Patents by Inventor Michael Haeck

Michael Haeck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240385580
    Abstract: An aspect of the invention relates to a method for verifying the plausibility of sensor information sensed by a sensor device associated with a plant process, in particular a water treatment process and/or a wastewater treatment process, wherein the sensor information relates to the plant process, the method comprising: receiving (S100), by a control unit, the sensor information; performing (S110), by the control unit, a verification model, the verification model determining an expected sensor information which the sensor device shall provide, wherein the verification model determines the expected sensor information based on at least one other information related to the plant process and having a relationship to the sensor information; comparing the expected sensor information with the received sensor information; and upon determining (S120) that the sensor information deviates from the expected sensor information, outputting (S130), by the control unit, a verification signal.
    Type: Application
    Filed: December 13, 2021
    Publication date: November 21, 2024
    Inventors: Rainer Dörken, Bert Pape, Jochen Simon, Sabine Warnemünde, Steven E. Wood, Thomas Thiel, Michael Haeck, Vishnu Rajasekharan, Corey Salzer, Dan Kroll, Sean Graebner
  • Publication number: 20150051844
    Abstract: A method for determining a condition indicator of an apparatus includes providing an apparatus configured to measure at least two different technical parameters. A respective parameter value is determined for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters. A respective deviation value of each of the parameter values is determined with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value is determined from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.
    Type: Application
    Filed: May 30, 2014
    Publication date: February 19, 2015
    Applicant: HACH LANGE GMBH
    Inventors: TOON STREPPEL, TORSTEN SEEHAUS, ULRICH SCHMITZ, MANFRED BATTEFELD, FRANK THOMAS, MICHAEL KUSSMANN, MICHAEL HAECK
  • Patent number: 8886472
    Abstract: A method for determining a condition indicator of an apparatus includes providing an apparatus configured to measure at least two different technical parameters. A respective parameter value is determined for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters. A respective deviation value is determined for each of the parameter values with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value is determined from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.
    Type: Grant
    Filed: June 18, 2013
    Date of Patent: November 11, 2014
    Assignee: Hach Lange GmbH
    Inventors: Toon Streppel, Torsten Seehaus, Ulrich Schmitz, Manfred Battefeld, Frank Thomas, Michael Kussmann, Michael Haeck
  • Publication number: 20130282303
    Abstract: A method for determining a condition indicator of an apparatus includes providing an apparatus configured to measure at least two different technical parameters. A respective parameter value is determined for each of the at least two different technical parameters of the apparatus using at least one sensor configured to determine a respective parameter value for each of the at least two different technical parameters. A respective deviation value is determined for each of the parameter values with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value is determined from each of the deviation values using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.
    Type: Application
    Filed: June 18, 2013
    Publication date: October 24, 2013
    Applicant: HACH LANGE GMBH
    Inventors: TOON STREPPEL, Torsten Seehaus, Ulrich Schmitz, Manfred Battefeld, Frank Thomas, Michael Kussmann, Michael Haeck
  • Patent number: 8510064
    Abstract: A method for determining a condition indicator of a water analysis apparatus includes determining a respective parameter value for each of at least two different technical parameters of the water analysis apparatus. A respective deviation value of each of the parameter values is determined with respect to an associated respective parameter reference value for each of the technical parameters. A respective deviation relevance value from each of the deviation values is determined using a respective parameter-specific deviation relevance function for each of the parameter values, the parameter-specific deviation relevance functions being different from each other. Using an indicator function, a condition indicator is calculated from the determined deviation relevance values.
    Type: Grant
    Filed: March 5, 2010
    Date of Patent: August 13, 2013
    Assignee: Hach Lange GmbH
    Inventors: Toon Streppel, Torsten Seehaus, Ulrich Schmitz, Manfred Battefeld, Frank Thomas, Michael Kussmann, Michael Haeck
  • Patent number: D941335
    Type: Grant
    Filed: December 22, 2020
    Date of Patent: January 18, 2022
    Assignee: HACH COMPANY
    Inventors: Amandine Fabrello Lumbroso, Silke Brubaker, Erik Nievelstein, Loïc André Michel Berthollet, Frederik Nordahl, Michael Küppers, Michael Haeck, Christian Schröder, Manfred Herbert Battefeld, Makenzie Jo Dowdell, Aaron Austin Anson, Sylvia Haustein, Barbara Springer
  • Patent number: D941336
    Type: Grant
    Filed: December 22, 2020
    Date of Patent: January 18, 2022
    Assignee: HACH COMPANY
    Inventors: Amandine Fabrello Lumbroso, Silke Brubaker, Erik Nievelstein, Loïc André Michel Berthollet, Frederik Nordahl, Michael Küppers, Michael Haeck, Christian Schröder, Manfred Herbert Battefeld, Makenzie Jo Dowdell, Aaron Austin Anson, Sylvia Haustein, Barbara Springer