Patents by Inventor Michael Garvey

Michael Garvey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12498706
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.
    Type: Grant
    Filed: May 19, 2023
    Date of Patent: December 16, 2025
    Assignee: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Patent number: 11809155
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.
    Type: Grant
    Filed: February 7, 2022
    Date of Patent: November 7, 2023
    Assignee: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Publication number: 20230288920
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.
    Type: Application
    Filed: May 19, 2023
    Publication date: September 14, 2023
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Patent number: 11656614
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.
    Type: Grant
    Filed: August 2, 2021
    Date of Patent: May 23, 2023
    Assignee: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Patent number: 11341063
    Abstract: An information handling system may include a host system processor and a storage resource communicatively coupled to the host system processor. The storage resource may be configured to, responsive to receiving a command from the host system processor relating an address range of the storage resource, create an entry in a drive status table stored in a persistent storage area of the storage resource, the entry setting forth information indicative of the address and a completion status of the command and update a status of the address range in the drive status table as steps of the command are completed by the storage resource, such that, if a drive event occurs preventing full completion of the command, the host system processor may access the drive status table to determine a status of the command, and take a remedial action based on the status of the command.
    Type: Grant
    Filed: January 31, 2019
    Date of Patent: May 24, 2022
    Assignee: Dell Products L.P.
    Inventors: Jaleel A. Kazi, Michael Garvey, Kevin T. Marks, Dale R. Elliott
  • Publication number: 20220155749
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.
    Type: Application
    Filed: February 7, 2022
    Publication date: May 19, 2022
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Patent number: 11243507
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.
    Type: Grant
    Filed: April 29, 2020
    Date of Patent: February 8, 2022
    Assignee: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Publication number: 20210356950
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.
    Type: Application
    Filed: August 2, 2021
    Publication date: November 18, 2021
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Publication number: 20210341899
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements a morphic manufacturing approach that integrates in situ inspection and related decision-making into the manufacturing process. After execution of a machining or deposition operation, the system performs a sensor scan to collect sensor measurement data for the resulting part while the part remains in the manufacturing work cell. The measurement data is compared with an as-designed digital model of the part to determine whether further machining or deposition is necessary to bring the finished part into tolerance with the model. If necessary, the system performs another additive and/or subtractive manufacturing operation on the part based on analysis of the measurement data to bring the part into tolerance. The measured inspection data can be stored in association with each manufactured part for auditing purposes or for creation of part-specific digital twins.
    Type: Application
    Filed: April 29, 2020
    Publication date: November 4, 2021
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Patent number: 11079748
    Abstract: A manufacturing control system for an additive, subtractive, or hybrid machining system implements in situ part inspection to collect as-built metrology data for a manufactured part while the part remains in the work envelop, and uses the resulting measured inspection data to generate an as-built digital twin that accurately models the finished part. After execution of a subtractive and/or additive tooling operation, the system performs a sensor scan to collect three-dimensional imaging measurement data for the resulting manufactured part while the part remains in the work cell. The measurement data is then integrated with as-designed part metadata for the idealized part to yield the as-built digital twin. Since metrology measurements are integrated into the manufacturing process, customized as-built digital twins can be generated for each manufactured part without requiring manual inspections to be performed on each part.
    Type: Grant
    Filed: April 29, 2020
    Date of Patent: August 3, 2021
    Assignee: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, Fred Persi, Matthew Walther
  • Patent number: 10983879
    Abstract: A method of distributed management of recovery of multi-controller NVMe drives includes detecting a path failure of a PCIe path from a first storage node to a first controller on the multi-controller NVMe drive, and initially attempting to correct the path failure using a controller level reset. If the controller level reset is unsuccessful, an alternative path to the controller is sought, and if that is unsuccessful a drive level reset operation is coordinated by all storage nodes with controllers executing on the NVMe drive. To coordinate reset of the NVMe drive, one storage node is elected master. Each node (both slave and master) initiates quiescing of IO operations on its respective controller, and after quiescing has completed, initiates shutdown of its respective controller. Once all controllers are shut down, the master initiates reset of the NVMe drive. Timeouts are used to constrain completion of the quiescing and shutdown operations.
