Patents by Inventor Michael J. Iannucci

Michael J. Iannucci has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining defect depth in ferromagnetic structures based on magnetic flux leakage direction
    Patent number: 10551349
    Abstract: The system and method involve a permanent magnetization induction process for ferromagnetic structures, carried out to the saturation point to overwhelm the intrinsic magnetic fields in the structures. The permanent magnetization to overwhelm the intrinsic magnetization eliminates the effect of intrinsic fields for subsequent measurements. The permanent magnetization along a hollow structure yields two residual magnetic field components: axial and circumferential. The circumferential component varies as a function of depth. Thus, an analysis system can analyze defects and the depth of those defects by detecting the direction of the magnetic flux leakage around the defects. This can further be performed at a distance from the structures.
    Type: Grant
    Filed: August 8, 2017
    Date of Patent: February 4, 2020
    Assignee: The Charles Stark Draper Laboratory, Inc.
    Inventors: Michael J. Iannucci, William J. Trinkle, Arturo D. Gossage
  • Method for Determining Defect Depth in Ferromagnetic Structures Based on Magnetic Flux Leakage Direction
    Publication number: 20180038833
    Abstract: The system and method involve a permanent magnetization induction process for ferromagnetic structures, carried out to the saturation point to overwhelm the intrinsic magnetic fields in the structures. The permanent magnetization to overwhelm the intrinsic magnetization eliminates the effect of intrinsic fields for subsequent measurements. The permanent magnetization along a hollow structure yields two residual magnetic field components: axial and circumferential. The circumferential component varies as a function of depth. Thus, an analysis system can analyze defects and the depth of those defects by detecting the direction of the magnetic flux leakage around the defects. This can further be performed at a distance from the structures.
    Type: Application
    Filed: August 8, 2017
    Publication date: February 8, 2018
    Inventors: Michael J. Iannucci, William J. Trinkle, Arturo D. Gossage