Abstract: A system for measuring properties of a medium includes an electromagnetic generator for forming a CW carrier, a digital encoder for forming a digital message, and a modulator for modulating the CW carrier with the digital message to form a digitally modulated CW carrier. The medium provides a channel for propagating the digitally modulated CW carrier. The system further includes a receiver configured to receive the propagated, digitally modulated CW carrier, and a processor for measuring at least one property of the medium. The medium may be disposed within a gaseous atmosphere, a body of water, or a cell of a laboratory.

Abstract: A system for measuring properties of a medium includes an electromagnetic generator for forming a CW carrier, a digital encoder for forming a digital message, and a modulator for modulating the CW carrier with the digital message to form a digitally modulated CW carrier. The medium provides a channel for propagating the digitally modulated CW carrier. The system further includes a receiver configured to receive the propagated, digitally modulated CW carrier, and a processor for measuring at least one property of the medium. The medium may be disposed within a gaseous atmosphere, a body of water, or a cell of a laboratory.

Abstract: A system for measuring properties of a medium includes an electromagnetic generator for forming a CW carrier, a digital encoder for forming a digital message, and a modulator for modulating the CW carrier with the digital message to form a digitally modulated CW carrier. The medium provides a channel for propagating the digitally modulated CW carrier. The system further includes a receiver configured to receive the propagated, digitally modulated CW carrier, and a processor for measuring at least one property of the medium. The medium may be disposed within a gaseous atmosphere, a body of water, or a cell of a laboratory.

Abstract: Remotely sensing a target may include generating a first beam of optical radiation that is modulated at a first frequency and polarized at a first polarization. A second beam of optical radiation that is modulated at a second frequency and polarized at a second polarization may also be generated. The first and second beams of optical radiation may be transmitted to the target. Radiation at the first polarization and radiation at the second polarization may be detected from the target using a phase sensitive technique and the first and second frequencies.

Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a sweep frequency and a reference source configured to emit optical radiation at a reference wavelength. A first modulator may be configured to modulate the first optical radiation at a first frequency, and a second modulator may be configured to modulate the second optical radiation at a second frequency that is different from the first frequency and the sweep frequency. A science detector may be configured to detect the optical radiation from the first modulator and the second modulator after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies.

Abstract: A remote sensing platform for sensing a target may include a source configured to emit optical radiation toward the target. A device may be configured to dither the emitted optical radiation to alternately illuminate a number of locations on the target. A first detector may be configured to detect radiation reflected from a first location of the number of locations and to generate a first signal. A first lock-in amplifier may be configured to process the first signal. A second detector may be configured to detect radiation reflected from a second location of the number of locations and to generate a second signal. A second lock-in amplifier may be configured to process the second signal.

Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A science detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.

Abstract: A system for tuning one or more second radiant sources relative to a first radiant source may include a coupler configured to combine output signals from the first radiant source and a second radiant source to generate a heterodyne signal containing a frequency difference between the output signals from the first radiant source and the second radiant source. A photodetector may be configured to convert the heterodyne signal into an electrical signal containing the frequency difference. A spectrum analyzer may be configured to measure the frequency difference in the electrical signal and generate a precise difference value. A controller may be configured to adjust a wavelength of the second radiant source relative to that of the first radiant source based on the precise difference value. Laser spectroscopy may be performed by passing the output signals from the first radiant source and the second radiant source through a sample volume and detecting reflected or emitted radiation.

Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a sweep frequency and a reference source configured to emit optical radiation at a reference wavelength. A first modulator may be configured to modulate the first optical radiation at a first frequency, and a second modulator may be configured to modulate the second optical radiation at a second frequency that is different from the first frequency and the sweep frequency. A science detector may be configured to detect the optical radiation from the first modulator and the second modulator after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies.

Abstract: A spectrometer may include a radiant source configured to emit radiation and an optical amplifier configured to amply the radiation emitted by the radiant source to produce amplified radiation. A number of optical elements may be configured to produce an interference pattern from the amplified radiation. A detector may detect the interference pattern and generate data from the interference pattern. A processor may be configured to measure one or more from the data.

Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A science detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.

Abstract: A remote platform obtaining a spectrum of one or more locations by moving the platform to sequentially illuminating the locations with different wavelengths of radiation. The different wavelengths of radiation reflected from the locations may be sequentially detected and converted into data. Spectra of the locations may be assembled from the data that was sequentially collected as the platform moved.

Abstract: A remote platform obtaining a spectrum of one or more locations by moving the platform to sequentially illuminating the locations with different wavelengths of radiation. The different wavelengths of radiation reflected from the locations may be sequentially detected and converted into data. Spectra of the locations may be assembled from the data that was sequentially collected as the platform moved.

Abstract: A system for tuning one or more second radiant sources relative to a first radiant source may include a coupler configured to combine output signals from the first radiant source and a second radiant source to generate a heterodyne signal containing a frequency difference between the output signals from the first radiant source and the second radiant source. A photodetector may be configured to convert the heterodyne signal into an electrical signal containing the frequency difference. A spectrum analyzer may be configured to measure the frequency difference in the electrical signal and generate a precise difference value. A controller may be configured to adjust a wavelength of the second radiant source relative to that of the first radiant source based on the precise difference value. Laser spectroscopy may be performed by passing the output signals from the first radiant source and the second radiant source through a sample volume and detecting reflected or emitted radiation.

Abstract: A method of manufacturing in space and a spacecraft assembly to accomplish such manufacture. The spacecraft assembly includes a spacecraft including a plurality of canister compartments circumferentially spaced about the central axis of the spacecraft and opening in a docking face of the spacecraft, a plurality of canisters respectively positioned in the compartments, and a passive docking mechanism proximate the docking face and proximate the central axis, and a service vehicle comprising a plurality of canister compartments spaced circumferentially about the central axis of the service vehicle, a plurality of canisters respectively positioned in the compartments, and a manipulator assembly including an active docking structure, including a boom extending forwardly from the docking face, and a canister handling assembly mounted on the boom.

Abstract: This invention is an automatic capture and docking mechanism for a pair of spacecraft. A largely passive capture mechanism disposed on a first spacecraft includes a concave cone section with the narrower interior end to admit a ball of a predetermined diameter. When tripped, a capture device restricts the diameter of passage for capture of the ball. In the release position passage for the ball is unrestricted. The capture device is preferably reset by the other spacecraft to release the ball. A docking mechanism disposed on the second spacecraft includes a convex cone section constructed to mate with the concave cone section, ball at the end of a cable and a boom. The cable may be extended from or retracted to the apex of the convex cone section. A rotary drive coupled to the convex cone section permits relative rotation of the spacecraft. The boom may be extended from or retracted into the second spacecraft. The spacecraft dock by directing the extended ball into the cylinder, where it is captured.

Abstract: A robotic substrate manipulator constructed for substrate handling during thin film deposition in the vacuum of outer space. The robotic substrate manipulator includes a cassette holding a plurality of substrates preferably including six cassettes in a carousel. A circular cylinder encloses the carousel with an access door at a location accessible by a manipulator arm assembly. Substrates are retained within the cassette via a passive retention system. This manipulator arm assembly includes an arm with a gripper at one end. The gripper includes a pair of opposed fingers normally urged closed by at least one finger spring that may be opened by a solenoid. The manipulator arm assembly includes a vertical driver and a horizontal rotary driver permitting motion of substrates from the cassette to a processing station. Position gauges on both the vertical motion driver and the horizontal rotary motion driver permit feedback regarding the manipulator arm assembly position.