Abstract: A device for determining a height of soil above a structure buried below a soil bed includes a sensor assembly comprising a total stress pressure sensor for transmitting a first signal indicating a total pressure, a pore water pressure sensor located proximate to the total stress pressure sensor, the pore water pressure sensor for transmitting a second signal indicating a fluid pressure, a sensor module configured to receive the first and the second signals, determine a difference between the first signal and the second signal, based on the difference between the first signal and the second signal, determine a height of soil above the sensor assembly, and transmit a third signal indicating the height of soil to an external device.

Abstract: An example system includes an image capture portion to provide an image of a medical implant; an identification portion coupled to the image capture portion; and a determination portion to facilitate identification of the medical implant, the determination portion including at least one of (a) a crowd source portion to survey a set of users, wherein results of the survey are provided to the identification portion; (b) a decision-based portion to perform decisions based on features of the image of the medical implant and to provide results of the decisions to the identification portion; or (c) a database-based portion to select information from a database of information related to medical implants, the selected information being determined to correspond to the image of the medical implant, wherein the selected information is to be provided to the identification portion.

Abstract: A device for determining a height of soil above a structure buried below a soil bed includes a sensor assembly comprising a total stress pressure sensor for transmitting a first signal indicating a total pressure, a pore water pressure sensor located proximate to the total stress pressure sensor, the pore water pressure sensor for transmitting a second signal indicating a fluid pressure, a sensor module configured to receive the first and the second signals, determine a difference between the first signal and the second signal, based on the difference between the first signal and the second signal, determine a height of soil above the sensor assembly, and transmit a third signal indicating the height of soil to an external device.

Abstract: A power supply circuit apparatus, and method for controlling the same, includes multiple power supplies connected to a load via power channels and a controller. The controller detects a short circuit in the power supply based on a measured load input current.

Abstract: A structure and method of forming same, comprising a low threading density alloy graded layer, deposited according to a deposition temperature profile in correspondence with increasing alloy composition. In one embodiment, a first substantially relaxed alloy graded layer is deposited while varying a deposition temperature according to a first temperature profile. A second substantially relaxed alloy graded layer is deposited over the first graded layer while varying a deposition temperature according to a second temperature profile. Preferably, the minimum signed rate of change of the second temperature profile is less than the maximum signed rate of change of the first temperature profile.

Abstract: An aperture probe in the form of a tapered metal-coated glass pipette having a thin tip provides near-field access to a sample for near-field microscopy. The pipette is formed from a glass tube drawn down to a fine tip, and then coated, as by evaporation, by a metallic layer. The central opening of the tube is drawn down to a submicron diameter, and the metal coating is formed with an aperture at that opening. Aperture diameters down to 500 Angstroms diameter are provided. Also disclosed is a microscope utilizing the pipette aperture for scanning near-field imaging of samples.

Abstract: An optical system for determining and reproducing spatial separation of features in the range of 80.ANG. to 2500.ANG. for optical microscopy and lithography using visible light, the system being independent of the wavelength of the incident light. An aperture mask is provided having at least one aperture of between about 80.ANG. and 2500.ANG. diameter. The mask may be used in optical microscopy to view objects with a high degree of resolution by placing the mask within the near field of light emanating from a sample to be viewed. The mask may also be used for high resolution optical lithography by placing a resist material within the near field of light passing through the mask.

Abstract: An optical system for determining and reproducing spatial separation of features in the range of 80 .ANG. to 2500 .ANG. for optical microscopy and lithography using visible light, the system being independent of the wavelength of the incident light.An aperture mask is provided having at least one aperture of between about 80 .ANG. and 2500 .ANG. diameter. The mask may be used in optical microscopy to view objects with a high degree of resolution by placing the mask within the near field of light emanating from a sample to be viewed. The mask may also be used for high resolution optical lithography by placing a resist material within the near field of light passing through the mask.