Patents by Inventor Michael J Haley

Michael J Haley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Crosstalk test unit and method of calibration
    Patent number: 6297647
    Abstract: A test unit for measuring crosstalk in twisted pair cable. The test unit has an output signal balance (OSB) circuit that compensates for parasitic capacitance at its output terminals. The OSB circuit has a voltage controlled capacitance connected in circuit with each output terminal to control the effective capacitance between the output terminals and ground. The bias voltage for the variable capacitances is calibrated by a method in which the voltage for one of the variable capacitors is held constant while the voltage for the other capacitor is varied in voltage levels. A test signal frequency sweep is applied to the test unit output terminals. First and second voltage values are obtained and a final bias voltage value is calculated from using these two values.
    Type: Grant
    Filed: December 19, 2000
    Date of Patent: October 2, 2001
    Assignee: Agilent Technologies, Inc.
    Inventors: James W Kirk, Ron Cook, Michael J Haley, Fanny I Mlinarsky
  • Crosstalk test unit and method of calibration
    Patent number: 6198292
    Abstract: A test unit for measuring crosstalk in twisted pair cable. The test unit has an output signal balance (OSB) circuit that compensates for parasitic capacitance at its output terminals. The OSB circuit has a voltage controlled capacitance connected in circuit with each output terminal to control the effective capacitance between the output terminals and ground. The bias voltage for the variable capacitances is calibrated by a method in which the voltage for one of the variable capacitors is held constant while the voltage for the other capacitor is varied in voltage levels. A test signal frequency sweep is applied to the test unit output terminals. First and second voltage values are obtained and a final bias voltage value is calculated from using these two values.
    Type: Grant
    Filed: July 20, 1999
    Date of Patent: March 6, 2001
    Assignee: Agilent Technologies, Inc.
    Inventors: James W Kirk, Ron Cook, Michael J Haley, Fanny I Mlinarsky