Patents by Inventor Michael Haeck

Michael Haeck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10988394
    Abstract: Techniques for controlled aeration (140) of wastewater (190) include determining a first aeration intensity for a first aeration interval and a different second aeration intensity for a second aeration interval (225) based on a current energy price (215), a predicted energy price (221), and a regulatory surveillance period (201) during which a regulated critical parameter is monitored for regulatory compliance. Wastewater is aerated at the first aeration intensity for the first aeration interval; and at the second aeration intensity for the second aeration interval. The first aeration interval is short compared to the regulatory surveillance period, the second aeration interval is short compared to the regulatory surveillance period and does not overlap the first aeration interval, and the first aeration intensity is less than the second aeration intensity.
    Type: Grant
    Filed: November 19, 2015
    Date of Patent: April 27, 2021
    Assignee: HACH LANGE GMBH
    Inventors: Michael Häck, Jens Plumeyer, Christian Artmann
  • Publication number: 20170313606
    Abstract: Techniques for controlled aeration (140) of wastewater (190) include determining a first aeration intensity for a first aeration interval and a different second aeration intensity for a second aeration interval (225) based on a current energy price (215), a predicted energy price (221), and a regulatory surveillance period (201) during which a regulated critical parameter is monitored for regulatory compliance. Wastewater is aerated at the first aeration intensity for the first aeration interval; and at the second aeration intensity for the second aeration interval. The first aeration interval is short compared to the regulatory surveillance period, the second aeration interval is short compared to the regulatory surveillance period and does not overlap the first aeration interval, and the first aeration intensity is less than the second aeration intensity.
    Type: Application
    Filed: November 19, 2015
    Publication date: November 2, 2017
    Inventors: Michael Häck, Jens Plumeyer, Christian Artmann
  • Publication number: 20150051844
    Abstract: A method for determining a condition indicator of an apparatus includes providing an apparatus configured to measure at least two different technical parameters. A respective parameter value is determined for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters. A respective deviation value of each of the parameter values is determined with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value is determined from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.
    Type: Application
    Filed: May 30, 2014
    Publication date: February 19, 2015
    Applicant: HACH LANGE GMBH
    Inventors: TOON STREPPEL, TORSTEN SEEHAUS, ULRICH SCHMITZ, MANFRED BATTEFELD, FRANK THOMAS, MICHAEL KUSSMANN, MICHAEL HAECK
  • Patent number: 8886472
    Abstract: A method for determining a condition indicator of an apparatus includes providing an apparatus configured to measure at least two different technical parameters. A respective parameter value is determined for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters. A respective deviation value is determined for each of the parameter values with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value is determined from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.
    Type: Grant
    Filed: June 18, 2013
    Date of Patent: November 11, 2014
    Assignee: Hach Lange GmbH
    Inventors: Toon Streppel, Torsten Seehaus, Ulrich Schmitz, Manfred Battefeld, Frank Thomas, Michael Kussmann, Michael Haeck
  • Publication number: 20130282303
    Abstract: A method for determining a condition indicator of an apparatus includes providing an apparatus configured to measure at least two different technical parameters. A respective parameter value is determined for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters. A respective deviation value is determined for each of the parameter values with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value is determined from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.
    Type: Application
    Filed: June 18, 2013
    Publication date: October 24, 2013
    Applicant: HACH LANGE GMBH
    Inventors: TOON STREPPEL, Torsten Seehaus, Ulrich Schmitz, Manfred Battefeld, Frank Thomas, Michael Kussmann, Michael Haeck
  • Patent number: 8510064
    Abstract: A method for determining a condition indicator of a water analysis apparatus includes determining a respective parameter value for each of at least two different technical parameters of the water analysis apparatus. A respective deviation value of each of the parameter values is determined with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value from each of the deviation values is determined using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.
    Type: Grant
    Filed: March 5, 2010
    Date of Patent: August 13, 2013
    Assignee: Hach Lange GmbH
    Inventors: Toon Streppel, Torsten Seehaus, Ulrich Schmitz, Manfred Battefeld, Frank Thomas, Michael Kussmann, Michael Haeck
  • Patent number: D941335
    Type: Grant
    Filed: December 22, 2020
    Date of Patent: January 18, 2022
    Assignee: HACH COMPANY
    Inventors: Amandine Fabrello Lumbroso, Silke Brubaker, Erik Nievelstein, Loïc André Michel Berthollet, Frederik Nordahl, Michael Küppers, Michael Haeck, Christian Schröder, Manfred Herbert Battefeld, Makenzie Jo Dowdell, Aaron Austin Anson, Sylvia Haustein, Barbara Springer
  • Patent number: D941336
    Type: Grant
    Filed: December 22, 2020
    Date of Patent: January 18, 2022
    Assignee: HACH COMPANY
    Inventors: Amandine Fabrello Lumbroso, Silke Brubaker, Erik Nievelstein, Loïc André Michel Berthollet, Frederik Nordahl, Michael Küppers, Michael Haeck, Christian Schröder, Manfred Herbert Battefeld, Makenzie Jo Dowdell, Aaron Austin Anson, Sylvia Haustein, Barbara Springer