Abstract: This technology is directed to a method and apparatus for monitoring or testing defects associated with an ion lens connected within a mass spectrometer. In some implementations, the testing mechanism monitors a connection of one or more ion lenses configured in the mass spectrometer to determine if voltage is effectively applied to the ion lens. The testing circuit of the present technology includes at least one Zener diode added to the voltage divider and monitoring a change in slope of the applied voltage versus the voltage at the read-back circuit. The change in slope may be easily measured.

Abstract: This technology is directed to a method and apparatus for monitoring or testing defects associated with an ion lens connected within a mass spectrometer. In some implementations, the testing mechanism monitors a connection of one or more ion lenses configured in the mass spectrometer to determine if voltage is effectively applied to the ion lens. The testing circuit of the present technology includes at least one Zener diode added to the voltage divider and monitoring a change in slope of the applied voltage versus the voltage at the read-back circuit. The change in slope may be easily measured.

Abstract: Methods and apparatus useful in automated performance of immunoassays, in some preferred embodiments, relying upon the sandwich immunoassay technique, are described. Each rack of reaction tubes is uniquely identified by an optical identifier disc which is read by the automatic controller. The assays are performed at two stations which configuration thereby permits arrays to be run on a second rack of reaction tubes while the first rack is in process. The cooperation of the identifier disc and the automatic controller minimizes operator error and helps improve the reliability of the data obtained.

Abstract: Variations in the intensity of a light source and the sensitivity of a fluorescence detector photo-multiplier tube are simultaneously compensated by measuring the intensity (I.sub.LS1) of the light source at the sample excitation frequency with a silicon detector, measuring the intensity (I.sub.LS2) of the light source at the emission frequency with another silicon detector, measuring with the photo-multiplier detector the intensity (I.sub.S) of the sample's fluorescence and the intensity (I.sub.