    Type: Grant
    Filed: October 31, 2018
    Date of Patent: April 20, 2021
    Assignee: EMC IP Holding Company LLC
    Inventors: Akash Agrawal, Timothy Johnson, Jiahui Wang, Peng Yin, Stephen Richard Ives, Michael Garvey, Christopher Monti
  • Publication number: 20200250107
    Abstract: An information handling system may include a host system processor and a storage resource communicatively coupled to the host system processor. The storage resource may be configured to, responsive to receiving a command from the host system processor relating an address range of the storage resource, create an entry in a drive status table stored in a persistent storage area of the storage resource, the entry setting forth information indicative of the address and a completion status of the command and update a status of the address range in the drive status table as steps of the command are completed by the storage resource, such that, if a drive event occurs preventing full completion of the command, the host system processor may access the drive status table to determine a status of the command, and take a remedial action based on the status of the command.
    Type: Application
    Filed: January 31, 2019
    Publication date: August 6, 2020
    Applicant: Dell Products L.P.
    Inventors: Jaleel A. KAZI, Michael GARVEY, Kevin T. MARKS, Dale R. ELLIOTT
  • Patent number: 10295341
    Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.
    Type: Grant
    Filed: December 1, 2016
    Date of Patent: May 21, 2019
    Assignee: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, James D. Osterloh, Fred Persi
  • Publication number: 20170328708
    Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.
    Type: Application
    Filed: December 1, 2016
    Publication date: November 16, 2017
    Inventors: Michael Garvey, James D. Osterloh, Fred Persi
  • Patent number: 9528826
    Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.
    Type: Grant
    Filed: November 4, 2015
    Date of Patent: December 27, 2016
    Assignee: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, James D. Osterloh, Fred Persi
  • Publication number: 20160069677
    Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.
    Type: Application
    Filed: November 4, 2015
    Publication date: March 10, 2016
    Inventors: Michael Garvey, James D. Osterloh, Fred Persi
  • Patent number: 9222769
    Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.
    Type: Grant
    Filed: December 8, 2012
    Date of Patent: December 29, 2015
    Assignee: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, James D. Osterloh, Fred Persi
  • Publication number: 20140157610
    Abstract: Systems, apparatuses and methods are described for integrating an electronic metrology sensor with precision production equipment such as computer numerically controlled (CNC) machines. For example, a laser distance measuring sensor is used. Measurements are taken at a relatively high sample rate and converted into a format compatible with other data generated or accepted by the CNC machine. Measurements from the sensor are synchronized with the position of the arm of the machine such as through the use of offsets. Processing yields a detailed and highly accurate three-dimensional map of a workpiece in the machine. Applicable metrology instruments include other near continuously reading non-destructive characterization instruments such as contact and non-contact dimensional, eddy current, ultra-sound, and X-Ray Fluorescence (XRF) sensors.
    Type: Application
    Filed: December 8, 2012
    Publication date: June 12, 2014
    Applicant: GRALE TECHNOLOGIES
    Inventors: Michael Garvey, James D. Osterloh, Fred Persi
  • Patent number: 8374933
    Abstract: A method is provided that gathers information from a user regarding a desired educational institution and sources for financing an education at the educational institution. The method further estimates a future income and compares the income with the obligations that arise from financing the education. This comparison is subsequently classified according to a risk profile.
    Type: Grant
    Filed: November 5, 2009
    Date of Patent: February 12, 2013
    Assignee: Sallie Mae, Inc.
    Inventors: Nancy Deck, Ryan Draude, Barry Feierstein, Michael Garvey, Cara Hayes, Christy Lynn Marble, Nicole Ogburn, Eric Woodall
  • Publication number: 20100323023
    Abstract: The present invention relates to a composition for use in the treatment of a detached retina, comprising a dispersion of nanoparticles in a liquid, wherein the nanoparticles have a specific gravity which is higher than that of the liquid and the individual refractive indices of the nanoparticles and the liquid are substantially similar to one another. The present invention also relates to a composition for use in the treatment of a detached retina, comprising a dispersion of silica nanoparticles in a liquid, a method and kit of parts for producing the compositions and a method of treating a detached retina.
    Type: Application
    Filed: December 3, 2008
    Publication date: December 23, 2010
    Applicant: ULIVE ENTERPRISES LIMITED
    Inventors: Michael Garvey, Rachel Lucinda Williams, David Sai Hung Wong