Abstract: Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.

Abstract: A method for testing a digital circuit as a Device under Test—DUT, including determining a Bit Error Rate—BER—value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of executing the test for each one of the number of sample points for providing a statement about the condition of the DUT.

Abstract: Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.

Abstract: A method for testing a digital circuit as a Device under Test—DUT (110), comprising the steps of determining a Bit Error Rate—BER—value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of the tests of step (b) for providing a statement about the condition of the DUT (110).

Abstract: The invention provides a current-voltage converter comprising: an input port, amplifying means comprising an inverting amplifier (U1) having an inverting input terminal and an output terminal, the output terminal being coupled to the input port of the current-voltage converter via a resistor (RF). The invention is characterized in that a voltage clipping means is connected between the input port of the current-voltage converter and a fixed potential, that the inverting amplifier (U1) has a gain such that the maximum of the output voltage (U0) of a specific polarity of the inverting amplifier (U1) is the product of the gain of the current-voltage converter and the corresponding maximum voltage across the clipping means. Thus, saturation of the inverting amplifier can be avoided.

Abstract: An optical fiber connector for joining optical fibers comprises a cylindrical ferrule (1) with a fiber (20) arranged along the axis of the ferrule and with an end face (23) of the fiber (20) inclined with respect to a plane perpendicular to the fiber axis (10). The fiber end face (23) is set back a predetermined distance from a projecting surface (22) of the ferrule end face. This projecting surface (22) acts as a bearing surface for an opposite connector so that two connectors can be brought into physical contact whereby a well-defined distance between the fiber end faces is maintained. In the connected state, the fiber end faces of two opposite connectors are arranged parallel to each other, thus ensuring high return loss of the connector system. The connector can easily be manufactured by a polishing process from a standard connector having ferrule and fiber end faces parallel to the fiber axis. (FIG. 2a: side view; FIG. 2c: top view).