Patents by Inventor Michael David FOEGELLE

Michael David FOEGELLE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10009122
    Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: June 26, 2018
    Assignee: ETS-Lindgren Inc.
    Inventor: Michael David Foegelle
  • Patent number: 9979496
    Abstract: Some embodiments include a system for simulating electromagnetic environments that includes a channel emulator having a plurality of outputs, each output associated with a different operational path. Each operational path has a power amplifier, an antenna and a first coupling mechanism. The power amplifier is coupled to an output of the channel emulator. The antenna is in communication with a test region of the apparatus. The first coupling mechanism simultaneously couples power to the antenna and to a first measurement path when the operational path is coupled to the test region, so that a calibration state of the operational path can be determined and adjusted without interruption of a signal coupled to the antenna in the operational path.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: May 22, 2018
    Assignee: ETS- Lindgren Inc.
    Inventor: Michael David Foegelle
  • Patent number: 9912418
    Abstract: In some embodiments, an electromagnetic measurement system to perform radio frequency, RF, downlink testing of a device under test, DUT, in a chamber is provided. Exterior to the chamber is an emulator core configured to introduce an impairment in each of at least one transmit signal to produce at least one impaired signal for each of at least one emulated channel. Within the chamber, for each of the at least one emulated channel, an up-converter is configured to up-convert an impaired signal of the emulated channel to produce a radio frequency, RF, signal.
    Type: Grant
    Filed: July 28, 2016
    Date of Patent: March 6, 2018
    Assignee: ETS-Lindgren Inc.
    Inventor: Michael David Foegelle
  • Publication number: 20180034562
    Abstract: In some embodiments, an electromagnetic measurement system to test a device under test, DUT, in a chamber is provided. Within the chamber, for each of at least one emulated channel, a first emulator core is configured to introduce an impairment in each of at least one transmit signal to produce an impaired signal, and a transmitter is configured to convert the impaired signal to a radio frequency, RF, signal to be transmitted by an antenna.
    Type: Application
    Filed: July 28, 2016
    Publication date: February 1, 2018
    Inventor: Michael David FOEGELLE
  • Publication number: 20180034560
    Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, an electromagnetic measurement system to test a device under test, DUT is provided. The system includes, at a central location, an emulator core configured to introduce an impairment in each of at least one transmit signal to produce a digital impaired signal; and at a remote location, a transmitter configured to convert the digital impaired signal to an analog RF signal.
    Type: Application
    Filed: July 28, 2016
    Publication date: February 1, 2018
    Inventor: Michael David FOEGELLE
  • Publication number: 20180034563
    Abstract: In some embodiments, an electromagnetic measurement system to perform radio frequency, RF, downlink testing of a device under test, DUT, in a chamber is provided. Exterior to the chamber is an emulator core configured to introduce an impairment in each of at least one transmit signal to produce at least one impaired signal for each of at least one emulated channel. Within the chamber, for each of the at least one emulated channel, an up-converter is configured to up-convert an impaired signal of the emulated channel to produce a radio frequency, RF, signal.
    Type: Application
    Filed: July 28, 2016
    Publication date: February 1, 2018
    Inventor: Michael David FOEGELLE
  • Publication number: 20180034561
    Abstract: A method and system for measuring a device under test are disclosed. Some embodiments include a distributed channel emulation system implementing a downlink channel, including at a central location, an emulator core configured to introduce an impairment in each of at least one transmit signal to produce at least one impaired signal for each of at least one emulated channel. The system includes, at a remote location, for each of at the least one emulated channel, an up-converter configured to up-convert an impaired signal of the emulated channel to produce a radio frequency, RF, signal.
    Type: Application
    Filed: July 28, 2016
    Publication date: February 1, 2018
    Inventor: Michael David FOEGELLE
  • Publication number: 20180034559
    Abstract: A method and system for measuring a device under test are disclosed. In some embodiments, a method of implementing a measurement system is provided. The method includes providing a plurality of nodes, each node including a combination of a communication tester configured to generate a communication signal and a channel emulator configured to emulate a channel, and providing a user interface configured to enable a user to control at least one of the plurality of nodes.
    Type: Application
    Filed: July 28, 2016
    Publication date: February 1, 2018
    Inventor: Michael David FOEGELLE
  • Publication number: 20170322164
    Abstract: A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.
    Type: Application
    Filed: July 21, 2017
    Publication date: November 9, 2017
    Inventors: Bryan Howard SAYLER, Michael David FOEGELLE, Garth Anthony D'ABREU
  • Patent number: 9746423
    Abstract: A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.
    Type: Grant
    Filed: May 15, 2014
    Date of Patent: August 29, 2017
    Assignee: ETS-LINDGREN INC.
    Inventors: Bryan Howard Sayler, Michael David Foegelle, Garth Anthony D'Abreu
  • Publication number: 20160344490
    Abstract: Some embodiments include a system for simulating electromagnetic environments that includes a channel emulator having a plurality of outputs, each output associated with a different operational path. Each operational path has a power amplifier, an antenna and a first coupling mechanism. The power amplifier is coupled to an output of the channel emulator. The antenna is in communication with a test region of the apparatus. The first coupling mechanism simultaneously couples power to the antenna and to a first measurement path when the operational path is coupled to the test region, so that a calibration state of the operational path can be determined and adjusted without interruption of a signal coupled to the antenna in the operational path.
    Type: Application
    Filed: December 8, 2015
    Publication date: November 24, 2016
    Inventor: Michael David FOEGELLE
  • Publication number: 20140338471
    Abstract: A method and system for selectively varying the performance of a test chamber are disclosed. According to one aspect, the performance is affected by a variable absorbing structure of the test chamber. The absorbing structure enables selective exposure of absorbing material to achieve a specific performance.
    Type: Application
    Filed: May 15, 2014
    Publication date: November 20, 2014
    Applicant: ETS-Lindgren Inc.
    Inventors: Bryan Howard SAYLER, Michael David FOEGELLE, Garth Anthony D'ABREU