Abstract: Described herein is an apparatus for inspecting a component includes a first feature inspector with at least one wave transducer configured to inspect a first feature of the component. The first feature inspector further includes at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the first feature inspector relative to the first feature of the component. The apparatus further includes a second feature inspector with at least one wave transducer configured to inspect a second feature of the component. The second feature inspector further includes at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the second feature inspector relative to the second feature of the component.

Abstract: As described herein, a system for inspecting a component includes an ultrasonic inspection probe with a component surface interface, and a robotic device with an end effector coupled to the ultrasonic inspection probe. The robotic device is automatably controllable to move the ultrasonic inspection probe across a surface of the component. Additionally, the system includes an angle sensor subsystem coupled between the ultrasonic inspection probe and the end effector. The angle sensor subsystem is configured to operably detect an actual orientation of the end effector relative to a presently inspected portion of the surface of the component. The system includes a controller configured to receive orientation data from the angle sensor subsystem, the orientation data comprising the actual orientation of the end effector, compare the actual orientation to a desired orientation, and control the robotic device to adjust an orientation of the end effector to be in the desired orientation.

Abstract: As described herein, a system for inspecting a component includes an ultrasonic inspection probe with a component surface interface, and a robotic device with an end effector coupled to the ultrasonic inspection probe. The robotic device is automatably controllable to move the ultrasonic inspection probe across a surface of the component. Additionally, the system includes an angle sensor subsystem coupled between the ultrasonic inspection probe and the end effector. The angle sensor subsystem is configured to operably detect an actual orientation of the end effector relative to a presently inspected portion of the surface of the component. The system includes a controller configured to receive orientation data from the angle sensor subsystem, the orientation data comprising the actual orientation of the end effector, compare the actual orientation to a desired orientation, and control the robotic device to adjust an orientation of the end effector to be in the desired orientation.

Abstract: Described herein is an apparatus for inspecting a component includes a first feature inspector with at least one wave transducer configured to inspect a first feature of the component. The first feature inspector further includes at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the first feature inspector relative to the first feature of the component. The apparatus further includes a second feature inspector with at least one wave transducer configured to inspect a second feature of the component. The second feature inspector further includes at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the second feature inspector relative to the second feature of the component.

Abstract: Systems and methods of automatically adjusting brightness of a digital image are provided. A particular method includes accessing data including a first digital image and identifying text and background in the first digital image. The method also includes calculating an average pixel value exclusive of the text and the background for the first digital image. The method further includes adjusting a brightness setting associated with the first digital image based on the calculated average pixel value.

Abstract: Systems and methods of automatically adjusting brightness of a digital image are provided. A particular method includes accessing data including a first digital image and identifying text and background in the first digital image. The method also includes calculating an average pixel value exclusive of the text and the background for the first digital image. The method further includes adjusting a brightness setting associated with the first digital image based on the calculated average pixel value.

Abstract: Methodologies and systems to compare images with different levels of contrast are provided. Contrast is normalized between the images with different contrast levels and brightness is set. When normalizing contrast a derivative of gray level is determined for a first digital image having a first contrast level, and a derivative of gray level is determined for a second digital image having a second contrast level that is greater than the first contrast level. A ratio of the derivative of gray level for the first digital image to the derivative of gray level for the second digital image is determined, and the derivative of gray level for the first digital image is equalized with the derivative of gray level for the second digital image. Brightness of at least one image may be set automatically, such as by calculating an average pixel value excluding background and text, or manually.

Abstract: A system and method for inspecting a structure are provided. The system includes at least one non-destructive inspection (“NDI”) sensor capable of acquiring data indicative of at least a portion of the structure, and at least one positional sensor for acquiring positional data of the NDI sensor. The system also includes a mechanism operable to trigger the NDI sensor and/or the positional sensor to acquire data such that data indicative of the structure and the positional data are acquired at approximately the same time. The system further includes a movable arm carrying the sensors and movably attached to a base. The system includes a data acquisition system capable of communicating with the sensors such that the data acquisition system generates information indicative of at least a portion of the structure based on the data acquired by the sensors.

Abstract: An apparatus for the ultrasonic testing of internal areas of prefabricated composite assemblies as described. The composite assemblies have one or more internal areas formed therein. The apparatus includes at least one receive transducer, at least one transmit transducer, a vertical member, a support member slidably attached to the vertical member, a pair of substantially parallel hollow rods, and an ultrasonic testing system. Each rod comprises a transducer attachment end with receive transducers attached to the transducer attachment end of a first rod, and transmit transducers attached to the transducer attachment end of a second rod. The rods are slidably attached to the support member and manually movable with respect to a composite assembly to be tested. The ultrasonic testing system is coupled to the receive transducers through the first rod, and coupled to the transmit transducers through the second rod.

Abstract: A digital bond tester operating at frequencies in the kHz range and relying upon vibrational modes which can excite all or substantial portions of the test object.

Abstract: A digital bond tester operating at frequencies in the kHz range and relying upon vibrational modes which can excite all or substantial portions of the test object.

Abstract: A digital bond tester operating at frequencies in the kHz range and relying upon vibrational modes which can excite all or substantial portions of the test object.

Abstract: A device for detecting hidden cracks in a structure includes a hand-held probe which is moved over the surface of the structure. The probe is connected to a computer terminal which also has connected thereto a monitor and a keyboard. Changes in the eddy currents in the underlying structure generates impedance changes in the coils of the probe. The resulting voltage values produce an image of the underlying structure and any cracks therein on the computer monitor. The system utilizes a number of procedures to compensate for liftoff problems, imbalance between coil channels, and differences in impedance reference values.

Abstract: An improved, inexpensive machinist's clamp apparatus for holding metal workpieces during milling, drilling, shaping or the like is provided. The improved clamp apparatus has a generally "U"-shaped holder removeably affixed to the rear end of a step clamp to be used in conjunction with a step block. Through the "U"-bend is threadingly inserted a thumbscrew having a resilient endpiece affixed thereon, such as a spring or a rubber pad. When the step clamp is adjusted to the desired height on the step block, the thumb-screw is advanced such that the resilient end thereof is forced into tight holding contact with the rear vertical face of the step block, resulting in a combination of step clamp, step block and holder which is rigidly attached so that, when a workpiece is removed, the step clamp does not fall away from the step block, thereby avoiding unnecessary time delays in re-setup. Also provided is a new step block base holder for affixing the step block to the work surface.