Patents by Inventor Michael Elbaum

Michael Elbaum has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12730080
    Abstract: Some embodiments relate to a computer system for determining a structural image of a sample. The computer system is configured to receive and process raw measured data produced by a scanning microscope and being indicative of at least one scan dataset (IM)N acquired in a scan session and corresponding to a sequence of N measurements on a sample located in proximity to a focal plane of the scanning microscope. Each measurement includes data provided by M detection channels associated with M-segment detector (M?3). The computer system includes a data analyzer capable of processing at least one scan dataset to compensate image shifts induced by off-axis detection channels for sample features at defocus plane to thereby obtain data indicative of parallax corrected scan image of the sample which enables separation between phase and depth information and extraction of a depth contrast image of the sample from the single scan dataset.
    Type: Grant
    Filed: February 9, 2022
    Date of Patent: September 8, 2026
    Assignee: YEDA RESEARCH AND DEVELOPMENT CO. LTD.
    Inventors: Michael Elbaum, Shahar Seifer, Lothar Houben
  • Publication number: 20250116617
    Abstract: Some embodiments relate to a computer system for determining a structural image of a sample. The computer system is configured to receive and process raw measured data produced by a scanning microscope and being indicative of at least one scan dataset (IM)N acquired in a scan session and corresponding to a sequence of N measurements on a sample located in proximity to a focal plane of the scanning microscope. Each measurement includes data provided by M detection channels associated with M-segment detector (M?3). The computer system includes a data analyzer capable of processing at least one scan dataset to compensate image shifts induced by off-axis detection channels for sample features at defocus plane to thereby obtain data indicative of parallax corrected scan image of the sample which enables separation between phase and depth information and extraction of a depth contrast image of the sample from the single scan dataset.
    Type: Application
    Filed: February 9, 2022
    Publication date: April 10, 2025
    Inventors: Michael Elbaum, Shahar Seifer, Lothar Houben
  • Publication number: 20040208817
    Abstract: The present invention provides a method for producing carbon structures by laser irradiation, the method comprising: (i) providing a substrate, at least a portion of whose surface being covered with a sample comprising one or more thermally degradable organic compounds, said sample being in the form of homogeneous solution, suspension or emulsion; (ii) irradiating said covered surface portion locally by applying a focused laser beam, thus resulting in local deposition of carbon, and (iii) repeating step (ii) by moving either the laser beam or the sample, thus creating a desired pattern of carbon structures. The present invention further provides carbon structures produced by the method of the invention.
    Type: Application
    Filed: June 10, 2004
    Publication date: October 21, 2004
    Inventors: Michael Elbaum, David Zbaida, Eugenia Klein, Aurelie Lachish-Zalait, Ronit Popovitz-Biro