Patents by Inventor Michael Holocher

Michael Holocher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrical testing apparatus for testing an electrical test sample and electrical testing method
    Patent number: 9116175
    Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate which is electrically connected via a contact spacing converter to a test head. The conductor substrate is mechanically connected to a first stiffening device and is thereby stiffened. At least one spacer which penetrates the conductor substrate is mechanically connected to the contact spacing converter and is held on the first stiffening device via at least one tilt adjusting arrangement.
    Type: Grant
    Filed: January 24, 2012
    Date of Patent: August 25, 2015
    Assignee: FEINMETALL GMBH
    Inventors: Gunther Boehm, Berislav Kopilas, Sylvia Ehrler, Michael Holocher
  • Electrical testing apparatus with a tilt adjusting arrangement for testing an electrical test sample and electrical testing method
    Patent number: 8217675
    Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate (12) which is electrically connected via a contact spacing converter (7) to a test head (2). The conductor substrate is mechanically connected to a first stiffening device (26) and is thereby stiffened. At least one spacer (30) which penetrates the conductor substrate (12) is mechanically connected to the contact spacing converter (7) and is held on the first stiffening device (26) via at least one tilt adjusting arrangement (34).
    Type: Grant
    Filed: July 21, 2009
    Date of Patent: July 10, 2012
    Assignee: Feinmetall GmbH
    Inventors: Gunther Boehm, Berislav Kopilas, Sylvia Ehrler, Michael Holocher
  • ELECTRICAL TESTING APPARATUS FOR TESTING AN ELECTRICAL TEST SAMPLE AND ELECTRICAL TESTING METHOD
    Publication number: 20120119774
    Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate which is electrically connected via a contact spacing converter to a test head. The conductor substrate is mechanically connected to a first stiffening device and is thereby stiffened. At least one spacer which penetrates the conductor substrate is mechanically connected to the contact spacing converter and is held on the first stiffening device via at least one tilt adjusting arrangement.
    Type: Application
    Filed: January 24, 2012
    Publication date: May 17, 2012
    Inventors: Gunther BOEHM, Berislav KOPILAS, Sylvia EHRLER, Michael HOLOCHER
  • ELECTRICAL TESTING APPARATUS FOR TESTING AN ELECTRICAL TEST SAMPLE AND ELECTRICAL TESTING METHOD
    Publication number: 20100019788
    Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate (12) which is electrically connected via a contact spacing converter (7) to a test head (2). The conductor substrate is mechanically connected to a first stiffening device (26) and is thereby stiffened. At least one spacer (30) which penetrates the conductor substrate (12) is mechanically connected to the contact spacing converter (7) and is held on the first stiffening device (26) via at least one tilt adjusting arrangement (34).
    Type: Application
    Filed: July 21, 2009
    Publication date: January 28, 2010
    Applicant: FEINMETALL GmbH
    Inventors: Gunther Boehm, Berislav Kopilas, Sylvia Ehrler, Michael Holocher
  • TEST DEVICE FOR ELECTRICAL TESTING OF A UNIT UNDER TEST, AS WELL AS A METHOD FOR PRODUCTION OF A TEST DRIVE
    Publication number: 20080172870
    Abstract: The invention relates to a test device for electrical testing of a unit under test, in particular for the testing of wafers, having a contact head which can be associated with the unit under test and is provided with contact elements which are in the form of pins and form a contact pin arrangement, and having an electrical connecting apparatus, which has contact surfaces which make a touching contact with those ends of the contact elements which face away from the test plane accommodating the unit under test. The invention provides that the contact surfaces are on axial contact elements which extend in the axial direction and are in the form of mechanically processed contact surfaces.
    Type: Application
    Filed: September 13, 2007
    Publication date: July 24, 2008
    Applicant: FEINMETALL GMBH
    Inventors: Gunther BOHM, Michael HOLOCHER
  • Test device for electrical testing of a unit under test, as well as a method for production of a test drive
    Publication number: 20050264312
    Abstract: The invention relates to a test device for electrical testing of a unit under test, in particular for the testing of wafers, having a contact head which can be associated with the unit under test and is provided with contact elements which are in the form of pins and form a contact pin arrangement, and having an electrical connecting apparatus, which has contact surfaces which make a touching contact with those ends of the contact elements which face away from the test plane accommodating the unit under test. The invention provides that the contact surfaces are on axial contact elements which extend in the axial direction and are in the form of mechanically processed contact surfaces.
    Type: Application
    Filed: April 8, 2005
    Publication date: December 1, 2005
    Inventors: Gunther Bohm, Michael Holocher