Abstract: An apparatus for cognitive data center management is disclosed. A computer-implemented method and computer program product also perform the functions of the apparatus. According to an embodiment of the present invention, the apparatus includes a performance module that determines performance metrics over a predetermined time interval at a device coordinate in a three-dimensional (“3D”) coordinate system for each replaceable device of a plurality of replaceable devices within a data center. The apparatus maps the performance metrics to environmental sensor measurements taken in the 3D coordinate system. The apparatus further includes an input analysis module that uses discovery analytics to determine a predicted time to failure for each replaceable device.

Abstract: An apparatus for cognitive data center management is disclosed. A computer-implemented method and computer program product also perform the functions of the apparatus. According to an embodiment of the present invention, the apparatus includes a performance module that determines performance metrics over a predetermined time interval at a device coordinate in a three-dimensional (“3D”) coordinate system for each replaceable device of a plurality of replaceable devices within a data center. The apparatus maps the performance metrics to environmental sensor measurements taken in the 3D coordinate system. The apparatus further includes an input analysis module that uses discovery analytics to determine a predicted time to failure for each replaceable device.

Abstract: Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, the UTS is coupled to a UTS adapter using a plurality of cables that transmits the different data and power signals between the UTS and the adapter. For example, the interface in the UTS adapter may include a plurality of pins or optical channels that are each coupled to one of the plurality of cables. The SUT is coupled to a SUT adapter which may have the same interface as the UTS adapter. However, the SUT may be coupled to only a sub-portion of the I/O elements in the SUT adapter, and thus, only some of the I/O elements are used when testing the SUT.

Abstract: Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, the UTS is coupled to a UTS adapter using a plurality of cables that transmits the different data and power signals between the UTS and the adapter. For example, the interface in the UTS adapter may include a plurality of pins or optical channels that are each coupled to one of the plurality of cables. The SUT is coupled to a SUT adapter which may have the same interface as the UTS adapter. However, the SUT may be coupled to only a sub-portion of the I/O elements in the SUT adapter, and thus, only some of the I/O elements are used when testing the SUT.