Abstract: The invention relates first to a camera module for a microscope. The camera module comprises an optical interface for inserting the camera module into an imaging beam path of the microscope, which imaging beam path images a nominal intermediate image. Furthermore, the camera module comprises an electronic image converter and a functional element for changing an intermediate image plane, which functional element is arranged in a beam path of the camera module between the optical interface and the image converter. The camera module also comprises a first optical assembly having an optical power, which first optical assembly is arranged in the beam path between the optical interface and the image converter. According to the invention, a distance between the functional element and the optical interface along the beam path or a distance between the first optical assembly and the optical interface along the beam path can be changed. The invention further relates to a method for operating the camera module.

Abstract: A localization microscope including an imaging device emitting sample light from a focal plane into an image plane, including an optical-manipulation device for depth-dependent influencing of a point-spread function of the imaging and influencing the point-spread function of the imaging such that a point emitter is imaged in the image plane into an image that is rotationally asymmetrically distorted. A form of the distortion depends on the location of the point emitter with respect to the focal plane and a wavelength of the sample light. The optical manipulation device includes first and second anisotropy elements that anisotropically influence the point spread function to produce rotational asymmetry of the point emitter image. The elements are arranged one behind the other in the imaging direction, with anisotropy axes at an angle to one another. Both elements have differing neutral wavelength at which they do not anisotropically influence the point spread.

Abstract: An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane and the illumination is implemented in the plane. A detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective has an illumination correction element. A meniscus lens is located between the specimen carrier and the illumination and detection objectives being arranged both in the illumination beam path and in the detection beam path.

Abstract: The invention relates first to a camera module for a microscope. The camera module comprises an optical interface for inserting the camera module into an imaging beam path of the microscope, which imaging beam path images a nominal intermediate image. Furthermore, the camera module comprises an electronic image converter and a functional element for changing an intermediate image plane, which functional element is arranged in a beam path of the camera module between the optical interface and the image converter. The camera module also comprises a first optical assembly having an optical power, which first optical assembly is arranged in the beam path between the optical interface and the image converter. According to the invention, a distance between the functional element and the optical interface along the beam path or a distance between the first optical assembly and the optical interface along the beam path can be changed. The invention further relates to a method for operating the camera module.

Abstract: A localization microscope comprising an imaging device emitting sample light from a focal plane into an image plane, comprising an optical-manipulation device for depth-dependent influencing of a point-spread function of the imaging and influencing the point-spread function of the imaging such that a point emitter is imaged in the image plane into an image that is rotationally asymmetrically distorted. A form of the distortion depends on the location of the point emitter with respect to the focal plane and a wavelength of the sample light. The optical manipulation device comprises first and second anisotropy elements that anisotropically influence the point spread function to produce rotational asymmetry of the point emitter image. The elements are arranged one behind the other in the imaging direction, with anisotropy axes at an angle to one another. Both elements have differing neutral wavelength at which they do not anisotropically influence the point spread.

Abstract: An optical device comprises a light source and a detector, and also a sample holder, which is configured to fix an object in the optical path of light. A scanning optical unit is configured, for a multiplicity of scanning positions, in each case selectively to direct light incident from different angular ranges from the object onto the detector. On the basis of a three-dimensional light field represented by corresponding measurement data of the multiplicity of scanning positions, a spatially resolved imaging of the object is generated, said imaging comprising at least two images from different object planes of the object.

Abstract: A laser scanning microscope having a laser source for fluorescence excitation; a scanning mirror arrangement for scanning a specimen and scanning optics for generating a diffraction-limited reference image plane as a first intermediate image plane; an optical system for demagnified imaging of the reference plane in a second intermediate image plane; an axially slideable mirror in the second intermediate image plane; a beam splitter arrangement between the reference image plane and the optical system; and a tube lens and a first microscope objective for imaging of the reference image plane into a specimen. The imaging of the image is effected with a magnification of M?n/n? and/or a magnification of the second intermediate image plane into the specimen according to the equation M = y ? y = n n ? ? ? , with |?|?1, and/or the focal plane of the laser deviates from the axial position of the axially movable mirror across its scanning area in the second intermediate image plane.

Abstract: An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen situated on a specimen carrier in a specimen region of a specimen plane via an illumination beam path. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane, in respect of which the specimen carrier is aligned, and the illumination is implemented in the plane. Further, a detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective comprises an illumination correction element arranged in the beam path and/or a detection correction element.

Abstract: The invention relates to a microscope having an illumination beam path with wide field illumination of a sample and a first detection beam path having a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image divider assembly for a microscope. In order to lengthen the optical path length, at least a second part of the detection light coming from the sample is masked out of the detection beam path and, via deflection means belonging to the detection beam path, is led into a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is applied to at least two partial regions beside one another on the surface receiver.

