Patents by Inventor Michael Garvey
Michael Garvey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12498706Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.Type: GrantFiled: May 19, 2023Date of Patent: December 16, 2025Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 11809155Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.Type: GrantFiled: February 7, 2022Date of Patent: November 7, 2023Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Publication number: 20230288920Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.Type: ApplicationFiled: May 19, 2023Publication date: September 14, 2023Inventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 11656614Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.Type: GrantFiled: August 2, 2021Date of Patent: May 23, 2023Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 11341063Abstract: An information handling system may include a host system processor and a storage resource communicatively coupled to the host system processor. The storage resource may be configured to, responsive to receiving a command from the host system processor relating an address range of the storage resource, create an entry in a drive status table stored in a persistent storage area of the storage resource, the entry setting forth information indicative of the address and a completion status of the command and update a status of the address range in the drive status table as steps of the command are completed by the storage resource, such that, if a drive event occurs preventing full completion of the command, the host system processor may access the drive status table to determine a status of the command, and take a remedial action based on the status of the command.Type: GrantFiled: January 31, 2019Date of Patent: May 24, 2022Assignee: Dell Products L.P.Inventors: Jaleel A. Kazi, Michael Garvey, Kevin T. Marks, Dale R. Elliott
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Publication number: 20220155749Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.Type: ApplicationFiled: February 7, 2022Publication date: May 19, 2022Inventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 11243507Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.Type: GrantFiled: April 29, 2020Date of Patent: February 8, 2022Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Publication number: 20210356950Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.Type: ApplicationFiled: August 2, 2021Publication date: November 18, 2021Inventors: Michael Garvey, Fred Persi, Matthew Walther
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Publication number: 20210341899Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.Type: ApplicationFiled: April 29, 2020Publication date: November 4, 2021Inventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 11079748Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.Type: GrantFiled: April 29, 2020Date of Patent: August 3, 2021Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, Fred Persi, Matthew Walther
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Patent number: 10983879Abstract: A method of distributed management of recovery of multi-controller NVMe drives includes detecting a path failure of a PCIe path from a first storage node to a first controller on the multi-controller NVMe drive, and initially attempting to correct the path failure using a controller level reset. If the controller level reset is unsuccessful, an alternative path to the controller is sought, and if that is unsuccessful a drive level reset operation is coordinated by all storage nodes with controllers executing on the NVMe drive. To coordinate reset of the NVMe drive, one storage node is elected master. Each node (both slave and master) initiates quiescing of IO operations on its respective controller, and after quiescing has completed, initiates shutdown of its respective controller. Once all controllers are shut down, the master initiates reset of the NVMe drive. Timeouts are used to constrain completion of the quiescing and shutdown operations.Type: GrantFiled: October 31, 2018Date of Patent: April 20, 2021Assignee: EMC IP Holding Company LLCInventors: Akash Agrawal, Timothy Johnson, Jiahui Wang, Peng Yin, Stephen Richard Ives, Michael Garvey, Christopher Monti
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Publication number: 20200250107Abstract: An information handling system may include a host system processor and a storage resource communicatively coupled to the host system processor. The storage resource may be configured to, responsive to receiving a command from the host system processor relating an address range of the storage resource, create an entry in a drive status table stored in a persistent storage area of the storage resource, the entry setting forth information indicative of the address and a completion status of the command and update a status of the address range in the drive status table as steps of the command are completed by the storage resource, such that, if a drive event occurs preventing full completion of the command, the host system processor may access the drive status table to determine a status of the command, and take a remedial action based on the status of the command.Type: ApplicationFiled: January 31, 2019Publication date: August 6, 2020Applicant: Dell Products L.P.Inventors: Jaleel A. KAZI, Michael GARVEY, Kevin T. MARKS, Dale R. ELLIOTT
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Patent number: 10295341Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: GrantFiled: December 1, 2016Date of Patent: May 21, 2019Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, James D. Osterloh, Fred Persi
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Publication number: 20170328708Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: ApplicationFiled: December 1, 2016Publication date: November 16, 2017Inventors: Michael Garvey, James D. Osterloh, Fred Persi
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Patent number: 9528826Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: GrantFiled: November 4, 2015Date of Patent: December 27, 2016Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, James D. Osterloh, Fred Persi
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Publication number: 20160069677Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: ApplicationFiled: November 4, 2015Publication date: March 10, 2016Inventors: Michael Garvey, James D. Osterloh, Fred Persi
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Patent number: 9222769Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: GrantFiled: December 8, 2012Date of Patent: December 29, 2015Assignee: GRALE TECHNOLOGIESInventors: Michael Garvey, James D. Osterloh, Fred Persi
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Publication number: 20140157610Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.Type: ApplicationFiled: December 8, 2012Publication date: June 12, 2014Applicant: GRALE TECHNOLOGIESInventors: Michael Garvey, James D. Osterloh, Fred Persi
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Patent number: 8374933Abstract: A method is provided that gathers information from a user regarding a desired educational institution and sources for financing an education at the educational institution. The method further estimates a future income and compares the income with the obligations that arise from financing the education. This comparison is subsequently classified according to a risk profile.Type: GrantFiled: November 5, 2009Date of Patent: February 12, 2013Assignee: Sallie Mae, Inc.Inventors: Nancy Deck, Ryan Draude, Barry Feierstein, Michael Garvey, Cara Hayes, Christy Lynn Marble, Nicole Ogburn, Eric Woodall
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Publication number: 20100323023Abstract: The present invention relates to a composition for use in the treatment of a detached retina, comprising a dispersion of nanoparticles in a liquid, wherein the nanoparticles have a specific gravity which is higher than that of the liquid and the individual refractive indices of the nanoparticles and the liquid are substantially similar to one another. The present invention also relates to a composition for use in the treatment of a detached retina, comprising a dispersion of silica nanoparticles in a liquid, a method and kit of parts for producing the compositions and a method of treating a detached retina.Type: ApplicationFiled: December 3, 2008Publication date: December 23, 2010Applicant: ULIVE ENTERPRISES LIMITEDInventors: Michael Garvey, Rachel Lucinda Williams, David Sai Hung Wong