Abstract: A method that purposely relaxes OPC algorithm constraints to allow post OPC mask shapes to elongate along one direction (particularly lowering the 1-dimensional MEEF in this direction with the result of an effectively overall lowered MEEF) to produce a pattern on wafer that is circular to within an acceptable tolerance.

Abstract: An apparatus and method for reducing noise and resonance detractors connected with and E beam tool. The invention provides a plurality of embodiments. In one embodiment, the E beam tool will be calibrated and the results will be then filtered to counter the effects of the noise afterwards. In an alternate embodiment of the present invention, a filter is applied in the actual feedback of the E beam tool for the writing cycle.

Abstract: An apparatus and method for detection of electromechanical and mechanical errors in an electron beam device is provided. First the existing subfield is divided into a gridlike structure where each grid can be considered a target. Then a plurality of target points are provided on each grid for measuring combined directional variances. The separated horizontal and vertical variances is also measured for each of the target points. This leads to the performance of a significance tests, based on the F statistic which we refer to as FHV, for horizontal and vertical values of each target points during which FSTITCH values are also obtained. The FSTITCH values are then compared for horizontal and vertical values and an error alert provided when there is a sufficiently large disparity between the separated FSTITCH values. In an alternate embodiment of the present invention, a three dimensional grid is also provided to be used in a similar manner.

Abstract: As disclosed herein, a system and method are provided for detection and measurement of noise on E beam tools and devices including a spectrum analyzer which looks at the different frequency components of the noise. The deflected electron beam from the tool is calibrated in a coarse and fine mode by scanning the beam over a grid-like calibration target. The position of where the bars are detected is compared to where they actually are, and the deflection can be calibrated so that it matches the grid. This invention can utilize a Fast Fourier Transform (FFT) of the time-ordered data which allows one to see peaks associated with noise.

Abstract: An apparatus and method for detection of electromechanical and mechanical errors in an electron beam device is provided. First the existing subfield is divided into a gridlike structure where each grid can be considered a target. Then a plurality of target points are provided on each grid for measuring combined directional variances. The separated horizontal and vertical variances is also measured for each of the target points. This leads to the performance of a significance tests, based on the F statistic which we refer to as FHV, for horizontal and vertical values of each target points during which FSTITCH values are also obtained. The FSTITCH values are then compared for horizontal and vertical values and an error alert provided when there is a sufficiently large disparity between the separated FSTITCH values. In an alternate embodiment of the present invention, a three dimensional grid is also provided to be used in a similar manner.

Abstract: As disclosed herein, a system and method are provided for detection and measurement of noise on E beam tools and devices including a spectrum analyzer which looks at the different frequency components of the noise. The deflected electron beam from the tool is calibrated in a coarse and fine mode by scanning the beam over a grid-like calibration target. The position of where the bars are detected is compared to where they actually are, and the deflection can be calibrated so that it matches the grid. This invention can utilize a Fast Fourier Transform (FFT) of the time-ordered data which allows one to see peaks associated with noise.

Abstract: An apparatus and method for reducing noise and resonance detractors connected with and E beam tool. The invention provides a plurality of embodiments. In one embodiment, the E beam tool will be calibrated and the results will be then filtered to counter the effects of the noise afterwards. In an alternate embodiment of the present invention, a filter is applied in the actual feedback of the E beam tool for the writing cycle.

Abstract: A method and apparatus for detecting opens and shorts in a metalization layer includes creating a reference feature list of opens features and at least two reference feature lists of shorts features included in a top surface metalization. A first of the at least two reference feature lists include shorts features having a first threshold and the second of the at least two reference feature lists include shorts features having a second threshold more aggressive than the first threshold. High numerical aperture (NA) illumination is used to produce a grey level image of the top surface metalization. A first image stream is produced from the grey level image using a first digital threshold suitable for use in detecting opens exclusive of shorts and then opens features are extracted. At least a second image stream and a third image steam are then produced from the grey level image using second and third digital thresholds, respectively, suitable for use in detecting shorts exclusive of opens.