Abstract: Aspects of the disclosure relate to dynamic model configuration and execution. A computing platform may receive first model data comprising first model execution configuration data and first model output configuration data. The computing platform may generate a first model based on the first model execution configuration data. The computing platform may distribute, to a plurality of computing platforms, the first model, the first model execution configuration data, and the first model output configuration data. The computing platform may receive a second request to execute one or more models from a third computing platform. The computing platform may receive, from the third computing platform, first model execution data. The computing platform may execute the first model based on the first model execution data and the first model execution configuration data to generate a first model output score.

Abstract: Aspects of the disclosure relate to dynamic model configuration and execution. A computing platform may receive first model data comprising first model execution configuration data and first model output configuration data. The computing platform may generate a first model based on the first model execution configuration data. The computing platform may distribute, to a plurality of computing platforms, the first model, the first model execution configuration data, and the first model output configuration data. The computing platform may receive a second request to execute one or more models from a third computing platform. The computing platform may receive, from the third computing platform, first model execution data. The computing platform may execute the first model based on the first model execution data and the first model execution configuration data to generate a first model output score.

Abstract: Aspects of the disclosure relate to dynamic model configuration and execution. A computing platform may receive first model data comprising first model execution configuration data and first model output configuration data. The computing platform may generate a first model based on the first model execution configuration data. The computing platform may distribute, to a plurality of computing platforms, the first model, the first model execution configuration data, and the first model output configuration data. The computing platform may receive a second request to execute one or more models from a third computing platform. The computing platform may receive, from the third computing platform, first model execution data. The computing platform may execute the first model based on the first model execution data and the first model execution configuration data to generate a first model output score.

Abstract: Aspects of the disclosure relate to dynamic model configuration and execution. A computing platform may receive first model data comprising first model execution configuration data and first model output configuration data. The computing platform may generate a first model based on the first model execution configuration data. The computing platform may distribute, to a plurality of computing platforms, the first model, the first model execution configuration data, and the first model output configuration data. The computing platform may receive a second request to execute one or more models from a third computing platform. The computing platform may receive, from the third computing platform, first model execution data. The computing platform may execute the first model based on the first model execution data and the first model execution configuration data to generate a first model output score.

Abstract: Methods, systems, and devices for determining construction data for producing a forming die are provided. Using an electronic computing device, a simulation is carried out that includes moving die parts of a die toward each other to a closed position, reshaping a workpiece reshaping a workpiece from an initial state to a first deformed state due to the moving of the die parts to the closed position, keeping the die parts at least temporarily in the closed state to maintain the workpiece in the first deformed state, moving the die parts away from each other to an open position, and deforming the workpiece to a second deformed state from the first deformed state due to internal stresses of the workpiece and due to moving of the die parts to the open position. A geometry of a new die part that influences the reshaping is determined.

Abstract: Aspects of the disclosure relate to dynamic model configuration and execution. A computing platform may receive first model data comprising first model execution configuration data and first model output configuration data. The computing platform may generate a first model based on the first model execution configuration data. The computing platform may distribute, to a plurality of computing platforms, the first model, the first model execution configuration data, and the first model output configuration data. The computing platform may receive a second request to execute one or more models from a third computing platform. The computing platform may receive, from the third computing platform, first model execution data. The computing platform may execute the first model based on the first model execution data and the first model execution configuration data to generate a first model output score.

Abstract: An apparatus for predicting and/or reducing a deformation of an assembly brought about during production of a weld seam that connects a first component and a second component of the assembly includes a device that is configured to determine and/or provide a finite element (FE) model of the assembly where the FE model includes a set of FEs for the weld seam and a set of FEs for the first component and the second component. The device is further configured to induce a spatial contraction of the set of FEs for the weld seam, determine an effect of the spatial contraction on the set of FEs for the first component and/or the second component, and predict a spatial deformation of the first component and/or of the second component on a basis of the effect on the set of FEs for the first component and/or the second component.

Abstract: Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.

Abstract: A method for testing a digital circuit as a Device under Test—DUT, including determining a Bit Error Rate—BER—value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of executing the test for each one of the number of sample points for providing a statement about the condition of the DUT.

Abstract: Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.

Abstract: A method for testing a digital circuit as a Device under Test—DUT (110), comprising the steps of determining a Bit Error Rate—BER—value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of the tests of step (b) for providing a statement about the condition of the DUT (110).

Abstract: The invention provides a current-voltage converter comprising: an input port, amplifying means comprising an inverting amplifier (U1) having an inverting input terminal and an output terminal, the output terminal being coupled to the input port of the current-voltage converter via a resistor (RF). The invention is characterized in that a voltage clipping means is connected between the input port of the current-voltage converter and a fixed potential, that the inverting amplifier (U1) has a gain such that the maximum of the output voltage (U0) of a specific polarity of the inverting amplifier (U1) is the product of the gain of the current-voltage converter and the corresponding maximum voltage across the clipping means. Thus, saturation of the inverting amplifier can be avoided.

Abstract: An optical fiber connector for joining optical fibers comprises a cylindrical ferrule (1) with a fiber (20) arranged along the axis of the ferrule and with an end face (23) of the fiber (20) inclined with respect to a plane perpendicular to the fiber axis (10). The fiber end face (23) is set back a predetermined distance from a projecting surface (22) of the ferrule end face. This projecting surface (22) acts as a bearing surface for an opposite connector so that two connectors can be brought into physical contact whereby a well-defined distance between the fiber end faces is maintained. In the connected state, the fiber end faces of two opposite connectors are arranged parallel to each other, thus ensuring high return loss of the connector system. The connector can easily be manufactured by a polishing process from a standard connector having ferrule and fiber end faces parallel to the fiber axis. (FIG. 2a: side view; FIG. 2c: top view).

Abstract: A pulse generator with adjustable pulse frequency, pulse width and pulse delay contains a start-stop oscillator (1) whose oscillator pulses are counted by a counter (2) in adjustable counting cycles. After each counting cycle, the oscillator (1) is shut down for an adjustable time interval. The pulses of the output signal of the pulse generator are produced at the occurrence of a predetermined count value, and the end of these pulses is essentially determined by a second predetermined count value. As the oscillator (1) has a fixed operating frequency and for the purpose of frequency interpolation is periodically shut down during short time intervals and then restarted, a pulse generator is obtained having very small frequency deviations over a wide frequency spectrum.