Patents by Inventor Michael J. Borsch

Michael J. Borsch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7889512
    Abstract: A technique for observing signaling on the traces between ICs on a PC board without introducing significant signal degradation is provided. A route-through connector footprint allows the use of a standard connector without the use of stub traces. The route-through connector footprint allows a standard connector to be introduced directly into the line traces routed between ICs. Because stub traces are not used, this technique for mechanical interconnection into the line traces on a PC board allows for a single board layout to be used for both test and production. Additionally, because stub traces are not used, signal quality is minimally impacted and testing can be performed at operational speeds improving the reliability of the test function. The use of a route-through connector footprint additionally saves PC board space and cost.
    Type: Grant
    Filed: October 11, 2002
    Date of Patent: February 15, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Michael J. Borsch, Steven R. Klassen, Sanjiv Lakhanpal
  • Patent number: 7890831
    Abstract: A system and method for testing a processor. The system includes a gold processor and a test processor, wherein the test processor is the device under test (DUT). The test processor and the gold processor are identical. A first memory is coupled to the gold processor by a first memory bus and a second memory, independent of the first, is coupled to the test processor by a second memory bus. The first and second memories are identical. A memory bus comparator coupled to the first and second memory buses compares memory bus signals generated by the gold and test processors, and selectively provide a first indication if a mismatch occurs. A peripheral bus comparator is also coupled to the gold and test processors, and compares downstream transactions generated by the gold and test processors and to provide a second indication if a peripheral bus comparison results in a mismatch.
    Type: Grant
    Filed: June 10, 2008
    Date of Patent: February 15, 2011
    Assignee: GLOBALFOUNDRIES Inc.
    Inventors: Michael L. Choate, Mark D. Nicol, Heather L. Hanson, Michael J. Borsch, Arthur M. Ryan, Chandrakant Pandya
  • Publication number: 20090307549
    Abstract: A system and method for testing a processor. The system includes a gold processor and a test processor, wherein the test processor is the device under test (DUT). The test processor and the gold processor are identical. A first memory is coupled to the gold processor by a first memory bus and a second memory, independent of the first, is coupled to the test processor by a second memory bus. The first and second memories are identical. A memory bus comparator coupled to the first and second memory buses compares memory bus signals generated by the gold and test processors, and selectively provide a first indication if a mismatch occurs. A peripheral bus comparator is also coupled to the gold and test processors, and compares downstream transactions generated by the gold and test processors and to provide a second indication if a peripheral bus comparison results in a mismatch.
    Type: Application
    Filed: June 10, 2008
    Publication date: December 10, 2009
    Inventors: Michael L. Choate, Mark D. Nicol, Heather L. Hanson, Michael J. Borsch, Arthur M. Ryan, Chandrakant Pandya