Abstract: An absorber device for absorbing signals is described. The absorber device has a housing with inner sides having an absorbing material. The housing is adaptable with regard to its geometry. The absorber device is portable. Moreover, a test system for testing radio frequency characteristics of a device under test is described.

Abstract: A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Abstract: An absorber device for absorbing signals is described. The absorber device has a housing with inner sides having an absorbing material. The housing is adaptable with regard to its geometry. The absorber device is portable. Moreover, a test system for testing radio frequency characteristics of a device under test is described.

Abstract: A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Abstract: A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup comprises a positioning system, a reference reflector having a collection of diffuse scattering members, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Abstract: A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup comprises a positioning system, a reference reflector having a collection of diffuse scattering members, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Abstract: A test coupler for supplying a device under test with test signals contains a first coaxial connector, a waveguide port, and a first strip conductor. Test signals of a lower frequency range are supplied to the first coaxial connector. Test signals of an upper frequency range are supplied to the waveguide port. The test coupler guides the test signals on the first strip conductor to the device under test.

Abstract: A coupler comprises a first line and a second line in each case with two connectors. The lines run in spatial proximity and are coupled. A first connector of the first line and a first connector of the second line are disposed in spatial proximity. A second connector of the first line and a second connector of the second line are disposed in spatial proximity. A signal does not couple or couples only with a high attenuation from the first connector of the first line to the first connector of the second line. The signal is split, in particular, at the design frequency, into largely identical parts to the second connector of the first line and the second connector of the second line. The first line and the second line in this context are strip conductors.

Abstract: A coupler comprises a first line and a second line in each case with two connectors. The lines run in spatial proximity and are coupled. A first connector of the first line and a first connector of the second line are disposed in spatial proximity. A second connector of the first line and a second connector of the second line are disposed in spatial proximity. A signal does not couple or couples only with a high attenuation from the first connector of the first line to the first connector of the second line. The signal is split, in particular, at the design frequency, into largely identical parts to the second connector of the first line and the second connector of the second line. The first line and the second line in this context are strip conductors.

Abstract: A test coupler for supplying a device under test with test signals contains a first coaxial connector, a waveguide port, and a first strip conductor. Test signals of a lower frequency range are supplied to the first coaxial connector. Test signals of an upper frequency range are supplied to the waveguide port. The test coupler guides the test signals on the first strip conductor to the device under test.