Abstract: A system for measuring a device under test (DUT) includes a computing device and a measurement device that measures an electrical or physical parameter of the DUT. The computing device receives and stores measurement data in a DUT record associated with the DUT. The computing device further obtains a first image of the DUT, displays the first image as a reference image with a first reference frame, receives a live image of the DUT from an image sensor, and displays the live image with a second reference frame that corresponds to the first reference frame. A cursor on the live image moves according to movement of the image sensor relative to the DUT. A second image of the DUT is obtained, wherein the second image is substantially aligned with the reference image based on an alignment of the cursor with the second reference frame. The second image is stored in the DUT record.

Abstract: A system for measuring a device under test (DUT) includes a computing device and a measurement device that measures an electrical or physical parameter of the DUT. The computing device receives and stores measurement data in a DUT record associated with the DUT. The computing device further obtains a first image of the DUT, displays the first image as a reference image with a first reference frame, receives a live image of the DUT from an image sensor, and displays the live image with a second reference frame that corresponds to the first reference frame. A cursor on the live image moves according to movement of the image sensor relative to the DUT. A second image of the DUT is obtained, wherein the second image is substantially aligned with the reference image based on an alignment of the cursor with the second reference frame. The second image is stored in the DUT record.

Abstract: Systems and techniques for obtaining and maintaining maintenance records for various assets are described. In one embodiment, a computing device may be wirelessly coupled to a measurement device when the computing device is placed in proximity with the computing device. Upon measuring one or more parameters of a device under test (DUT), the measurement device may provide the measured parameters to the computing device in the form of measurement data. In some embodiments, the computing device associates the measured parameters with the corresponding DUT from which the measurements were obtained and provides the associated measured parameter to, for example, a service provider for future access. In another embodiment, the measurement device itself is configured to associate the measurement parameters with the DUT and provide the associated measurement parameters to the service provider.

Abstract: Methods used with a thermal imager in capturing a primary thermal image of an object or scene and then associating it, as desired, with any of a multitude of information relating to the object or scene. The related information can be associated with the primary thermal image in the field after the image is captured. The related information can pertain to further detail regarding the object, the surroundings of the scene, and/or surroundings of the location of the scene, which when associated with the primary thermal image, collectively represents a form of asset information card for the image.

Abstract: Systems and techniques for obtaining and maintaining maintenance records for various assets are described. In one embodiment, a computing device may be wirelessly coupled to a measurement device when the computing device is placed in proximity with the computing device. Upon measuring one or more parameters of a device under test (DUT), the measurement device may provide the measured parameters to the computing device in the form of measurement data. In some embodiments, the computing device associates the measured parameters with the corresponding DUT from which the measurements were obtained and provides the associated measured parameter to, for example, a service provider for future access. In another embodiment, the measurement device itself is configured to associate the measurement parameters with the DUT and provide the associated measurement parameters to the service provider.

Abstract: Methods used with a thermal imager in capturing a primary thermal image of an object or scene and then associating it, as desired, with any of a multitude of information relating to the object or scene. The related information can be associated with the primary thermal image in the field after the image is captured. The related information can pertain to further detail regarding the object, the surroundings of the scene, and/or surroundings of the location of the scene, which when associated with the primary thermal image, collectively represents a form of asset information card for the image.