Abstract: A method and system for verifying performance of an array by simulating operation of edge cells in a full array model reduces the computation time required for complete design verification. The edge cells of the array (or each subarray if the array is partitioned) are subjected to a timing simulation while the center cells of the array are logically disabled, but remain in the circuit model, providing proper loading. Additional cells are specified for simulation if calculations indicate a worst-case condition due to a non-edge cell. Wordline arrivals are observed to determine worst-case rows for selection. For write operations, the difference between the wordline edges and the data edges is used to locate any non-edge “outlier” cells. For read operations, the wordline delays are summed with the bitline delays determined from edge column data to locate any outliers.

Abstract: A method and apparatus for using a 2:1 MUX to control read access, data bypass, and page size bypass in a memory array. The mechanism of the present invention reduces the 3:1 MUX normally required to manage these three functions to a 2:1 MUX.

Abstract: A content addressable memory (CAM) system is disclosed including a dual mode cycle boundary latch (CBL). The CBL includes a master latch coupled to a slave latch. The CBL operates in a high speed functional mode and a lower speed test mode. In the high speed functional mode, input data bypasses the master latch and transports directly to the CBL output via the slave latch. The CBL effectively removes the master latch from the circuit in the high speed functional mode. However, in the lower speed test mode, input test data travels via both the master and slave latches to the CBL output.

Abstract: An apparatus and method is provided that combines both self test and functional features in a single latch circuit, which may be used with an SRAM array and is usefully embodied as an L1-L2 latch. During partial writes from an SRAM array, data bits of unknown state are inhibited from entering the latch circuit, while data for testing is allowed to enter. In one useful embodiment of the invention the latch circuit is used with a mode control that provides mode select signals to operate the latch circuit in one of a plurality of modes, including at least full write and partial write modes. The latch circuit further includes a data hold circuit for selectively receiving and storing data coupled to the latch circuit.

Abstract: A dynamic-static logical control element for signaling an interval between the end of a control signal and a logical evaluation provides a compact circuit for blocking the indication of a non-evaluated state of a dynamic logic gate until a control signal has ended. The control signal is connected to a precharge input of the control element and a summing node is connected to one or more evaluation trees and to the control element output via an inverter. The inverter is connected to an override circuit that forces the output of the control element to a state opposite the precharge state until the control signal has ended. The output of the control element then assumes a state corresponding to the precharge state until an evaluation occurs. The control element output thus produces a window signal indicating the interval between the end of the control signal and the evaluation.