Abstract: A system (100) for sensing a temperature of a light emitting diode (LED). The system may comprise an LED having a spectral output centered at a first wavelength, a first filter (104) that transitions from attenuation to transmission at about the first wavelength, and a second filter (106) that transitions from transmission to attenuation at about the first wavelength. The system may also comprise a first sensor (108) positioned to sense a first intensity of the LED through the first filter and a second sensor (110) positioned to sense a second intensity of the LED through the second filter. It will be appreciated that a single sensor may be substituted instead of the first and second sensors, provided that the single sensor is capable of selectively viewing the LED through the first and the second filters. The system may also comprise a computer (112) configured to derive a temperature of the LED considering the first intensity and the second intensity.

Abstract: A system (100) for sensing a temperature of a light emitting diode (LED). The system may comprise an LED having a spectral output centered at a first wavelength, a first filter (104) that transitions from attenuation to transmission at about the first wavelength, and a second filter (106) that transitions from transmission to attenuation at about the first wavelength. The system may also comprise a first sensor (108) positioned to sense a first intensity of the LED through the first filter and a second sensor (110) positioned to sense a second intensity of the LED through the second filter. It will be appreciated that a single sensor may be substituted instead of the first and second sensors, provided that the single sensor is capable of selectively viewing the LED through the first and the second filters. The system may also comprise a computer (112) configured to derive a temperature of the LED considering the first intensity and the second intensity.

Abstract: An optical assembly is disclosed that includes an illumination source, a detection sensor, a monitor sensor, and an optical piece having a first side adapted to face a sample. The optical piece defines an illumination channel extending from the illumination source toward the first side, a detection channel extending from the first side toward the detection sensor, and a monitor channel extending from the illumination channel toward the monitor sensor. A spectrophotometer is also disclosed that includes a circuit board, illumination source and one or more sensors. The circuit board includes an optically transparent region, wherein the illumination source is mounted and situated relative to a first surface of the circuit board, so as to direct light through the optically transparent region. Each sensor is mounted and situated relative to a second surface of the circuit board opposite the first surface.

Abstract: An optical system comprising an optical instrument and a processing unit. The optical instrument may comprise an illumination source and a sensor. The processing unit may comprise a data storage having stored thereon a characterization of the illumination source and a characterization of the sensor. The processing unit may also comprise a computer configured to calculate a system response of the illumination source and the receiving element considering the characterization of the illumination source and the characterization of the receiving element.

Abstract: Multiwavelength interferometric images have the phase and/or frequency of the illuminating light corrected by statistically analyzing the data, and adjusting the phase and/or frequency until a statistical measure reaches a criterion.

Abstract: The invention includes a system and method for reducing convection current effects in the optical path of a holographic interferometer system. The system preferably includes an enclosure for the optical path of the holographic interferometer system. In one embodiment, the system also includes a thermal element coupled to or located inside the enclosure. In another embodiment, the system also includes a gas located inside the enclosure, wherein the gas has a lower index of refraction than air. In another embodiment, the system also includes a fan coupled to or located inside the enclosure and adapted to circulate a gas inside the enclosure.

Abstract: The present invention includes a system and a method of determining the regularity of a surface of an object under examination. The method includes receiving a three-dimensional phase image of the surface including a plurality of pixels, wherein the phase image can result from a multiple wavelength interferometric analysis of the surface. The method can further include the steps of determining a relative height of the pixels in response to the phase image of the surface, creating a statistical map of the surface in response to the relative height of the pixels, and determining the regularity of the surface of the object under examination in response to the statistical map of the surface. The system includes an interferometric apparatus connected to a controller, wherein the controller is adapted to perform one or more functions similar to the method of the present invention.

Abstract: A method of interferometric imaging includes a) focusing an interference pattern of a surface of an object onto a digital micromirror device, b) reflecting interfered electromagnetic radiation from a first plurality of mirrors of the digital micromirror device onto a detector, and recording the integrated intensity of the reflected interferometric radiation, repeating step b) for a second plurality of mirrors, and computing the interference pattern of the surface of the object from the recorded integrated intensities.

Abstract: A method for creating an image of an object includes setting an illumination source at an initial nominal wavelength, illuminating an object with an illumination source to create interference patterns, changing the wavelength of the illumination source to drift from the nominal wavelength to a drift wavelength over a time period that causes a 360° shift in the phase angle of the interference patterns, sampling the interference patterns multiple times during the time period, reconstructing the phase angle of several points on the object, and creating an image of the object based on the sampled and reconstructed information.

Abstract: An interferometry method using a laser of nominally fixed—but unknown and changing—frequency and phase angle, for example, attributable to laser drift. The interference pattern is periodically sampled at a frequency considerably higher than the phase shift of the object. The wavelength is reconstructed from the sampled patterns using a correlation algorithm. The phase angle is determined using an n-bucket algorithm. After all of the complex information has been determined at all of the multiple wavelengths, the surface of the object is calculated using conventional interferometry techniques. Accordingly, laser drift—typically considered a negative attribute—is used positively.

Abstract: An interferometry method using a laser of nominally fixed—but unknown and changing—frequency and phase angle, for example, attributable to laser drift. The interference pattern is periodically sampled at a frequency considerably higher than the phase shift of the object. The wavelength is reconstructed from the sampled patterns using a correlation algorithm. The phase angle is determined using an n-bucket algorithm. After all of the complex information has been determined at all of the multiple wavelengths, the surface of the object is calculated using conventional interferometry techniques. Accordingly, laser drift—typically considered a negative attribute—is used positively.

Abstract: A color measurement instrument capable of measuring both the nonpolarized spectral response and the polarized spectral response of a sample on a single reading. The instrument includes a source of polarized light to illuminate the sample, and a detector for measuring the light reflected by the sample. A rotatable filter wheel is located between the sample and the detector. Nonpolarizing bandpass filters and polarizing bandpass filters are mounted in the wheel in a circular configuration. A drive mechanism rotates the wheel to automatically sequentially align each of the nonpolarizing filters and the polarizing filters with the detector, enabling the instrument to sample both nonpolarized data and polarized data on a single reading.