap sensor arrays.

Abstract: Embodiments of the present disclosure relate to various methods and example systems for carrying out analog-to-digital conversion of data acquired by arrays of nanogap sensors. The nanogap sensors described herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap. In general, the methods and systems proposed herein rely on digitizing the signal as the signal is being integrated, and then integrating the digitized results. With such methods, the higher sample rate used in the digitizer reduces the charge per quantization and, therefore, the size of sampling capacitors used. Consequently, sampling capacitors may be made factors of magnitude smaller, requiring less valuable space on a chip compared to sampling capacitors used in conventional nanogap sensor arrays.

Abstract: Embodiments of the disclosure provide various nanogap sensor designs (e.g., horizontal nanogap sensors, vertical nanogap sensors, arrays of multiple nanogap sensors, various arrangements for making electrical connections to the electrodes of nanogap sensors, etc.), as well as various methods which may be used to fabricate at least some of the proposed sensors. The nanogap sensors proposed herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap.

Abstract: Embodiments of the present disclosure relate to various methods and example systems for carrying out analog-to-digital conversion of data acquired by arrays of nanogap sensors. The nanogap sensors described herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap. In general, the methods and systems proposed herein rely on digitizing the signal as the signal is being integrated, and then integrating the digitized results. With such methods, the higher sample rate used in the digitizer reduces the charge per quantization and, therefore, the size of sampling capacitors used. Consequently, sampling capacitors may be made factors of magnitude smaller, requiring less valuable space on a chip compared to sampling capacitors used in conventional nanogap sensor arrays.

Abstract: When reservoir capacitors are moved on-chip for individual bit decisions, a successive approximation register analog-to-digital converter (SAR ADC) has an addition source of error which can significantly affect the performance of the SAR ADC. Calibration techniques can be applied to measure and correct for such error in an SAR ADC using decide-and-set switching. Specifically, a calibration technique can expose the effective bit weight of each bit under test using a plurality of special input voltages and storing a calibration word for each bit under test to correct for the error. Such a calibration technique can lessen the need to store a calibration word for each possible output word to correct the additional source of error. Furthermore, another calibration technique can expose the effective bit weight of each bit under test without having to generate the plurality of special input voltages.

Abstract: A signal gate is provided where the gate can be low impedance to allow a signal to pass or be high impedance to block it. The signal gate has two output nodes arranged such that during the blocking mode spurious signals passing through the gate by way of parasitic components are presented as common mode signals at the output nodes.

Abstract: A signal gate is provided where the gate can be low impedance to allow a signal to pass or be high impedance to block it. The signal gate has two output nodes arranged such that during the blocking mode spurious signals passing through the gate by way of parasitic components are presented as common mode signals at the output nodes.

Abstract: A method and a digital-to-analog converter (DAC) circuit involve forming an analog signal using charge sharing operations. The DAC circuit includes a plurality of digital components with associated parasitic capacitances. The digital components are activated based on a digital input code, such that charge is shared among the parasitic capacitances to form a first analog signal proportional to the digital input code. The digital components can also be activated based on a complementary code to form a second analog signal. The first analog signal and the second analog signal can be used to form, as a final output of the DAC circuit, an analog signal that is linearly proportional to the digital input code.

Abstract: Apparatus and methods calibrate one or more gain ranges for errors. A system can identify offset error and amplification error that occurs when the system transitions from amplifying an input signal by a first gain factor to amplifying the input signal by a second gain factor. To identify the amplification error, the system can compare the slope of the data signal in a source or reference gain range with the slope of the data signal in the destination gain range. To identify the offset error, the system can compare the amplitude of the data signal in a destination gain range with an expected value in the destination gain range.

Abstract: When reservoir capacitors are moved on-chip for individual bit decisions, a successive approximation register analog-to-digital converter (SAR ADC) has an addition source of error which can significantly affect the performance of the SAR ADC. Calibration techniques can be applied to measure and correct for such error in an SAR ADC using decide-and-set switching. Specifically, a calibration technique can expose the effective bit weight of each bit under test using a plurality of special input voltages and storing a calibration word for each bit under test to correct for the error. Such a calibration technique can lessen the need to store a calibration word for each possible output word to correct the additional source of error. Furthermore, another calibration technique can expose the effective bit weight of each bit under test without having to generate the plurality of special input voltages.

