Abstract: A method and a system for calibrating a measuring arrangement on the basis of a 16-term error model determines a matrix (A) with measured scattering parameters (Sm) from different calibration standards (3) and with associated actual scattering parameters (Sa) of the calibration standards (3) and determines linear-in-T system errors (Ti) for the calibration of a network analyzer (1) by solving a linear equation system with the determined matrix (A). To solve the linear equation system, a first and a second linear-in-T system error (k, p) are freely selected in each case. With use of reciprocal calibration standards, the determined linear-in-T system errors are weighted with the freely selected first linear-in-T system error (Ti) or with a correct second linear-in-T system error pkor(k)) dependent upon the first linear-in-T system error (k).

Abstract: A method and a system for calibrating a measuring arrangement on the basis of a 16-term error model determines a matrix (A) with measured scattering parameters (Sm) from different calibration standards (3) and with associated actual scattering parameters (Sa) of the calibration standards (3) and determines linear-in-T system errors ({tilde over (T)}i) for the calibration of a network analyzer (1) by solving a linear equation system with the determined matrix (A). To solve the linear equation system, a first and a second linear-in-T system error (k,p) are freely selected in each case. With use of reciprocal calibration standards, the determined linear-in-T system errors are weighted with the freely selected first linear-in-T system error ({tilde over (T)}i) or with a correct second linear-in-T system error (pkor(k) dependent upon the first linear-in-T system error (k).