Patents by Inventor Michael J. Dorough
Michael J. Dorough has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20150005968Abstract: A mechanism for determining device participation in an energy management program is provided. The mechanism includes a network operations center (NOC) and a device accountability system. The (NOC) commands one or more energy control devices to change one or more states responsive to energy management program events, where the one or more energy control devices respond to the NOC to indicate changed one or more states. The device accountability system is coupled to the NOC, and intercepts commands/responses from/to the NOC, and creates a time-correlated model comprising program participation parameters for each of the one or more energy control devices, where the time-correlated model is based upon message characteristics for the commands/responses, device data for the one or more energy control devices, and NOC data corresponding to the energy management program events and operator intervention events.Type: ApplicationFiled: June 27, 2014Publication date: January 1, 2015Inventor: Michael J. DOROUGH
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Patent number: 7383147Abstract: An apparatus, method, system, and signal-bearing medium may provide multiple maps, which may include multiple probing sequences to be called upon at run-time based on statistical thresholds or other selected criteria. Each map may include a series of locations on a wafer, the tests to perform at each location, and the measured results of each test. A parametric test system may perform the test at the associated location on the wafer. If the statistical threshold is exceeded or the selected criteria is met, the current map may be abandoned in favor of a different map.Type: GrantFiled: January 30, 2006Date of Patent: June 3, 2008Assignee: Micron Technology, Inc.Inventors: Michael J. Dorough, Robert G. Blunn, Sergey A. Velichko
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Patent number: 7337088Abstract: An intelligent measurement modular semiconductor parametric test system comprises an engine control module. The engine control module is operable to communicate with a user via a user interface, and is further operable to communicate with and to control the state of at least one other module in the semiconductor parametric test system including pluggable modules. The engine control module is further operable to control test flow via a test monitor module based on data and control events received from an intelligent measurement module. Other modules in various embodiments comprise prober monitor modules.Type: GrantFiled: April 25, 2002Date of Patent: February 26, 2008Assignee: Micron Technology, Inc.Inventors: Sergey A. Velichko, Michael J. Dorough, Robert G. Blunn
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Patent number: 7165004Abstract: An apparatus, method, system, and signal-bearing medium may provide multiple maps, which may include multiple probing sequences to be called upon at run-time based on statistical thresholds or other selected criteria. Each map may include a series of locations on a wafer, the tests to perform at each location, and the measured results of each test. A parametric test system may perform the test at the associated location on the wafer. If the statistical threshold is exceeded or the selected criteria is met, the current map may be abandoned in favor of a different map.Type: GrantFiled: January 30, 2006Date of Patent: January 16, 2007Assignee: Micron Technology, Inc.Inventors: Michael J. Dorough, Robert G. Blunn, Sergey A. Velichko
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Patent number: 7162386Abstract: An apparatus, method, system, and signal-bearing medium may provide multiple maps, which may include multiple probing sequences to be called upon at run-time based on statistical thresholds or other selected criteria. Each map may include a series of locations on a wafer, the tests to perform at each location, and the measured results of each test. A parametric test system may perform the test at the associated location on the wafer. If the statistical threshold is exceeded or the selected criteria is met, the current map may be abandoned in favor of a different map.Type: GrantFiled: April 25, 2002Date of Patent: January 9, 2007Assignee: Micron Technology, Inc.Inventors: Michael J. Dorough, Robert G. Blunn, Sergey A. Velichko
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Patent number: 7139672Abstract: An apparatus, method, system, and signal-bearing medium may provide multiple maps, which may include multiple probing sequences to be called upon at run-time based on statistical thresholds or other selected criteria. Each map may include a series of locations on a wafer, the tests to perform at each location, and the measured results of each test. A parametric test system may perform the test at the associated location on the wafer. If the statistical threshold is exceeded or the selected criteria is met, the current map may be abandoned in favor of a different map.Type: GrantFiled: August 24, 2004Date of Patent: November 21, 2006Assignee: Micron Technology, Inc.Inventors: Michael J. Dorough, Robert G. Blunn, Sergey A. Velichko
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Patent number: 7010451Abstract: Methods, systems, and apparatuses provide dynamic creation and modification of wafer test maps. Test plans are defined for a testing session of a wafer lot. The test plan is associated with a number of seed map patterns. During a wafer lot testing session, test results are dynamically obtained and examined at run-time of a test. Moreover, the seed map patterns are overlaid on the test sites defined in the test plan. If the test result statistics are outside of defined threshold tolerance levels, then a new wafer test map is created or modified at run-time, according to corresponding seed map patterns. If seed map patterns are within the intersection of valid test sites, then seed map patterns are created at run-time.Type: GrantFiled: April 17, 2003Date of Patent: March 7, 2006Assignee: Micron Technology, Inc.Inventors: Michael J. Dorough, Robert M. Gravelle, Sergey A. Velichko
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Patent number: 6859760Abstract: A method and apparatus are described for remote semiconductor microscopy whereby video signals are broadcast from one or more microscopes to remote viewers. A live video signal is broadcast from the microscope over a network to remote personal computers located in the offices of process engineers. The office-based process engineers are provided real-time, or substantially real-time, views of a wafer, including peripheral views of the wafer outside cell array boundaries. The process engineer, in his office, can direct a technician, operating the microscope in the clean room complex, to display a desired cell region-of-interest with the microscope. As a result, the process engineers can more efficiently collaborate to solve process problems or even develop new process techniques.Type: GrantFiled: May 20, 2003Date of Patent: February 22, 2005Assignee: Micron Technology, Inc.Inventor: Michael J. Dorough