Abstract: An accurate, cost-efficient temperature sensor may be integrated into an integrated circuit (IC) using common materials as the IC's interconnect metallization. The temperature sensor may include an impedance element having a length of metal made of the interconnect metal, a current source connected between a first set of contacts at opposite ends of the impedance element, and an analog-to-digital converter connected between a second set of contacts at opposite ends of the impedance element. The temperature sensor may exploits the proportional relationship between the metal's resistance and temperature to measure ambient temperature. Alternatively, such a temperature sensor may be used on disposable chemical sensors where the impedance element is made of a common metal as conductors that connect a sensor reactant to sensor contacts. In either case, because the impedance element is formed of a common metal as other interconnect, it is expected to incur low manufacturing costs.

Abstract: Apparatus and methods calibrate one or more gain ranges for errors. A system can identify offset error and amplification error that occurs when the system transitions from amplifying an input signal by a first gain factor to amplifying the input signal by a second gain factor. To identify the amplification error, the system can compare the slope of the data signal in a source or reference gain range with the slope of the data signal in the destination gain range. To identify the offset error, the system can compare the amplitude of the data signal in a destination gain range with an expected value in the destination gain range.

Abstract: The present disclosure provides for split-path data acquisition chains and associated signal processing methods. An exemplary integrated circuit for providing a split-path data acquisition signal chain includes an input terminal for receiving an analog signal; an output terminal for outputting a digital signal; and at least two frequency circuit paths coupled with the input terminal and the output terminal, wherein the at least two frequency circuit paths are configured to process different frequency components of the analog signal and recombine the processed, different frequency components, thereby providing the digital signal.

Abstract: The present disclosure provides for split-path data acquisition chains and associated signal processing methods. An exemplary integrated circuit for providing a split-path data acquisition signal chain includes an input terminal for receiving an analog signal; an output terminal for outputting a digital signal; and at least two frequency circuit paths coupled with the input terminal and the output terminal, wherein the at least two frequency circuit paths are configured to process different frequency components of the analog signal and recombine the processed, different frequency components, thereby providing the digital signal.

Abstract: Disclosed embodiments are directed to an electrical overstress protection circuit. The electrical overstress protection circuit may include an intermediate node receiving a reference voltage, a first pair of clamp devices, having opposite polarity, clamping an input signal line to the intermediate node, and a second pair of clamp devices, each clamping the intermediate node to one of two reference potentials. The electrical overstress protection circuit may also include a filter connected to the intermediate node to reduce noise at the intermediate node.

Abstract: A detector circuit can include an integrator having an amplifier, a first feedback capacitor connected between an input and output of the amplifier, one or more additional feedback capacitors connected by at least one switch between the input and output of the amplifier, and a shunt capacitor connected to the output of the amplifier. The shunt capacitor can be selected to have a capacitance value greater than that of a minimum but less than that of a maximum feedback capacitance. The detector circuit can further include a sampling circuit having a sampling capacitor connected to the output of the integrator amplifier through at least one switch, wherein the sampling capacitor is separate from the shunt capacitor. A computed tomography imaging apparatus can include the detector circuit.

Abstract: A circuit system for performing correlated double sampling may include a signal sampling stage having an amplifier with a feedback capacitor and a pair of storage capacitors coupled to an output of the amplifier, and a differential analog to digital converter (ADC) having a pair of inputs coupled respectively to storage capacitors of the signal sampling stage. The signal sampling stage may receive reset and signal values from a sensor device and may store processed versions of those signals on respective storage capacitors. The differential ADC may generate a digital value representing a signal captured by the sensor device from a differential digitization operation performed on the processed versions of the reset and signal values. In this manner, the system may correct for any signal errors introduced by components of the sampling stage.

Abstract: A detector circuit can include an integrator having an amplifier, a first feedback capacitor connected between an input and output of the amplifier, one or more additional feedback capacitors connected by at least one switch between the input and output of the amplifier, and a shunt capacitor connected to the output of the amplifier. The shunt capacitor can be selected to have a capacitance value greater than that of a minimum but less than that of a maximum feedback capacitance. The detector circuit can further include a sampling circuit having a sampling capacitor connected to the output of the integrator amplifier through at least one switch, wherein the sampling capacitor is separate from the shunt capacitor. A computed tomography imaging apparatus can include the detector circuit.