Patents by Inventor Michael J. Sharpes

Michael J. Sharpes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Modular design for an integrated circuit testing apparatus
    Patent number: 6433570
    Abstract: A compact and modularly designed apparatus for testing and burning-in semiconductor devices comprises first and second power supplies and the use of direct current (DC) to DC converters. The first power supply provides a high voltage low amperage power source to drive the devices under test (DUTs), and the second power supply supplies 15 volts and 5 volts to drive the circuitry on the testing equipment. The high voltage and low amperage is supplied to slot boards, and the DC to DC converters alter the voltage and current to digital levels. Supplying high voltage and low amperage power through the system to a location electrically near the DUTs, then converting it with DC to DC converters to power the DUTs, allows for much smaller connectors and for a modularly designed burn-in oven.
    Type: Grant
    Filed: October 31, 2000
    Date of Patent: August 13, 2002
    Assignee: Micron Technology Inc.
    Inventors: Michael J. Sharpes, Robert L. Totorica
  • Modular design for an integrated circuit testing apparatus
    Patent number: 6140829
    Abstract: A compact and modularly designed apparatus for testing and burning-in semiconductor devices comprises first and second power supplies and the use of direct current (DC) to DC converters. The first power supply provides a high voltage low amperage power source to drive the devices under test (DUTs), and the second power supply supplies 15 volts and 5 volts to drive the circuitry on the testing equipment. The high voltage and low amperage is supplied to slot boards, and the DC to DC converters alter the voltage and current to digital levels. Supplying high voltage and low amperage power through the system to a location electrically near the DUTs, then converting it with DC to DC converters to power the DUTs, allows for much smaller connectors and for a modularly designed burn-in oven.
    Type: Grant
    Filed: February 24, 1999
    Date of Patent: October 31, 2000
    Assignee: Micron Technology, Inc.
    Inventors: Michael J. Sharpes, Robert L. Totorica
  • Modular design for an IC testing burn-in oven
    Patent number: 5880592
    Abstract: A compact and modularly designed apparatus for testing and burning-in semiconductor devices comprises first and second power supplies and the use of direct current (DC) to DC converters. The first power supply provides high voltage low amperage power to drive the devices under test (DUTs), and the second power supply supplies 15 volts and 5 volts to drive the circuitry on the testing equipment. The high voltage and low amperage is supplied to slot boards, and the DC to DC converters alter the voltage and current to digital levels. Supplying high voltage and low amperage power through the system to a location electrically near the DUTs, then converting it with DC to DC converters to power the DUTs, allows for much smaller connectors and for a modularly designed burn-in oven.
    Type: Grant
    Filed: July 15, 1993
    Date of Patent: March 9, 1999
    Assignee: Micron Technology, Inc.
    Inventors: Michael J. Sharpes, Robert L. Totorica