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Publication number: 20040210413Abstract: Methods, systems, and apparatuses provide dynamic creation and modification of wafer test maps. Test plans are defined for a testing session of a wafer lot. The test plan is associated with a number of seed map patterns. During a wafer lot testing session, test results are dynamically obtained and examined at run-time of a test. Moreover, the seed map patterns are overlaid on the test sites defined in the test plan. If the test result statistics are outside of defined threshold tolerance levels, then a new wafer test map is created or modified at run-time, according to corresponding seed map patterns. If seed map patterns are within the intersection of valid test sites, then seed map patterns are created at run-time.Type: ApplicationFiled: April 17, 2003Publication date: October 21, 2004Applicant: Micron Technology, Inc.Inventors: Michael J. Dorough, Robert M. Gravelle, Sergey A. Velichko
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Publication number: 20030212523Abstract: An apparatus, method, system, and signal-bearing medium may provide multiple maps, which may include multiple probing sequences to be called upon at run-time based on statistical thresholds or other selected criteria. Each map may include a series of locations on a wafer, the tests to perform at each location, and the measured results of each test. A parametric test system may perform the test at the associated location on the wafer. If the statistical threshold is exceeded or the selected criteria is met, the current map may be abandoned in favor of a different map.Type: ApplicationFiled: April 25, 2002Publication date: November 13, 2003Applicant: Micron Technology, Inc.Inventors: Michael J. Dorough, Robert G. Blunn, Sergey A. Velichko
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Publication number: 20030208340Abstract: A method and apparatus are described for remote semiconductor microscopy whereby video signals are broadcast from one or more microscopes to remote viewers. A live video signal is broadcast from the microscope over a network to remote personal computers located in the offices of process engineers. The office-based process engineers are provided real-time, or substantially real-time, views of a wafer, including peripheral views of the wafer outside cell array boundaries. The process engineer, in his office, can direct a technician, operating the microscope in the clean room complex, to display a desired cell region-of-interest with the microscope. As a result, the process engineers can more efficiently collaborate to solve process problems or even develop new process techniques.Type: ApplicationFiled: May 20, 2003Publication date: November 6, 2003Applicant: Micron Technology, Inc.Inventor: Michael J. Dorough
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Patent number: 6567770Abstract: A method and apparatus are described for remote semiconductor microscopy whereby video signals are broadcast from one or more microscopes to remote viewers. A live video signal is broadcast from the microscope over a network to remote personal computers located in the offices of process engineers. The office-based process engineers are provided real-time, or substantially real-time, views of a wafer, including peripheral views of the wafer outside cell array boundaries. The process engineer, in his office, can direct a technician, operating the microscope in the clean room complex, to display a desired cell region-of-interest with the microscope. As a result, the process engineers can more efficiently collaborate to solve process problems or even develop new process techniques.Type: GrantFiled: April 9, 2002Date of Patent: May 20, 2003Assignee: Micron Technology, Inc.Inventor: Michael J. Dorough
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Publication number: 20030028343Abstract: An intelligent measurement modular semiconductor parametric test system comprises an engine control module. The engine control module is operable to communicate with a user via a user interface, and is further operable to communicate with and to control the state of at least one other module in the semiconductor parametric test system including pluggable modules. The engine control module is further operable to control test flow via a test monitor module based on data and control events received from an intelligent measurement module. Other modules in various embodiments comprise prober monitor modules.Type: ApplicationFiled: April 25, 2002Publication date: February 6, 2003Applicant: Micron Technology, Inc.Inventors: Sergey A. Velichko, Michael J. Dorough, Robert G. Blunn
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Publication number: 20020152046Abstract: An automated semiconductor parametric test system has a control module that is operable to concurrently control both operation of semiconductor test equipment and operation of parametric test instrumentation. A state oscillator module is controlled by the control module, and further may be operated by the control module in some embodiments to control the state of other system modules in synchronization with other system events. A parametric test equipment module facilitates control of the semiconductor parametric test equipment, and a test instrumentation module facilitates control of the parametric test instrumentation.Type: ApplicationFiled: April 13, 2001Publication date: October 17, 2002Inventors: Sergey A. Velichko, Robert G. Blunn, Michael J. Dorough
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Publication number: 20020111775Abstract: A method and apparatus are described for remote semiconductor microscopy whereby video signals are broadcast from one or more microscopes to remote viewers. A live video signal is broadcast from the microscope over a network to remote personal computers located in the offices of process engineers. The office-based process engineers are provided real-time, or substantially real-time, views of a wafer, including peripheral views of the wafer outside cell array boundaries. The process engineer, in his office, can direct a technician, operating the microscope in the clean room complex, to display a desired cell region-of-interest with the microscope. As a result, the process engineers can more efficiently collaborate to solve process problems or even develop new process techniques.Type: ApplicationFiled: April 9, 2002Publication date: August 15, 2002Applicant: Micron Technology, Inc.Inventor: Michael J. Dorough
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Patent number: 6370487Abstract: A method and apparatus are described for remote semiconductor microscopy whereby video signals are broadcast from one or more microscopes to remote viewers. A live video signal is broadcast from the microscope over a network to remote personal computers located in the offices of process engineers. The office-based process engineers are provided real-time, or substantially real-time, views of a wafer, including peripheral views of the wafer outside cell array boundaries. The process engineer, in his office, can direct a technician, operating the microscope in the clean room complex, to display a desired cell region-of-interest with the microscope. As a result, the process engineers can more efficiently collaborate to solve process problems or even develop new process techniques.Type: GrantFiled: April 23, 1999Date of Patent: April 9, 2002Assignee: Micron Technology, Inc.Inventor: Michael J. Dorough