Abstract: An optical transmission system configured to image a selected region of a sample arranged in a first medium in an object plane on or in a sample carrier, which includes plane-parallel plate, from the object plane into an intermediate image plane in a second medium. The plane-parallel plate is located between the optical transmission system and the sample during the imaging. The object plane and the intermediate image plane form an angle between 0° and 90° with an optical axis of the transmission system. The optical transmission system is positioned relative to region of the sample such that the sample is located within the focal length of the lens of the optical transmission system closest to the sample. The intermediate image plane and the object plane are located on the same side of the optical transmission system, and the intermediate image is a virtual image.

Abstract: An optical device comprises a light source and a detector, and also a sample holder, which is configured to fix an object in the optical path of light. A scanning optical unit is configured, for a multiplicity of scanning positions, in each case selectively to direct light incident from different angular ranges from the object onto the detector. On the basis of a three-dimensional light field represented by corresponding measurement data of the multiplicity of scanning positions, a spatially resolved imaging of the object is generated, said imaging comprising at least two images from different object planes of the object.

Abstract: An optical transmission system configured to image a selected region of a sample arranged in a first medium in an object plane on or in a sample carrier, which includes plane-parallel plate, from the object plane into an intermediate image plane in a second medium. The plane-parallel plate is located between the optical transmission system and the sample during the imaging. The object plane and the intermediate image plane form an angle between 0° and 90° with an optical axis of the transmission system. The optical transmission system is positioned relative to region of the sample such that the sample is located within the focal length of the lens of the optical transmission system closest to the sample. The intermediate image plane and the object plane are located on the same side of the optical transmission system, and the intermediate image is a virtual image.

Abstract: The invention relates to a microscope having an illumination beam path with wide field illumination of a sample and a first detection beam path having a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image divider assembly for a microscope. In order to lengthen the optical path length, at least a second part of the detection light coming from the sample is masked out of the detection beam path and, via deflection means belonging to the detection beam path, is led into a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is applied to at least two partial regions beside one another on the surface receiver.

Abstract: The invention relates to a microscope having an illumination beam path with wide field illumination of a sample and a first detection beam path having a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image divider assembly for a microscope. In order to lengthen the optical path length, at least a second part of the detection light coming from the sample is masked out of the detection beam path and, via deflection means belonging to the detection beam path, is led into a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is applied to at least two partial regions beside one another on the surface receiver.

Abstract: A microscope including an illumination device providing a light sheet illuminating a sample region, said sheet having a planar extension along an illumination axis of an illumination beam path and a transverse axis lying normal to the illumination axis. A detection device detects light emitted from the sample region on a detection axis the illumination axis and detection axis as well as the transverse axis and the detection axis being oriented relative each other at an angle unequal zero. The detection device has a detection lens system arranged in the detection beam path and splitting means for splitting the detection beam path into two beam sub-paths. A dichroic beam splitter in the infinity region of the surface detectors is about 3 mm thick. Wobble plate(s) disposed orthogonal to each other relative to the detection axis arranged in one of the two beam sub-paths so measured values can be automatically superimposed.

Abstract: Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction valu

Abstract: A family of microscopes include an illumination device which produces a planar light sheet along an illumination axis of an illumination beam path and a transverse axis normal to the illumination axis. A detection device detects light emitted from the sample region along an axis of detection of a detection beam path. The illumination and detection axes as well as the transverse axis and the axis of detection being oriented relative each other at an angle unequal to zero. A light sheet generator also produces rotationally symmetrical light and includes structure and control for rapidly scanning the sample region along the transverse axis. The illumination device includes a second light sheet generator having a first astigmatically active optical element with at least one astigmatic lens for producing a static sheet of light. Selection elements used to select either the first or the second light sheet or both together to produce the sheet of light.

Abstract: A laser scanning microscope having a laser light source for fluorescence excitation, in particular a short pulse light source for multiphoton excitation; a scanning mirror array for scanning illumination of a specimen and a scanning optics for the generation of a diffraction-limited reference image plane as a first intermediate image plane; an optical system, preferably with a high numerical aperture, for the preferably demagnified imaging of the reference plane in a second intermediate image; an axially slideable mirror in the second intermediate image plane; a beam splitter array between the reference image plane and said optical system; and a tube lens and a first microscope objective for aberration-free imaging of the reference image plane in a specimen.

Abstract: Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction valu

Abstract: To increase the sensitivity of detector arrangements, it is known that light deflection elements in the form of a line arrays having spherical elements may be used to focus incident light onto light-sensitive regions of the detector. Manufacturing such line arrays is complex and cost intensive, especially in small lot numbers. The increased sensitivity of the detector array can be achieved easily and inexpensively by using a novel light deflection element. The detector arrangement therefore has a light deflection element having light entrance surfaces, deflecting incident light by refraction onto light-sensitive regions of the detector. Light entrance surfaces of the light deflection element are inclined with respect to one another and are designed as planar surfaces. The detector arrangement is suitable in particular for detection of light emanating from a specimen in a microscope, preferably in a laser-scanning microscope.