Abstract: A method, system and memory controller are provided for implementing refresh power optimization during long idle mode in a memory subsystem utilizing Dynamic Random Access Memory (DRAM). The DRAM includes DRAM cells requiring periodic refresh. A DRAM activity monitoring mechanism monitors an instruction queue and asserts a predefined mode register bit when the instruction queue is empty. Responsive to the asserted predefined mode register bit, a refresh rate is increased and a low power mode is established by reducing DRAM core power level for optimizing refresh power during the long idle mode to provide enhanced system performance.

Abstract: A method, system and memory controller are provided for implementing refresh power optimization during long idle mode in a memory subsystem utilizing Dynamic Random Access Memory (DRAM). The DRAM includes DRAM cells requiring periodic refresh. A DRAM activity monitoring mechanism monitors an instruction queue and asserts a predefined mode register bit when the instruction queue is empty. Responsive to the asserted predefined mode register bit, a refresh rate is increased and a low power mode is established by reducing DRAM core power level for optimizing refresh power during the long idle mode to provide enhanced system performance.

Abstract: The method may include accessing, with a first stress test, a plurality of memory modules, the plurality of memory modules coupled in a computer system, the plurality of memory modules including a first module having a first memory characteristic and a second module having a second memory characteristic. The method may include determining for the first module, a first traffic-to-temperature parameter, and determining that the first module was sufficiently stressed in response to determining that the first traffic-to-temperature parameter is within a first traffic-to-temperature range. The method may also include determining, for the second module, a second traffic-to-temperature parameter, and determining that the second module was sufficiently stressed in response to determining that the second traffic-to-temperature parameter is within a second traffic-to-temperature range.

Abstract: The method may include accessing, with a first stress test, a plurality of memory modules, the plurality of memory modules coupled in a computer system, the plurality of memory modules including a first module having a first memory characteristic and a second module having a second memory characteristic. The method may include determining for the first module, a first traffic-to-temperature parameter, and determining that the first module was sufficiently stressed in response to determining that the first traffic-to-temperature parameter is within a first traffic-to-temperature range. The method may also include determining, for the second module, a second traffic-to-temperature parameter, and determining that the second module was sufficiently stressed in response to determining that the second traffic-to-temperature parameter is within a second traffic-to-temperature range.

Abstract: According to embodiments of the disclosure, methods, systems, and computer program products for memory module testing are disclosed. The method may include accessing, with a first stress test, a plurality of memory modules, the plurality of memory modules coupled in a computer system, the plurality of memory modules including a first module having a first memory characteristic and a second module having a second memory characteristic. The method may include determining for the first module, a first traffic-to-temperature parameter, and determining that the first module was sufficiently stressed in response to determining that the first traffic-to-temperature parameter is within a first traffic-to-temperature range. The method may also include determining, for the second module, a second traffic-to-temperature parameter, and determining that the second module was sufficiently stressed in response to determining that the second traffic-to-temperature parameter is within a second traffic-to-temperature range.

Abstract: According to embodiments of the disclosure, methods, systems, and computer program products for memory module testing are disclosed. The method may include accessing, with a first stress test, a plurality of memory modules, the plurality of memory modules coupled in a computer system, the plurality of memory modules including a first module having a first memory characteristic and a second module having a second memory characteristic. The method may include determining for the first module, a first traffic-to-temperature parameter, and determining that the first module was sufficiently stressed in response to determining that the first traffic-to-temperature parameter is within a first traffic-to-temperature range. The method may also include determining, for the second module, a second traffic-to-temperature parameter, and determining that the second module was sufficiently stressed in response to determining that the second traffic-to-temperature parameter is within a second traffic-to-temperature range.