Abstract: An arrangement and method for analyzing the timing of events in a test system including a device under test and a plurality of test instruments connected together by one or more communication connections: time-stamps events in a test routine executed by the test instruments under control of a test program to generate time-stamped event data; communicates the time-stamped event data to a central processor; and processes the time-stamped data to output information about the timing of the events.

Abstract: A data processing system for use in a measuring instrument having a keyboard with a plurality of numeric keys for entering numeric values and a plurality of terminator keys for indicating the completion of the entering of numeric values. Each of the terminator keys has associated therewith a pair of reciprocal exponents to indicate the weight to be applied to the numeric value. A processor is coupled to the terminator keys for automatically selecting one of the reciprocal exponents. That selection is deduced by the processor from the nature of the calculation.

Abstract: A data processing system for processing measurement instrument data is disclosed having a processor for digitally manipulating the measurement instrument data, a memory for storing the digitally manipulated data, and a display. In one preferred embodiment, the display simultaneously displays side by side two traces of the data, so as to provide two independent side by side displays. The displays can be either real time or can be recovered from memory, and a plotter can be used to produce hard copy. In another embodiment, the display provides a trace of the data with a plurality of markers. The user can then choose one of the markers as a reference and the processor will automatically provide the value of the trace at each of the other markers relative to the value of the reference marker. In another embodiment, the system includes a keyboard having a value key for entering into the processor the current value of a marker on the data trace.

Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.

Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully coordinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.

Abstract: A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automation are provided. Contributions include fully corrdinated communications between subsystem modules; real time, two channel, precision vector measurements with complete, internal error correction; wide frequency capability from RF to millimeter bands; combined time and frequency domain analysis and display; measurements either in the swept or step frequency modes; and user definable test functions and calibration device sets.

Abstract: An input signal is mixed with sampling signals from oscillators which vary the frequency of the sampling signal from a first frequency to a second frequency. The resulting Intermediate Frequency (IF) signal is processed and digital values are stored in a memory in response thereto. Waveforms are then displayed which correspond to these frequency and amplitude values. Various input and display circuits facilitate the display and interpretation of these waveforms.